JP5328169B2 - 撮像装置及び放射線撮像システム - Google Patents

撮像装置及び放射線撮像システム Download PDF

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Publication number
JP5328169B2
JP5328169B2 JP2008027664A JP2008027664A JP5328169B2 JP 5328169 B2 JP5328169 B2 JP 5328169B2 JP 2008027664 A JP2008027664 A JP 2008027664A JP 2008027664 A JP2008027664 A JP 2008027664A JP 5328169 B2 JP5328169 B2 JP 5328169B2
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conversion element
wiring
thin film
signal
tft
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JP2008027664A
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Japanese (ja)
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JP2008244445A (ja
JP2008244445A5 (enExample
Inventor
実 渡辺
千織 望月
孝昌 石井
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Canon Inc
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Canon Inc
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Priority to JP2008027664A priority Critical patent/JP5328169B2/ja
Priority to US12/034,969 priority patent/US7638772B2/en
Publication of JP2008244445A publication Critical patent/JP2008244445A/ja
Priority to US12/543,542 priority patent/US20090302229A1/en
Publication of JP2008244445A5 publication Critical patent/JP2008244445A5/ja
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  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)
JP2008027664A 2007-02-28 2008-02-07 撮像装置及び放射線撮像システム Expired - Fee Related JP5328169B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2008027664A JP5328169B2 (ja) 2007-02-28 2008-02-07 撮像装置及び放射線撮像システム
US12/034,969 US7638772B2 (en) 2007-02-28 2008-02-21 Imaging apparatus and radiation imaging system
US12/543,542 US20090302229A1 (en) 2007-02-28 2009-08-19 Imaging apparatus and radiation imaging system

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007049368 2007-02-28
JP2007049368 2007-02-28
JP2008027664A JP5328169B2 (ja) 2007-02-28 2008-02-07 撮像装置及び放射線撮像システム

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JP2008244445A JP2008244445A (ja) 2008-10-09
JP2008244445A5 JP2008244445A5 (enExample) 2011-01-27
JP5328169B2 true JP5328169B2 (ja) 2013-10-30

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Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5400507B2 (ja) * 2009-07-13 2014-01-29 キヤノン株式会社 撮像装置及び放射線撮像システム
JP5700973B2 (ja) * 2010-08-05 2015-04-15 キヤノン株式会社 検出装置及び放射線検出システム
JP2012114166A (ja) * 2010-11-22 2012-06-14 Canon Inc 検出装置及び放射線検出システム
JP5925475B2 (ja) * 2010-12-09 2016-05-25 株式会社半導体エネルギー研究所 光検出回路
JP5709709B2 (ja) * 2011-05-31 2015-04-30 キヤノン株式会社 検出装置の製造方法、その検出装置及び検出システム
JP5954983B2 (ja) * 2011-12-21 2016-07-20 キヤノン株式会社 撮像装置及び放射線撮像システム、並びに撮像装置の製造方法
JP6298447B2 (ja) * 2012-04-30 2018-03-28 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 読み出しエレクトロニクス及び／又はフォトセンサにアンチエイリアシングフィルタを備えた撮像検出器
JP5974654B2 (ja) * 2012-06-13 2016-08-23 ソニー株式会社 撮像装置および撮像表示システム
JP5709810B2 (ja) * 2012-10-02 2015-04-30 キヤノン株式会社 検出装置の製造方法、その検出装置及び検出システム
JP6282363B2 (ja) * 2017-02-09 2018-02-21 キヤノン株式会社 検出装置及び検出システム
CN110111753B (zh) * 2019-04-10 2020-10-27 深圳市华星光电半导体显示技术有限公司 显示面板的驱动方法及装置
JP2023131411A (ja) * 2022-03-09 2023-09-22 浜松ホトニクス株式会社 エネルギー線検出システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4255527B2 (ja) * 1997-10-20 2009-04-15 株式会社半導体エネルギー研究所 半導体装置
EP1169851B1 (en) * 2000-02-04 2015-08-12 Koninklijke Philips N.V. Active pixel sensor
JP2003023144A (ja) * 2001-07-06 2003-01-24 Semiconductor Energy Lab Co Ltd 半導体装置
JP5207583B2 (ja) * 2005-07-25 2013-06-12 キヤノン株式会社 放射線検出装置および放射線検出システム

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JP2008244445A (ja) 2008-10-09

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