JP5419047B2 - 質量分析データ処理方法及び質量分析装置 - Google Patents

質量分析データ処理方法及び質量分析装置 Download PDF

Info

Publication number
JP5419047B2
JP5419047B2 JP2010064328A JP2010064328A JP5419047B2 JP 5419047 B2 JP5419047 B2 JP 5419047B2 JP 2010064328 A JP2010064328 A JP 2010064328A JP 2010064328 A JP2010064328 A JP 2010064328A JP 5419047 B2 JP5419047 B2 JP 5419047B2
Authority
JP
Japan
Prior art keywords
time
mass
peak
flight
charge ratio
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2010064328A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011198624A (ja
JP2011198624A5 (enExample
Inventor
治 古橋
潔 小河
茂樹 梶原
亨 絹川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Kobe University NUC
Original Assignee
Shimadzu Corp
Kobe University NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Kobe University NUC filed Critical Shimadzu Corp
Priority to JP2010064328A priority Critical patent/JP5419047B2/ja
Priority to US13/047,577 priority patent/US8612162B2/en
Publication of JP2011198624A publication Critical patent/JP2011198624A/ja
Publication of JP2011198624A5 publication Critical patent/JP2011198624A5/ja
Application granted granted Critical
Publication of JP5419047B2 publication Critical patent/JP5419047B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2010064328A 2010-03-19 2010-03-19 質量分析データ処理方法及び質量分析装置 Expired - Fee Related JP5419047B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2010064328A JP5419047B2 (ja) 2010-03-19 2010-03-19 質量分析データ処理方法及び質量分析装置
US13/047,577 US8612162B2 (en) 2010-03-19 2011-03-14 Mass analysis data processing method and mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010064328A JP5419047B2 (ja) 2010-03-19 2010-03-19 質量分析データ処理方法及び質量分析装置

Publications (3)

Publication Number Publication Date
JP2011198624A JP2011198624A (ja) 2011-10-06
JP2011198624A5 JP2011198624A5 (enExample) 2012-11-15
JP5419047B2 true JP5419047B2 (ja) 2014-02-19

Family

ID=44647890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010064328A Expired - Fee Related JP5419047B2 (ja) 2010-03-19 2010-03-19 質量分析データ処理方法及び質量分析装置

Country Status (2)

Country Link
US (1) US8612162B2 (enExample)
JP (1) JP5419047B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010052756A1 (ja) * 2008-11-10 2010-05-14 株式会社島津製作所 質量分析方法及び質量分析装置
US9062536B2 (en) 2013-01-02 2015-06-23 Graco Minnesota Inc. Devices and methods for landfill gas well monitoring and control
US10029291B2 (en) 2013-01-02 2018-07-24 Q.E.D. Environmental Systems, Inc. Devices and methods for landfill gas well monitoring and control
DE112015002248B4 (de) 2014-05-14 2022-04-28 Micromass Uk Limited Entfaltung überlappender Ionenbeweglichkeitsspektrometer- oder -trennerdaten
GB201409913D0 (en) * 2014-06-04 2014-07-16 Micromass Ltd Histogramming different ion areas on peak detecting analogue to digital converters
WO2015185930A1 (en) 2014-06-04 2015-12-10 Micromass Uk Limited Histogramming different ion areas on peak detecting analogue to digital convertors
JP6668188B2 (ja) * 2016-07-12 2020-03-18 日本電子株式会社 質量分析方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020009394A1 (en) * 1999-04-02 2002-01-24 Hubert Koster Automated process line
JP4208674B2 (ja) * 2003-09-03 2009-01-14 日本電子株式会社 多重周回型飛行時間型質量分析方法
JP3968436B2 (ja) * 2003-09-05 2007-08-29 大学共同利用機関法人 高エネルギー加速器研究機構 オージェー光電子コインシデンス分光器、及びオージェー光電子コインシデンス分光法
JP4182853B2 (ja) * 2003-10-08 2008-11-19 株式会社島津製作所 質量分析方法及び質量分析装置
JP4033133B2 (ja) * 2004-01-13 2008-01-16 株式会社島津製作所 質量分析装置
JP2005322429A (ja) * 2004-05-06 2005-11-17 Shimadzu Corp 質量分析装置
JP2007093370A (ja) * 2005-09-28 2007-04-12 Olympus Corp 蛍光分光分析装置
JP4645424B2 (ja) * 2005-11-24 2011-03-09 株式会社島津製作所 飛行時間型質量分析装置
JP4939138B2 (ja) * 2006-07-20 2012-05-23 株式会社島津製作所 質量分析装置用イオン光学系の設計方法
US7904253B2 (en) * 2006-07-29 2011-03-08 Cerno Bioscience Llc Determination of chemical composition and isotope distribution with mass spectrometry
JP4851273B2 (ja) * 2006-09-12 2012-01-11 日本電子株式会社 質量分析方法および質量分析装置
WO2008107931A1 (ja) * 2007-03-05 2008-09-12 Shimadzu Corporation 質量分析装置
US8093555B2 (en) * 2007-11-21 2012-01-10 Shimadzu Corporation Mass spectrometer
US8164054B2 (en) * 2007-12-13 2012-04-24 Shimadzu Corporation Mass analysis method and mass analysis system
WO2009110026A1 (ja) * 2008-03-05 2009-09-11 株式会社島津製作所 質量分析方法及び質量分析装置

Also Published As

Publication number Publication date
US8612162B2 (en) 2013-12-17
JP2011198624A (ja) 2011-10-06
US20110231109A1 (en) 2011-09-22

Similar Documents

Publication Publication Date Title
JP5419047B2 (ja) 質量分析データ処理方法及び質量分析装置
JP5585394B2 (ja) 多重周回飛行時間型質量分析装置
JP5024387B2 (ja) 質量分析方法及び質量分析システム
US8927928B2 (en) Method for operating a time-of-flight mass spectrometer with orthogonal ion pulsing
CA2762838A1 (en) Method of processing mass spectral data
WO2010038260A1 (ja) 多重周回飛行時間型質量分析装置
Atlas Collaboration Search for new phenomena using the invariant mass distribution of same-flavour opposite-sign dilepton pairs in events with missing transverse momentum in $\sqrt {s}= 13$ TeV $ pp $ collisions with the ATLAS detector
JP4182853B2 (ja) 質量分析方法及び質量分析装置
JP4569349B2 (ja) 飛行時間型質量分析装置
JP2011198624A5 (enExample)
GB2622929A (en) A charge detection mass spectrometry (CDMS) device
WO2019207737A1 (ja) 飛行時間型質量分析装置
CN109755096B (zh) 筛选式飞行时间质谱仪及检测方法
KR20190075048A (ko) 매트릭스 지원 레이저 탈착/이온화 비행 시간 질량 분광계를 사용한 시간 대 강도 분포 분석
JP5915702B2 (ja) 多重周回飛行時間型質量分析装置
Chen et al. Automated charge state determination of complex isotope-resolved mass spectra by peak-target Fourier transform
JP7641417B2 (ja) タンデム質量分析計及びタンデム質量分析の方法
JP2014224732A (ja) Ｍａｌｄｉ質量分析装置
JP7528297B2 (ja) 飛行時間質量スペクトルの分析
JP7640622B2 (ja) 質量分析法におけるイオンピーク面積の処理
CN110739200B (zh) 一种飞行时间质谱仪信号聚焦的方法
JP2010277970A (ja) 多重周回飛行時間型質量分析装置
EP4612720A1 (en) Systems and methods for increased mrm capacity
Mlinarevic et al. The ATLAS inner detector trigger performance in Run 3
WO2025120758A1 (ja) 飛行時間型質量分析装置および信号処理装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121001

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20121001

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20121001

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130718

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130730

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130930

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20131105

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20131112

R150 Certificate of patent or registration of utility model

Ref document number: 5419047

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees