JP5355259B2 - 顕微鏡システム、観察画像補正プログラム、及び観察画像補正方法 - Google Patents

顕微鏡システム、観察画像補正プログラム、及び観察画像補正方法 Download PDF

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JP5355259B2
JP5355259B2 JP2009158223A JP2009158223A JP5355259B2 JP 5355259 B2 JP5355259 B2 JP 5355259B2 JP 2009158223 A JP2009158223 A JP 2009158223A JP 2009158223 A JP2009158223 A JP 2009158223A JP 5355259 B2 JP5355259 B2 JP 5355259B2
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luminance
displacement point
value
observation image
observation
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JP2010098719A (ja
JP2010098719A5 (enExample
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祐一朗 橋本
貴 米山
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Olympus Corp
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  • Facsimile Image Signal Circuits (AREA)
  • Studio Devices (AREA)
  • Image Analysis (AREA)
  • Microscoopes, Condenser (AREA)
JP2009158223A 2008-09-16 2009-07-02 顕微鏡システム、観察画像補正プログラム、及び観察画像補正方法 Expired - Fee Related JP5355259B2 (ja)

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JP2009158223A JP5355259B2 (ja) 2008-09-16 2009-07-02 顕微鏡システム、観察画像補正プログラム、及び観察画像補正方法

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JP2008236068 2008-09-16
JP2008236068 2008-09-16
JP2009158223A JP5355259B2 (ja) 2008-09-16 2009-07-02 顕微鏡システム、観察画像補正プログラム、及び観察画像補正方法

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JP2010098719A JP2010098719A (ja) 2010-04-30
JP2010098719A5 JP2010098719A5 (enExample) 2012-08-02
JP5355259B2 true JP5355259B2 (ja) 2013-11-27

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JP2015099104A (ja) 2013-11-19 2015-05-28 ソニー株式会社 画像処理装置および画像処理方法
JP6184305B2 (ja) 2013-11-28 2017-08-23 オリンパス株式会社 顕微鏡システム
FR3093807B1 (fr) * 2019-03-13 2021-04-16 Myriade Dispositif et procédé pour l’observation de microparticules et de nanoparticules.
JP2025038366A (ja) 2023-09-07 2025-03-19 株式会社エビデント 顕微鏡システム、画像処理方法、及びプログラム

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JP3485975B2 (ja) * 1994-09-21 2004-01-13 株式会社東芝 特定色領域抽出方式および特定色領域除去方式
JP4061566B2 (ja) * 2001-11-06 2008-03-19 松下電器産業株式会社 ブラックバランス調整方法、および撮像装置
JP2004015094A (ja) * 2002-06-03 2004-01-15 Ricoh Co Ltd 画像データ処理装置及び画像読取装置
JP2004086031A (ja) * 2002-08-28 2004-03-18 Olympus Corp 顕微鏡用撮像装置、顕微鏡用撮像方法、及び顕微鏡用撮像プログラム

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