JP5422259B2 - トリミング回路 - Google Patents
トリミング回路 Download PDFInfo
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- JP5422259B2 JP5422259B2 JP2009120175A JP2009120175A JP5422259B2 JP 5422259 B2 JP5422259 B2 JP 5422259B2 JP 2009120175 A JP2009120175 A JP 2009120175A JP 2009120175 A JP2009120175 A JP 2009120175A JP 5422259 B2 JP5422259 B2 JP 5422259B2
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- trimming
- circuit
- fuse
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- pretest
- Prior art date
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- 238000009966 trimming Methods 0.000 title claims description 165
- 238000005520 cutting process Methods 0.000 claims description 14
- 238000012360 testing method Methods 0.000 claims description 12
- 238000003776 cleavage reaction Methods 0.000 claims 1
- 230000007017 scission Effects 0.000 claims 1
- IYZMXHQDXZKNCY-UHFFFAOYSA-N 1-n,1-n-diphenyl-4-n,4-n-bis[4-(n-phenylanilino)phenyl]benzene-1,4-diamine Chemical compound C1=CC=CC=C1N(C=1C=CC(=CC=1)N(C=1C=CC(=CC=1)N(C=1C=CC=CC=1)C=1C=CC=CC=1)C=1C=CC(=CC=1)N(C=1C=CC=CC=1)C=1C=CC=CC=1)C1=CC=CC=C1 IYZMXHQDXZKNCY-UHFFFAOYSA-N 0.000 description 18
- 238000000034 method Methods 0.000 description 16
- 238000010586 diagram Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000000630 rising effect Effects 0.000 description 4
- 101100191136 Arabidopsis thaliana PCMP-A2 gene Proteins 0.000 description 2
- 101100422768 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) SUL2 gene Proteins 0.000 description 2
- 101100048260 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) UBX2 gene Proteins 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 101150110971 CIN7 gene Proteins 0.000 description 1
- 101150110298 INV1 gene Proteins 0.000 description 1
- 101100397044 Xenopus laevis invs-a gene Proteins 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 239000000872 buffer Substances 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Images
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Description
110,210,310:トリミング処理部
120,220,320:シフトレジスタ
130,230,330:セレクタ部
140,240,340:トリミング対象回路
Claims (2)
- トリミングデータをトリミング対象回路に入力させることによって該トリミング対象回路の回路特性値を調整するトリミング回路において、
前記トリミング対象回路に入力させる前記トリミングデータを格納するレジスタと、切断可能な配線によってトリミングデータを発生するトリミング処理部と、プリテスト時に外部入力したテスト用のトリミングデータを前記レジスタに転送し、実際のトリミング時に前記トリミング処理部で発生したトリミングデータを前記レジスタに転送するセレクタ部とを備え、
前記トリミング処理部は、前記配線の切断時および所定値以上の抵抗値を示す再接続時に切断を示し非切断時に非切断を示す論理値をトリミングデータとして発生することを特徴とするトリミング回路。 - 請求項1に記載のトリミング回路において、
前記レジスタは、前記プリテスト時に複数のレジスタによりシフトレジスタを構成し、前記外部入力したテスト用の複数のトリミングデータを格納して前記トリミング対象回路に入力させることを特徴とするトリミング回路。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009120175A JP5422259B2 (ja) | 2009-05-18 | 2009-05-18 | トリミング回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009120175A JP5422259B2 (ja) | 2009-05-18 | 2009-05-18 | トリミング回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010267922A JP2010267922A (ja) | 2010-11-25 |
JP5422259B2 true JP5422259B2 (ja) | 2014-02-19 |
Family
ID=43364626
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009120175A Active JP5422259B2 (ja) | 2009-05-18 | 2009-05-18 | トリミング回路 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5422259B2 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5738724B2 (ja) * | 2011-09-07 | 2015-06-24 | ラピスセミコンダクタ株式会社 | トリミング回路、システム、判定プログラム、確認方法、及び判定方法 |
JP6225674B2 (ja) * | 2013-12-02 | 2017-11-08 | 株式会社ソシオネクスト | 半導体装置および通信インタフェース回路 |
US10304645B2 (en) | 2015-12-09 | 2019-05-28 | Fuji Electric Co., Ltd. | Trimming apparatus |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62267678A (ja) * | 1986-05-16 | 1987-11-20 | Mitsubishi Electric Corp | 半導体集積回路装置 |
JPH0563090A (ja) * | 1991-09-02 | 1993-03-12 | Seiko Instr Inc | ヒユーズトリミング回路の調整方法 |
US5677917A (en) * | 1996-04-29 | 1997-10-14 | Motorola, Inc. | Integrated circuit memory using fusible links in a scan chain |
US5668818A (en) * | 1996-08-06 | 1997-09-16 | Hewlett-Packard Co. | System and method for scan control of a programmable fuse circuit in an integrated circuit |
JP2007234155A (ja) * | 2006-03-02 | 2007-09-13 | Sony Corp | 半導体記憶装置 |
JP5225643B2 (ja) * | 2007-09-25 | 2013-07-03 | 新日本無線株式会社 | トリミング回路 |
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2009
- 2009-05-18 JP JP2009120175A patent/JP5422259B2/ja active Active
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JP2010267922A (ja) | 2010-11-25 |
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