JP5350811B2 - 自動分析装置 - Google Patents
自動分析装置 Download PDFInfo
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- JP5350811B2 JP5350811B2 JP2009003962A JP2009003962A JP5350811B2 JP 5350811 B2 JP5350811 B2 JP 5350811B2 JP 2009003962 A JP2009003962 A JP 2009003962A JP 2009003962 A JP2009003962 A JP 2009003962A JP 5350811 B2 JP5350811 B2 JP 5350811B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00594—Quality control, including calibration or testing of components of the analyser
- G01N35/00603—Reinspection of samples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N2035/0097—Control arrangements for automatic analysers monitoring reactions as a function of time
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/10—Composition for standardization, calibration, simulation, stabilization, preparation or preservation; processes of use in preparation for chemical testing
- Y10T436/101666—Particle count or volume standard or control [e.g., platelet count standards, etc.]
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- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Quality & Reliability (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
2 測定機構
3 制御機構
11 検体移送部
11a 検体容器
11b 検体ラック
12 検体分注機構
13 反応テーブル
14 試薬庫
15 試薬容器
16 試薬分注機構
17 攪拌部
18 測光部
18a 光源
18b 受光部
18c A/Dコンバータ
19 洗浄部
20 反応容器
20a,20b 側壁
20c 底壁
20d 液体保持部
20e 開口部
31 制御部
32 入力部
33 分析部
34 決定部
34a 標準偏差算出部
34b 標準偏差判定部
34c 平均値算出部
34d 吸光度決定部
34e 異常特定部
34f 報知処理部
35 記憶部
36 出力部
37 送受信部
Am 測光領域
BL 分析光
W 反応液
S1 固形物
S2 傷
Claims (4)
- 検体と試薬とを反応容器に分注し、該反応容器内で反応した反応液を用いることによって前記検体の分析を行う自動分析装置において、
複数の前記反応容器を円周方向に沿って保持し、該円周方向に沿って周回可能な反応テーブルと、
前記反応容器が前記反応テーブルの周回に伴って所定の領域を1回通過する間に前記反応容器内の反応液の吸光度を複数回測定し、前記反応容器が前記所定の領域を通過するごとに行う測光手段と、
前記反応容器が前記所定の領域を1回通過する間に前記測光手段が測定した複数の反応液の吸光度の標準偏差を、前記反応容器が前記所定の領域を通過するごとに算出する標準偏差算出手段と、
前記標準偏差算出手段が算出した複数の標準偏差の各々が、均一に攪拌された反応液における複数の吸光度の標準偏差に基づいて定められる閾値より小さいか否かを判定する標準偏差判定手段と、
前記標準偏差判定手段によって前記閾値より小さいと判定された標準偏差を有する前記複数の反応液の吸光度の平均値を算出する平均値算出手段と、
前記平均値算出手段が算出した複数の平均値のいずれかを検体の分析を行う際の吸光度として決定する吸光度決定手段と、
を備えたことを特徴とする自動分析装置。 - 前記吸光度決定手段は、前記反応容器が前記所定の領域を通過するごとに算出された前記複数の標準偏差が経時的に減少し、かつ、前記閾値より小さい標準偏差の数が2以上である場合に吸光度の決定を行うことを特徴とする請求項1に記載の自動分析装置。
- 前記反応容器が前記所定の領域を通過するごとに算出された前記複数の標準偏差の経時変化をもとに異常の原因を特定する異常特定手段を備えたことを特徴とする請求項1または請求項2に記載の自動分析装置。
- 前記異常特定手段は、前記複数の標準偏差が経時的に減少し、かつ、前記閾値より小さい標準偏差が1以下である場合に前記反応容器の反応液が異常であると特定することを特徴とする請求項3に記載の自動分析装置。
Priority Applications (10)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009003962A JP5350811B2 (ja) | 2009-01-09 | 2009-01-09 | 自動分析装置 |
EP09837515.7A EP2378292B1 (en) | 2009-01-09 | 2009-03-19 | Autoanalyzer |
PL09837515T PL2378292T3 (pl) | 2009-01-09 | 2009-03-19 | Autoanalizator |
HUE09837515A HUE037708T2 (hu) | 2009-01-09 | 2009-03-19 | Automatikus analizátor |
ES09837515.7T ES2654380T3 (es) | 2009-01-09 | 2009-03-19 | Analizador automático |
PT98375157T PT2378292T (pt) | 2009-01-09 | 2009-03-19 | Analisador automático |
US13/139,924 US8700345B2 (en) | 2009-01-09 | 2009-03-19 | Automatic analyzer |
PCT/JP2009/055506 WO2010079629A1 (ja) | 2009-01-09 | 2009-03-19 | 自動分析装置 |
CN200980154334.1A CN102272607B (zh) | 2009-01-09 | 2009-03-19 | 自动分析器 |
HRP20171958TT HRP20171958T1 (hr) | 2009-01-09 | 2017-12-18 | Automatski analizator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009003962A JP5350811B2 (ja) | 2009-01-09 | 2009-01-09 | 自動分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010160116A JP2010160116A (ja) | 2010-07-22 |
JP5350811B2 true JP5350811B2 (ja) | 2013-11-27 |
Family
ID=42316406
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009003962A Active JP5350811B2 (ja) | 2009-01-09 | 2009-01-09 | 自動分析装置 |
Country Status (10)
Country | Link |
---|---|
US (1) | US8700345B2 (ja) |
EP (1) | EP2378292B1 (ja) |
JP (1) | JP5350811B2 (ja) |
CN (1) | CN102272607B (ja) |
ES (1) | ES2654380T3 (ja) |
HR (1) | HRP20171958T1 (ja) |
HU (1) | HUE037708T2 (ja) |
PL (1) | PL2378292T3 (ja) |
PT (1) | PT2378292T (ja) |
WO (1) | WO2010079629A1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011149885A (ja) * | 2010-01-25 | 2011-08-04 | Hitachi High-Technologies Corp | 自動分析装置 |
CN102539792B (zh) * | 2010-12-31 | 2014-08-13 | 深圳迈瑞生物医疗电子股份有限公司 | 一种血样吸取检测方法及血样吸取检测判断系统 |
JP5711564B2 (ja) | 2011-02-17 | 2015-05-07 | ベックマン コールター, インコーポレイテッド | 自動分析機 |
JP2013036891A (ja) * | 2011-08-09 | 2013-02-21 | Beckman Coulter Inc | 分析装置および分析方法 |
JP5984290B2 (ja) * | 2012-07-20 | 2016-09-06 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
JP6381978B2 (ja) | 2013-07-05 | 2018-08-29 | キヤノンメディカルシステムズ株式会社 | 自動分析装置 |
WO2016130964A1 (en) | 2015-02-13 | 2016-08-18 | Abbott Laboratories | Decapping and capping apparatus, systems and methods for use in diagnostic analyzers |
US10895579B2 (en) * | 2015-03-02 | 2021-01-19 | Hitachi High-Tech Corporation | Automatic analyzer |
EP3487629A4 (en) * | 2016-07-21 | 2019-07-03 | Siemens Healthcare Diagnostics Inc. | PHOTOMETRIC CUVET CARDING |
EP4306941A1 (en) * | 2022-07-11 | 2024-01-17 | Furuno Electric Co., Ltd. | Apparatus and method for checking stirring quality of a chemical analyzer |
WO2024118397A1 (en) * | 2022-11-29 | 2024-06-06 | Beckman Coulter, Inc. | Real-time cuvette monitoring |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59147626A (ja) * | 1983-02-14 | 1984-08-24 | Nishihara Environ Sanit Res Corp | 槽内における液体の撹拌状況観測方法 |
JPH01134234A (ja) * | 1987-11-20 | 1989-05-26 | Shimadzu Corp | 自動化学分析装置 |
JPH0664049B2 (ja) * | 1989-06-26 | 1994-08-22 | 株式会社島津製作所 | 水質分析計のデータ処理方法 |
FR2690746B1 (fr) * | 1992-04-29 | 1994-07-22 | Alliance Instr Sa | Dispositif de mesure par colorimetrie. |
JPH06249857A (ja) * | 1993-02-26 | 1994-09-09 | Hitachi Ltd | 自動分析装置 |
JP3671600B2 (ja) * | 1997-04-30 | 2005-07-13 | Jfeスチール株式会社 | 金属中酸化物系介在物の粒度分布測定方法 |
JP3760806B2 (ja) * | 2001-06-25 | 2006-03-29 | 株式会社日立製作所 | 分析結果管理の方法および装置 |
US7027935B2 (en) * | 2002-08-07 | 2006-04-11 | Hitachi High Technologies Corp. | Sample dispensing apparatus and automatic analyzer using the same |
JP3980031B2 (ja) * | 2005-02-09 | 2007-09-19 | 株式会社日立製作所 | 自動分析装置 |
JP4598682B2 (ja) * | 2006-01-23 | 2010-12-15 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
JP4525624B2 (ja) * | 2006-03-23 | 2010-08-18 | 日立化成工業株式会社 | 自動分析装置 |
JP2010008402A (ja) * | 2008-05-30 | 2010-01-14 | Hitachi High-Technologies Corp | 反応過程データの異常判定支援方法及び自動分析装置 |
JP2010151519A (ja) * | 2008-12-24 | 2010-07-08 | Hitachi High-Technologies Corp | 自動分析装置 |
-
2009
- 2009-01-09 JP JP2009003962A patent/JP5350811B2/ja active Active
- 2009-03-19 ES ES09837515.7T patent/ES2654380T3/es active Active
- 2009-03-19 PL PL09837515T patent/PL2378292T3/pl unknown
- 2009-03-19 PT PT98375157T patent/PT2378292T/pt unknown
- 2009-03-19 HU HUE09837515A patent/HUE037708T2/hu unknown
- 2009-03-19 EP EP09837515.7A patent/EP2378292B1/en active Active
- 2009-03-19 US US13/139,924 patent/US8700345B2/en active Active
- 2009-03-19 WO PCT/JP2009/055506 patent/WO2010079629A1/ja active Application Filing
- 2009-03-19 CN CN200980154334.1A patent/CN102272607B/zh active Active
-
2017
- 2017-12-18 HR HRP20171958TT patent/HRP20171958T1/hr unknown
Also Published As
Publication number | Publication date |
---|---|
PT2378292T (pt) | 2018-01-04 |
ES2654380T3 (es) | 2018-02-13 |
US20110257908A1 (en) | 2011-10-20 |
CN102272607A (zh) | 2011-12-07 |
CN102272607B (zh) | 2014-01-22 |
HRP20171958T1 (hr) | 2018-02-09 |
PL2378292T3 (pl) | 2018-03-30 |
JP2010160116A (ja) | 2010-07-22 |
WO2010079629A1 (ja) | 2010-07-15 |
HUE037708T2 (hu) | 2018-09-28 |
EP2378292A1 (en) | 2011-10-19 |
EP2378292B1 (en) | 2017-09-27 |
US8700345B2 (en) | 2014-04-15 |
EP2378292A4 (en) | 2014-01-15 |
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