JP5248918B2 - 電子部品装置及びその製造方法 - Google Patents

電子部品装置及びその製造方法 Download PDF

Info

Publication number
JP5248918B2
JP5248918B2 JP2008140078A JP2008140078A JP5248918B2 JP 5248918 B2 JP5248918 B2 JP 5248918B2 JP 2008140078 A JP2008140078 A JP 2008140078A JP 2008140078 A JP2008140078 A JP 2008140078A JP 5248918 B2 JP5248918 B2 JP 5248918B2
Authority
JP
Japan
Prior art keywords
conductor
metal
sealing
electronic component
post
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008140078A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009289926A5 (https=
JP2009289926A (ja
Inventor
孝広 春日
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinko Electric Industries Co Ltd
Original Assignee
Shinko Electric Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Electric Industries Co Ltd filed Critical Shinko Electric Industries Co Ltd
Priority to JP2008140078A priority Critical patent/JP5248918B2/ja
Publication of JP2009289926A publication Critical patent/JP2009289926A/ja
Publication of JP2009289926A5 publication Critical patent/JP2009289926A5/ja
Application granted granted Critical
Publication of JP5248918B2 publication Critical patent/JP5248918B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
JP2008140078A 2008-05-28 2008-05-28 電子部品装置及びその製造方法 Expired - Fee Related JP5248918B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008140078A JP5248918B2 (ja) 2008-05-28 2008-05-28 電子部品装置及びその製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008140078A JP5248918B2 (ja) 2008-05-28 2008-05-28 電子部品装置及びその製造方法

Publications (3)

Publication Number Publication Date
JP2009289926A JP2009289926A (ja) 2009-12-10
JP2009289926A5 JP2009289926A5 (https=) 2011-06-02
JP5248918B2 true JP5248918B2 (ja) 2013-07-31

Family

ID=41458869

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008140078A Expired - Fee Related JP5248918B2 (ja) 2008-05-28 2008-05-28 電子部品装置及びその製造方法

Country Status (1)

Country Link
JP (1) JP5248918B2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10546819B2 (en) 2016-09-15 2020-01-28 Toshiba Memory Corporation Semiconductor device and method of manufacturing the same

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6444707B2 (ja) 2014-11-28 2018-12-26 Towa株式会社 電子部品、その製造方法及び製造装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07254654A (ja) * 1994-03-15 1995-10-03 Fujitsu Ltd 半導体装置の製造方法
JP3798620B2 (ja) * 2000-12-04 2006-07-19 富士通株式会社 半導体装置の製造方法
JP2003174124A (ja) * 2001-12-04 2003-06-20 Sainekkusu:Kk 半導体装置の外部電極形成方法
JP2003249607A (ja) * 2002-02-26 2003-09-05 Seiko Epson Corp 半導体装置及びその製造方法、回路基板並びに電子機器
JP3972183B2 (ja) * 2002-03-07 2007-09-05 セイコーエプソン株式会社 半導体装置及びその製造方法、回路基板並びに電子機器

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10546819B2 (en) 2016-09-15 2020-01-28 Toshiba Memory Corporation Semiconductor device and method of manufacturing the same

Also Published As

Publication number Publication date
JP2009289926A (ja) 2009-12-10

Similar Documents

Publication Publication Date Title
US7851894B1 (en) System and method for shielding of package on package (PoP) assemblies
KR100522223B1 (ko) 반도체장치및그제조방법
KR100347706B1 (ko) 이식성 도전패턴을 포함하는 반도체 패키지 및 그 제조방법
JP2860646B2 (ja) 半導体パッケージ及び製造方法
JP3032964B2 (ja) ボールグリッドアレイ半導体のパッケージ及び製造方法
US6646338B2 (en) Film carrier tape, semiconductor assembly, semiconductor device, and method of manufacturing the same, mounted board, and electronic instrument
US6689640B1 (en) Chip scale pin array
US8487424B2 (en) Routable array metal integrated circuit package fabricated using partial etching process
JP3238004B2 (ja) 半導体装置の製造方法
CN103681365B (zh) 层叠封装结构及其制作方法
JPWO2001026147A1 (ja) 半導体装置及びその製造方法、回路基板並びに電子機器
US20060091523A1 (en) Semiconductor device and a method for manufacturing of the same
WO2001026147A1 (en) Semiconductor device, method of manufacture thereof, circuit board, and electronic device
JPH09121002A (ja) 半導体装置及びその製造方法
KR19980069147A (ko) 반도체 패키지의 구조 및 제조방법
JP5406572B2 (ja) 電子部品内蔵配線基板及びその製造方法
JP4171499B2 (ja) 電子装置用基板およびその製造方法、並びに電子装置およびその製造方法
JP3942299B2 (ja) チップスケールパッケージの製造方法
US8193643B2 (en) Semiconductor device and method for fabricating the same
JP3478139B2 (ja) リードフレームの製造方法
US20090170307A1 (en) Method of manufacturing semiconductor device
JPH053183A (ja) 半導体装置及びその製造方法
JP5248918B2 (ja) 電子部品装置及びその製造方法
JP2002198458A (ja) 半導体装置及び半導体装置製造方法
JP3522403B2 (ja) 半導体装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110415

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110415

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120620

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120626

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120712

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130326

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130411

R150 Certificate of patent or registration of utility model

Ref document number: 5248918

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20160419

Year of fee payment: 3

LAPS Cancellation because of no payment of annual fees