CN102007400B - 周期性缺陷检测装置及其方法 - Google Patents

周期性缺陷检测装置及其方法 Download PDF

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Publication number
CN102007400B
CN102007400B CN2009801121710A CN200980112171A CN102007400B CN 102007400 B CN102007400 B CN 102007400B CN 2009801121710 A CN2009801121710 A CN 2009801121710A CN 200980112171 A CN200980112171 A CN 200980112171A CN 102007400 B CN102007400 B CN 102007400B
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China
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zonule
defect
signal
periodic
interval
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Expired - Fee Related
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CN2009801121710A
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Chinese (zh)
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CN102007400A (zh
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腰原敬弘
加藤宏晴
长栋章生
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JFE Engineering Corp
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NKK Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/83—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8922—Periodic flaws

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  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN2009801121710A 2008-03-31 2009-03-27 周期性缺陷检测装置及其方法 Expired - Fee Related CN102007400B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2008-089364 2008-03-31
JP2008089364 2008-03-31
JP2009061501A JP5453861B2 (ja) 2008-03-31 2009-03-13 周期性欠陥検出装置及びその方法
JP2009-061501 2009-03-13
PCT/JP2009/056914 WO2009123296A1 (ja) 2008-03-31 2009-03-27 周期性欠陥検出装置及びその方法

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CN102007400A CN102007400A (zh) 2011-04-06
CN102007400B true CN102007400B (zh) 2012-09-05

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US (1) US9008975B2 (enExample)
EP (1) EP2264446B1 (enExample)
JP (1) JP5453861B2 (enExample)
KR (1) KR101288734B1 (enExample)
CN (1) CN102007400B (enExample)
TW (1) TWI392865B (enExample)
WO (1) WO2009123296A1 (enExample)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011083405A1 (de) * 2010-12-21 2012-06-21 Sms Siemag Ag Verfahren und Vorrichtung zur Oberflächeninspektion von Bandstücken
JP5614312B2 (ja) * 2011-02-01 2014-10-29 Ｊｆｅスチール株式会社 周期性欠陥検出方法および周期性欠陥検出装置
AT511773A1 (de) * 2011-07-15 2013-02-15 Voestalpine Stahl Gmbh Vorrichtung und verfahren zur detektion wenigstens eines periodisch auftretenden fehlers an einem gegenstand
KR101309966B1 (ko) * 2011-12-15 2013-09-17 주식회사 포스코 강판의 결함 탐상 장치
KR101482347B1 (ko) 2012-12-27 2015-01-13 주식회사 포스코 강판의 내부 결함 검출 장치 및 방법
CN103630547B (zh) * 2013-11-26 2016-02-03 明基材料有限公司 具有周期性结构的光学薄膜的瑕疵检测方法及其检测装置
JP6287379B2 (ja) * 2014-03-11 2018-03-07 株式会社リコー 画像検査装置、画像検査システム及び画像検査方法
US9973121B2 (en) * 2014-08-08 2018-05-15 Johnson Electric S.A. Magnetic sensor and an integrated circuit
US9954469B2 (en) * 2014-08-08 2018-04-24 Johnson Electric S.A. Magnetic sensor and an integrated circuit
US9716453B2 (en) * 2014-08-08 2017-07-25 Johnson Electric S.A. Magnetic sensor and an integrated circuit
US20160344320A1 (en) * 2014-08-08 2016-11-24 Johnson Electric S.A. Magnetic sensor integrated circuit, motor component and application apparatus
US9966883B2 (en) * 2014-08-08 2018-05-08 Johnson Electric S.A. Magnetic sensor and an integrated circuit
JP6358002B2 (ja) * 2014-09-16 2018-07-18 旭硝子株式会社 不具合搬送用ロールの特定方法、およびガラスリボンにおける疵発生防止方法
CN104751288B (zh) * 2015-03-30 2018-10-09 北京首钢自动化信息技术有限公司 一种钢卷分段多维在线质量判定系统及其方法
CN105572143B (zh) * 2015-12-17 2018-05-25 湖北第二师范学院 压延过程中压延材料表面周期性缺陷的检测方法
CN106959336B (zh) * 2016-01-11 2020-07-28 宝山钢铁股份有限公司 用于漏磁检测标定的背景噪声去除装置及方法
JP6587988B2 (ja) * 2016-07-07 2019-10-09 株式会社日立ビルシステム ハンドレールの検査システムおよびハンドレールの検査方法
CN106053559A (zh) * 2016-07-30 2016-10-26 董超超 用于金属材料表面缺陷的检测系统
CN106468677B (zh) * 2016-09-06 2018-11-09 电子科技大学 一种脉冲涡流热成像中缺陷的自动分割方法
CN106918639B (zh) * 2017-04-18 2019-07-02 清华大学 沿磁化方向的单元组合缺陷漏磁信号计算方法
CN107475509B (zh) * 2017-08-04 2019-03-19 北京首钢股份有限公司 一种带钢的周期性缺陷的分析方法
WO2020137151A1 (ja) 2018-12-25 2020-07-02 Ｊｆｅスチール株式会社 学習済みモデルの生成方法、学習済みモデル、表面欠陥検出方法、鋼材の製造方法、合否判定方法、等級判定方法、表面欠陥判定プログラム、合否判定プログラム、判定システム、及び鋼材の製造設備
WO2020261554A1 (ja) * 2019-06-28 2020-12-30 Ｊｆｅスチール株式会社 丸棒の表面疵検査方法及び表面疵検査装置
CN110779928B (zh) * 2019-11-19 2022-07-26 汪科道 缺陷检测装置及方法
CN111314801B (zh) * 2020-02-13 2022-01-28 中国铁道科学研究院集团有限公司铁道建筑研究所 一种支持动态调度的数据采集系统及方法
JP7603404B2 (ja) * 2020-09-24 2024-12-20 株式会社カナデビアエンジニアリング ワイヤロープの劣化判定装置およびワイヤロープの劣化判定方法
US20230122383A1 (en) * 2021-10-18 2023-04-20 Edwin J. Lightfoot Method and apparatus for the real time quantification of subtle variations in a planar material and identification of a corresponding source of the identified subtle variation
CN115541592A (zh) * 2022-09-26 2022-12-30 北京科技大学 一种镀锡钢板表面周期缺陷的判定方法
CN120334362B (zh) * 2025-06-18 2025-08-29 中国石油大学(华东) 全矩阵显微超声泄漏缺陷三维重构方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1236310C (zh) * 1997-12-17 2006-01-11 乌斯特技术股份公司 检测纵向运动试料中周期性缺陷的方法和装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH612152A5 (enExample) * 1976-01-26 1979-07-13 Rieter Ag Maschf
US4463425A (en) * 1980-07-17 1984-07-31 Terumo Corporation Period measurement system
JPS58156842A (ja) * 1982-03-15 1983-09-17 Toshiba Corp ロ−ル疵検出装置
JPH0786474B2 (ja) * 1988-09-09 1995-09-20 富士写真フイルム株式会社 欠陥周期の測定方法
JPH06324005A (ja) 1993-05-13 1994-11-25 Nippon Steel Corp 鋼板の圧延ロール疵検出方法
JPH07198627A (ja) * 1994-01-06 1995-08-01 Nippon Steel Corp 金属表面欠陥検査装置
JPH08160006A (ja) * 1994-11-30 1996-06-21 Kawasaki Steel Corp 鋼板の欠陥検出方法
US6266983B1 (en) * 1998-12-09 2001-07-31 Kawasaki Steel Corporation Method and apparatus for detecting flaws in strip, method of manufacturing cold-rolled steel sheet and pickling equipment for hot-rolled steel strip
JP2004071045A (ja) * 2002-08-06 2004-03-04 Sony Corp デフェクト検出装置、デフェクト検出方法
JP2006105791A (ja) 2004-10-05 2006-04-20 Nippon Steel Corp 帯状体や柱状体の周期性疵検出方法およびその装置
JP4395057B2 (ja) * 2004-11-29 2010-01-06 新日本製鐵株式会社 帯状体や柱状体の周期疵検出方法およびその装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1236310C (zh) * 1997-12-17 2006-01-11 乌斯特技术股份公司 检测纵向运动试料中周期性缺陷的方法和装置

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
JP特开2006-153614A 2006.06.15
JP特开平7-198627A 1995.08.01
JP特开平8-160006A 1996.06.21

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Publication number Publication date
JP5453861B2 (ja) 2014-03-26
US20110040499A1 (en) 2011-02-17
EP2264446A1 (en) 2010-12-22
TWI392865B (zh) 2013-04-11
EP2264446A4 (en) 2017-05-03
JP2009265087A (ja) 2009-11-12
KR20100116683A (ko) 2010-11-01
EP2264446B1 (en) 2021-01-20
US9008975B2 (en) 2015-04-14
CN102007400A (zh) 2011-04-06
WO2009123296A1 (ja) 2009-10-08
TW200951426A (en) 2009-12-16
KR101288734B1 (ko) 2013-07-23

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