JP5276434B2 - 経路計画方法 - Google Patents

経路計画方法 Download PDF

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Publication number
JP5276434B2
JP5276434B2 JP2008508276A JP2008508276A JP5276434B2 JP 5276434 B2 JP5276434 B2 JP 5276434B2 JP 2008508276 A JP2008508276 A JP 2008508276A JP 2008508276 A JP2008508276 A JP 2008508276A JP 5276434 B2 JP5276434 B2 JP 5276434B2
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JP
Japan
Prior art keywords
probe
axis
hole
around
scanning
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Expired - Fee Related
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JP2008508276A
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English (en)
Japanese (ja)
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JP2008538845A (ja
JP2008538845A5 (https=
Inventor
ウィリアム マクレーン イアン
マクファーランド ジェフリー
スベン ウォレス デビッド
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Renishaw PLC
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Renishaw PLC
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Application filed by Renishaw PLC filed Critical Renishaw PLC
Publication of JP2008538845A publication Critical patent/JP2008538845A/ja
Publication of JP2008538845A5 publication Critical patent/JP2008538845A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/42—Recording and playback systems, i.e. in which the program is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine
    • G05B19/4202—Recording and playback systems, i.e. in which the program is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine preparation of the program medium using a drawing, a model
    • G05B19/4207—Recording and playback systems, i.e. in which the program is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine preparation of the program medium using a drawing, a model in which a model is traced or scanned and corresponding data recorded

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Numerical Control (AREA)
JP2008508276A 2005-04-25 2006-04-12 経路計画方法 Expired - Fee Related JP5276434B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0508217.7A GB0508217D0 (en) 2005-04-25 2005-04-25 Method for scanning the surface of a workpiece
GB0508217.7 2005-04-25
PCT/GB2006/001335 WO2006114570A1 (en) 2005-04-25 2006-04-12 Method of path planning

Publications (3)

Publication Number Publication Date
JP2008538845A JP2008538845A (ja) 2008-11-06
JP2008538845A5 JP2008538845A5 (https=) 2009-05-28
JP5276434B2 true JP5276434B2 (ja) 2013-08-28

Family

ID=34639993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008508276A Expired - Fee Related JP5276434B2 (ja) 2005-04-25 2006-04-12 経路計画方法

Country Status (6)

Country Link
US (1) US7783445B2 (https=)
EP (1) EP1877728B1 (https=)
JP (1) JP5276434B2 (https=)
CN (2) CN101166949B (https=)
GB (1) GB0508217D0 (https=)
WO (1) WO2006114570A1 (https=)

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JP6113963B2 (ja) * 2012-04-26 2017-04-12 株式会社ミツトヨ 形状測定方法、及び形状測定装置
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WO2014122437A1 (en) * 2013-02-05 2014-08-14 Renishaw Plc Method and apparatus for measuring a part
DE102013101931B4 (de) 2013-02-27 2022-02-03 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Vorrichtung zum Vermessen eines Werkstücks
JP6175738B2 (ja) * 2013-10-10 2017-08-09 株式会社東京精密 三次元測定機を用いた円測定方法
US9639083B2 (en) 2013-12-18 2017-05-02 Mitutoyo Corporation System and method for programming workpiece feature inspection operations for a coordinate measuring machine
CN104049111A (zh) * 2014-07-01 2014-09-17 哈尔滨工业大学 基于双探针原子力显微镜的纳米卡尺及采用该纳米卡尺测量微纳米结构关键尺寸的方法
US9646425B2 (en) 2015-04-09 2017-05-09 Mitutoyo Corporation Inspection program editing environment with editing environment automatically globally responsive to editing operations in any of its portions
US9933256B2 (en) 2015-04-09 2018-04-03 Mitutoyo Corporation Inspection program editing environment including real-time feedback related to throughput
US9952586B2 (en) 2015-04-09 2018-04-24 Mitutoyo Corporation Inspection program editing environment with simulation status and control continually responsive to selection operations
EP3292060B1 (en) 2015-05-04 2025-12-17 Mitutoyo Corporation Inspection program editing environment providing user defined collision avoidance volumes
US11520472B2 (en) 2015-09-24 2022-12-06 Mitutoyo Corporation Inspection program editing environment including integrated alignment program planning and editing features
WO2017113195A1 (zh) * 2015-12-30 2017-07-06 深圳配天智能技术研究院有限公司 一种加工路径规划方法、加工路径规划装置及数控机床
JP6487385B2 (ja) * 2016-07-20 2019-03-20 ファナック株式会社 ロボットの原点位置較正装置および方法
US10990075B2 (en) 2016-09-27 2021-04-27 Mitutoyo Corporation Context sensitive relational feature/measurement command menu display in coordinate measurement machine (CMM) user interface
JP6909574B2 (ja) * 2016-11-29 2021-07-28 株式会社ミツトヨ 形状測定装置の制御方法
CN106643616A (zh) * 2016-12-27 2017-05-10 广东长盈精密技术有限公司 接触式分中测量方法
JP6344630B2 (ja) * 2017-07-12 2018-06-20 株式会社東京精密 三次元測定機を用いた円測定方法
CN107664478B (zh) * 2017-10-26 2023-11-03 成都众鑫聚合科技有限公司 一种立式非接触回转体高精度测量装置及其测量方法
DE112018006721T5 (de) 2017-12-29 2020-10-15 Mitutoyo Corporation Prüfprogrammbearbeitungsumgebung mit automatischen durchsichtigkeitsoperationen für verdeckte werkstückmerkmale
CN108549328B (zh) * 2018-03-22 2020-05-26 汇川技术（东莞）有限公司 自适应速度规划方法及系统
CN109059821B (zh) * 2018-08-27 2020-04-07 合肥工业大学 坐标测量机测量路径规划方法
CN109238084B (zh) * 2018-08-28 2020-04-14 合肥工业大学 一种微型圆孔测量的自动导引方法
CN110030963B (zh) * 2019-04-23 2020-10-13 太原理工大学 一种revo测头探针长度标定方法
CN111813100B (zh) * 2019-07-04 2022-07-15 中国科学技术大学 一种局部路径规划算法及装置
DE102019217515A1 (de) * 2019-11-13 2020-09-03 Carl Zeiss Industrielle Messtechnik Gmbh Sensorabhängige Festlegung von Winkelgeschwindigkeiten und -beschleunigungen bei Koordinatenmessgeräten
CN117537736A (zh) * 2023-10-26 2024-02-09 中国航发沈阳黎明航空发动机有限责任公司 一种高压双层整体叶盘叶型测量方法

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Also Published As

Publication number Publication date
GB0508217D0 (en) 2005-06-01
EP1877728A1 (en) 2008-01-16
US7783445B2 (en) 2010-08-24
EP1877728B1 (en) 2015-04-01
JP2008538845A (ja) 2008-11-06
US20090055118A1 (en) 2009-02-26
WO2006114570A1 (en) 2006-11-02
CN102914281A (zh) 2013-02-06
CN101166949A (zh) 2008-04-23
CN101166949B (zh) 2012-11-07
CN102914281B (zh) 2016-02-24

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