JP5344822B2 - 成長するシリコン結晶のメルト−固体界面形状の可変磁界を用いる制御 - Google Patents
成長するシリコン結晶のメルト−固体界面形状の可変磁界を用いる制御 Download PDFInfo
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- JP5344822B2 JP5344822B2 JP2007549377A JP2007549377A JP5344822B2 JP 5344822 B2 JP5344822 B2 JP 5344822B2 JP 2007549377 A JP2007549377 A JP 2007549377A JP 2007549377 A JP2007549377 A JP 2007549377A JP 5344822 B2 JP5344822 B2 JP 5344822B2
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- melt
- magnetic field
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- 239000013078 crystal Substances 0.000 title claims abstract description 157
- 239000007787 solid Substances 0.000 title claims abstract description 98
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title description 46
- 229910052710 silicon Inorganic materials 0.000 title description 46
- 239000010703 silicon Substances 0.000 title description 46
- 239000000155 melt Substances 0.000 claims abstract description 76
- 238000000034 method Methods 0.000 claims abstract description 40
- 230000004044 response Effects 0.000 claims abstract description 9
- 239000001301 oxygen Substances 0.000 claims description 44
- 229910052760 oxygen Inorganic materials 0.000 claims description 44
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 43
- 238000009826 distribution Methods 0.000 claims description 23
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- 230000003796 beauty Effects 0.000 claims 1
- 229960001716 benzalkonium Drugs 0.000 claims 1
- CYDRXTMLKJDRQH-UHFFFAOYSA-N benzododecinium Chemical compound CCCCCCCCCCCC[N+](C)(C)CC1=CC=CC=C1 CYDRXTMLKJDRQH-UHFFFAOYSA-N 0.000 claims 1
- 230000007547 defect Effects 0.000 description 46
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- 239000000498 cooling water Substances 0.000 description 5
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 5
- 235000012431 wafers Nutrition 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
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- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 4
- 230000004323 axial length Effects 0.000 description 3
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- 229920005591 polysilicon Polymers 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
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- 229910052720 vanadium Inorganic materials 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/203—Controlling or regulating the relationship of pull rate (v) to axial thermal gradient (G)
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/917—Magnetic
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1052—Seed pulling including a sectioned crucible [e.g., double crucible, baffle]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/026,780 US7223304B2 (en) | 2004-12-30 | 2004-12-30 | Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field |
| US11/026,780 | 2004-12-30 | ||
| PCT/US2005/042928 WO2006073614A1 (en) | 2004-12-30 | 2005-11-29 | Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008526666A JP2008526666A (ja) | 2008-07-24 |
| JP2008526666A5 JP2008526666A5 (https=) | 2009-01-22 |
| JP5344822B2 true JP5344822B2 (ja) | 2013-11-20 |
Family
ID=36113793
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007549377A Expired - Fee Related JP5344822B2 (ja) | 2004-12-30 | 2005-11-29 | 成長するシリコン結晶のメルト−固体界面形状の可変磁界を用いる制御 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US7223304B2 (https=) |
| EP (1) | EP1831436B1 (https=) |
| JP (1) | JP5344822B2 (https=) |
| KR (1) | KR101009074B1 (https=) |
| CN (1) | CN101133193B (https=) |
| DE (1) | DE602005014010D1 (https=) |
| TW (1) | TWI369423B (https=) |
| WO (1) | WO2006073614A1 (https=) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7223304B2 (en) * | 2004-12-30 | 2007-05-29 | Memc Electronic Materials, Inc. | Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field |
| JP2007031274A (ja) * | 2005-07-27 | 2007-02-08 | Siltron Inc | シリコン単結晶インゴット、ウエハ、その成長装置、及びその成長方法 |
| KR100831044B1 (ko) * | 2005-09-21 | 2008-05-21 | 주식회사 실트론 | 고품질 실리콘 단결정 잉곳의 성장장치, 그 장치를 이용한성장방법 |
| KR100827028B1 (ko) * | 2006-10-17 | 2008-05-02 | 주식회사 실트론 | 쵸크랄스키법을 이용한 반도체 단결정 제조 방법, 및 이방법에 의해 제조된 반도체 단결정 잉곳 및 웨이퍼 |
| DE102006060359B4 (de) * | 2006-12-20 | 2013-09-05 | Siltronic Ag | Verfahren und Vorrichtung zur Herstellung von Halbleiterscheiben aus Silicium |
| KR100830047B1 (ko) | 2006-12-29 | 2008-05-15 | 주식회사 실트론 | 대류 분포 제어에 의해 산소농도 제어가 가능한 반도체단결정 제조 방법, 그 장치 및 반도체 단결정 잉곳 |
| JP5083001B2 (ja) * | 2008-04-08 | 2012-11-28 | 株式会社Sumco | シリコン単結晶の引上げ方法 |
| JP2011526876A (ja) * | 2008-06-30 | 2011-10-20 | エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッド | アンバランス磁場及び同方向回転を用いた成長シリコン結晶の融液−固体界面形状の制御方法 |
| CN102112665B (zh) | 2008-08-07 | 2012-12-12 | Memc电子材料有限公司 | 通过施加时变磁场在硅熔体中产生抽吸力 |
| JP2013028476A (ja) * | 2011-07-27 | 2013-02-07 | Covalent Materials Corp | 単結晶引上方法 |
| KR101455922B1 (ko) * | 2013-03-06 | 2014-10-28 | 주식회사 엘지실트론 | 커스프 자기장을 이용한 실리콘 단결정 잉곳 성장장치 및 성장방법 |
| US9786423B2 (en) * | 2013-10-28 | 2017-10-10 | Massachusetts Institute Of Technology | Method and apparatus for producing an asymmetric magnetic field |
| KR101723739B1 (ko) * | 2015-09-08 | 2017-04-05 | 주식회사 엘지실트론 | 단결정 잉곳 성장장치 및 그 성장방법 |
| KR102060422B1 (ko) * | 2015-11-02 | 2019-12-30 | 가부시키가이샤 사무코 | 단결정 실리콘의 제조 방법 |
| CN105350070A (zh) * | 2015-12-09 | 2016-02-24 | 天津市环欧半导体材料技术有限公司 | 一种利用变频磁场控制直拉法硅单晶氧含量的方法 |
| CN107151817A (zh) * | 2016-03-03 | 2017-09-12 | 上海新昇半导体科技有限公司 | 单晶硅的生长方法及其制备的单晶硅锭 |
| US9988740B1 (en) * | 2016-08-16 | 2018-06-05 | Northrop Grumman Systems Corporation | Shaped induction field crystal printer |
| WO2020210129A1 (en) * | 2019-04-11 | 2020-10-15 | Globalwafers Co., Ltd. | Process for preparing ingot having reduced distortion at late body length |
| CN110517936B (zh) * | 2019-09-06 | 2021-07-02 | 绍兴阔源机械科技有限公司 | 一种快速响应式交流熔断器 |
| US11111597B2 (en) | 2019-09-13 | 2021-09-07 | Globalwafers Co., Ltd. | Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method |
| US11111596B2 (en) | 2019-09-13 | 2021-09-07 | Globalwafers Co., Ltd. | Single crystal silicon ingot having axial uniformity |
| CN115341264A (zh) * | 2019-09-13 | 2022-11-15 | 环球晶圆股份有限公司 | 使用连续柴可斯基方法生长氮掺杂单晶硅锭的方法以及通过此方法生长的单晶硅锭 |
| TWI771007B (zh) * | 2020-05-19 | 2022-07-11 | 環球晶圓股份有限公司 | 矽單晶錠的製造方法、矽單晶錠及其製造裝置 |
| CN112831836A (zh) * | 2020-12-30 | 2021-05-25 | 上海新昇半导体科技有限公司 | 拉晶方法和拉晶装置 |
| JP7124938B1 (ja) * | 2021-07-29 | 2022-08-24 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
| US12351938B2 (en) | 2022-02-10 | 2025-07-08 | Globalwafers Co., Ltd. | Methods for producing a product ingot having low oxygen content |
| CN114855284A (zh) * | 2022-04-06 | 2022-08-05 | 上海新昇半导体科技有限公司 | 一种生长单晶硅的方法 |
| US12486594B2 (en) | 2022-08-29 | 2025-12-02 | Globalwafers Co., Ltd. | Ingot puller apparatus that axially position magnetic poles |
| US12486593B2 (en) | 2022-08-29 | 2025-12-02 | Globalwafers Co., Ltd. | Axial positioning of magnetic poles while producing a silicon ingot |
| CN116145238A (zh) * | 2022-12-31 | 2023-05-23 | 上海新昇半导体科技有限公司 | 一种晶体生长方法、装置及rf-soi基材 |
| CN116300762B (zh) * | 2023-03-30 | 2025-09-30 | 上海天岳半导体材料有限公司 | 基于切割区域温场的过程控制模型的构建方法及晶体棒过程控制切割方法 |
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| US5846318A (en) * | 1997-07-17 | 1998-12-08 | Memc Electric Materials, Inc. | Method and system for controlling growth of a silicon crystal |
| KR100395181B1 (ko) * | 1997-08-26 | 2003-08-21 | 미츠비시 스미토모 실리콘 주식회사 | 고품질 실리콘 단결정 및 그 제조방법 |
| US5882402A (en) * | 1997-09-30 | 1999-03-16 | Memc Electronic Materials, Inc. | Method for controlling growth of a silicon crystal |
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-
2004
- 2004-12-30 US US11/026,780 patent/US7223304B2/en not_active Expired - Lifetime
-
2005
- 2005-11-29 EP EP05852293A patent/EP1831436B1/en not_active Expired - Lifetime
- 2005-11-29 JP JP2007549377A patent/JP5344822B2/ja not_active Expired - Fee Related
- 2005-11-29 DE DE602005014010T patent/DE602005014010D1/de not_active Expired - Lifetime
- 2005-11-29 KR KR1020077015069A patent/KR101009074B1/ko not_active Expired - Fee Related
- 2005-11-29 CN CN2005800488495A patent/CN101133193B/zh not_active Expired - Fee Related
- 2005-11-29 WO PCT/US2005/042928 patent/WO2006073614A1/en not_active Ceased
- 2005-12-20 TW TW094145407A patent/TWI369423B/zh active
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2007
- 2007-05-25 US US11/753,722 patent/US7611580B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US20060144321A1 (en) | 2006-07-06 |
| KR101009074B1 (ko) | 2011-01-18 |
| US7611580B2 (en) | 2009-11-03 |
| DE602005014010D1 (de) | 2009-05-28 |
| EP1831436A1 (en) | 2007-09-12 |
| KR20070102675A (ko) | 2007-10-19 |
| US7223304B2 (en) | 2007-05-29 |
| TW200632150A (en) | 2006-09-16 |
| WO2006073614A1 (en) | 2006-07-13 |
| US20070227442A1 (en) | 2007-10-04 |
| JP2008526666A (ja) | 2008-07-24 |
| EP1831436B1 (en) | 2009-04-15 |
| CN101133193B (zh) | 2010-05-12 |
| TWI369423B (en) | 2012-08-01 |
| CN101133193A (zh) | 2008-02-27 |
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