JP2011198624A5 - - Google Patents

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Publication number
JP2011198624A5
JP2011198624A5 JP2010064328A JP2010064328A JP2011198624A5 JP 2011198624 A5 JP2011198624 A5 JP 2011198624A5 JP 2010064328 A JP2010064328 A JP 2010064328A JP 2010064328 A JP2010064328 A JP 2010064328A JP 2011198624 A5 JP2011198624 A5 JP 2011198624A5
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JP
Japan
Prior art keywords
peak
mass
time
charge ratio
flight
Prior art date
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Application number
JP2010064328A
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English (en)
Japanese (ja)
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JP2011198624A (ja
JP5419047B2 (ja
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Priority to JP2010064328A priority Critical patent/JP5419047B2/ja
Priority claimed from JP2010064328A external-priority patent/JP5419047B2/ja
Priority to US13/047,577 priority patent/US8612162B2/en
Publication of JP2011198624A publication Critical patent/JP2011198624A/ja
Publication of JP2011198624A5 publication Critical patent/JP2011198624A5/ja
Application granted granted Critical
Publication of JP5419047B2 publication Critical patent/JP5419047B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010064328A 2010-03-19 2010-03-19 質量分析データ処理方法及び質量分析装置 Expired - Fee Related JP5419047B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2010064328A JP5419047B2 (ja) 2010-03-19 2010-03-19 質量分析データ処理方法及び質量分析装置
US13/047,577 US8612162B2 (en) 2010-03-19 2011-03-14 Mass analysis data processing method and mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010064328A JP5419047B2 (ja) 2010-03-19 2010-03-19 質量分析データ処理方法及び質量分析装置

Publications (3)

Publication Number Publication Date
JP2011198624A JP2011198624A (ja) 2011-10-06
JP2011198624A5 true JP2011198624A5 (enExample) 2012-11-15
JP5419047B2 JP5419047B2 (ja) 2014-02-19

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ID=44647890

Family Applications (1)

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JP2010064328A Expired - Fee Related JP5419047B2 (ja) 2010-03-19 2010-03-19 質量分析データ処理方法及び質量分析装置

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US (1) US8612162B2 (enExample)
JP (1) JP5419047B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010052756A1 (ja) * 2008-11-10 2010-05-14 株式会社島津製作所 質量分析方法及び質量分析装置
US9062536B2 (en) 2013-01-02 2015-06-23 Graco Minnesota Inc. Devices and methods for landfill gas well monitoring and control
US10029291B2 (en) 2013-01-02 2018-07-24 Q.E.D. Environmental Systems, Inc. Devices and methods for landfill gas well monitoring and control
DE112015002248B4 (de) 2014-05-14 2022-04-28 Micromass Uk Limited Entfaltung überlappender Ionenbeweglichkeitsspektrometer- oder -trennerdaten
GB201409913D0 (en) * 2014-06-04 2014-07-16 Micromass Ltd Histogramming different ion areas on peak detecting analogue to digital converters
WO2015185930A1 (en) 2014-06-04 2015-12-10 Micromass Uk Limited Histogramming different ion areas on peak detecting analogue to digital convertors
JP6668188B2 (ja) * 2016-07-12 2020-03-18 日本電子株式会社 質量分析方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020009394A1 (en) * 1999-04-02 2002-01-24 Hubert Koster Automated process line
JP4208674B2 (ja) * 2003-09-03 2009-01-14 日本電子株式会社 多重周回型飛行時間型質量分析方法
JP3968436B2 (ja) * 2003-09-05 2007-08-29 大学共同利用機関法人 高エネルギー加速器研究機構 オージェー光電子コインシデンス分光器、及びオージェー光電子コインシデンス分光法
JP4182853B2 (ja) * 2003-10-08 2008-11-19 株式会社島津製作所 質量分析方法及び質量分析装置
JP4033133B2 (ja) * 2004-01-13 2008-01-16 株式会社島津製作所 質量分析装置
JP2005322429A (ja) * 2004-05-06 2005-11-17 Shimadzu Corp 質量分析装置
JP2007093370A (ja) * 2005-09-28 2007-04-12 Olympus Corp 蛍光分光分析装置
JP4645424B2 (ja) * 2005-11-24 2011-03-09 株式会社島津製作所 飛行時間型質量分析装置
JP4939138B2 (ja) * 2006-07-20 2012-05-23 株式会社島津製作所 質量分析装置用イオン光学系の設計方法
US7904253B2 (en) * 2006-07-29 2011-03-08 Cerno Bioscience Llc Determination of chemical composition and isotope distribution with mass spectrometry
JP4851273B2 (ja) * 2006-09-12 2012-01-11 日本電子株式会社 質量分析方法および質量分析装置
WO2008107931A1 (ja) * 2007-03-05 2008-09-12 Shimadzu Corporation 質量分析装置
US8093555B2 (en) * 2007-11-21 2012-01-10 Shimadzu Corporation Mass spectrometer
US8164054B2 (en) * 2007-12-13 2012-04-24 Shimadzu Corporation Mass analysis method and mass analysis system
WO2009110026A1 (ja) * 2008-03-05 2009-09-11 株式会社島津製作所 質量分析方法及び質量分析装置

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