JP5346057B2 - Ｘ線分析装置の試料冷却装置及びｘ線分析装置 - Google Patents

Ｘ線分析装置の試料冷却装置及びｘ線分析装置 Download PDF

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JP5346057B2
JP5346057B2 JP2011098825A JP2011098825A JP5346057B2 JP 5346057 B2 JP5346057 B2 JP 5346057B2 JP 2011098825 A JP2011098825 A JP 2011098825A JP 2011098825 A JP2011098825 A JP 2011098825A JP 5346057 B2 JP5346057 B2 JP 5346057B2
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axis
gas
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JP2012230017A (ja
JP2012230017A5 (enExample
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智一 長谷川
一晃 油家
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Rigaku Corp
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Rigaku Corp
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Priority to JP2011098825A priority Critical patent/JP5346057B2/ja
Priority to US13/454,393 priority patent/US9008270B2/en
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Publication of JP2012230017A5 publication Critical patent/JP2012230017A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/42—Low-temperature sample treatment, e.g. cryofixation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders

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  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2011098825A 2011-04-26 2011-04-26 Ｘ線分析装置の試料冷却装置及びｘ線分析装置 Active JP5346057B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011098825A JP5346057B2 (ja) 2011-04-26 2011-04-26 Ｘ線分析装置の試料冷却装置及びｘ線分析装置
US13/454,393 US9008270B2 (en) 2011-04-26 2012-04-24 Sample cooling apparatus for X-ray diffractometer and X-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011098825A JP5346057B2 (ja) 2011-04-26 2011-04-26 Ｘ線分析装置の試料冷却装置及びｘ線分析装置

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JP2012230017A JP2012230017A (ja) 2012-11-22
JP2012230017A5 JP2012230017A5 (enExample) 2013-05-30
JP5346057B2 true JP5346057B2 (ja) 2013-11-20

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US (1) US9008270B2 (enExample)
JP (1) JP5346057B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9609729B2 (en) * 2013-04-19 2017-03-28 Raytheon Company X-ray cells and other components having gas cells with thermally-induced density gradients
DE102014205631B4 (de) * 2014-03-26 2017-06-01 Siemens Healthcare Gmbh Strahlersystem
CN106645237B (zh) * 2016-11-09 2023-08-25 丹东浩元仪器有限公司 一种x射线衍射仪用高温测量装置
WO2019130663A1 (ja) * 2017-12-28 2019-07-04 株式会社リガク Ｘ線検査装置
US11846594B2 (en) * 2018-11-23 2023-12-19 Rigaku Corporation Single-crystal X-ray structure analysis apparatus and sample holder
CN111624216B (zh) * 2020-07-23 2023-09-19 丹东通达科技有限公司 一种用于x射线衍射仪在高温下测量样品特性的检测装置
CN113640327B (zh) * 2021-06-03 2023-07-25 中国工程物理研究院材料研究所 一种大曲率微小件表面多层金属薄膜的无损检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3206377B2 (ja) 1995-07-05 2001-09-10 株式会社日立製作所 配線形成方法
JPH09229834A (ja) * 1996-02-20 1997-09-05 Rigaku Corp Ｘ線装置の試料支持装置
US6408047B1 (en) * 2000-10-04 2002-06-18 Rigaku/Msc, Inc. Method of providing high throughput protein crystallography
JP2002116158A (ja) * 2000-10-05 2002-04-19 Rigaku Corp Ｘ線測定方法及びｘ線装置
JP2002357381A (ja) * 2001-06-01 2002-12-13 Rigaku Corp 冷却装置及びｘ線装置
EP1463971A2 (en) * 2001-12-12 2004-10-06 The Regents of the University of California INTEGRATED CRYSTAL MOUNTING AND ALIGNMENT SYSTEM FOR HIGH−THROUGHPUT BIOLOGICAL CRYSTALLOGRAPHY
JP4023671B2 (ja) * 2002-08-06 2007-12-19 日本サーマルエンジニアリング株式会社 Ｘ線結晶解析用冷却方法および冷却装置
WO2007123720A2 (en) * 2006-03-30 2007-11-01 Cornell Research Foundation, Inc. System and method for increased cooling rates in rapid cooling of small biological samples

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JP2012230017A (ja) 2012-11-22
US9008270B2 (en) 2015-04-14
US20120275567A1 (en) 2012-11-01

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