JP5192965B2 - 顕微鏡システム、該制御プログラム、及び該制御方法 - Google Patents

顕微鏡システム、該制御プログラム、及び該制御方法 Download PDF

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Publication number
JP5192965B2
JP5192965B2 JP2008248481A JP2008248481A JP5192965B2 JP 5192965 B2 JP5192965 B2 JP 5192965B2 JP 2008248481 A JP2008248481 A JP 2008248481A JP 2008248481 A JP2008248481 A JP 2008248481A JP 5192965 B2 JP5192965 B2 JP 5192965B2
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Japan
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area
screen
pointer
microscope
image
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JP2008248481A
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English (en)
Japanese (ja)
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JP2010079035A (ja
JP2010079035A5 (enExample
Inventor
哲也 城田
泰子 石井
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Olympus Corp
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Olympus Corp
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Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2008248481A priority Critical patent/JP5192965B2/ja
Priority to EP09815836.3A priority patent/EP2328009B1/en
Priority to PCT/JP2009/004463 priority patent/WO2010035414A1/ja
Priority to EP11002414.8A priority patent/EP2339389B1/en
Publication of JP2010079035A publication Critical patent/JP2010079035A/ja
Priority to US13/052,530 priority patent/US8699129B2/en
Priority to US13/178,146 priority patent/US8339702B2/en
Publication of JP2010079035A5 publication Critical patent/JP2010079035A5/ja
Application granted granted Critical
Publication of JP5192965B2 publication Critical patent/JP5192965B2/ja
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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40Investigating hardness or rebound hardness
    • G01N3/42Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Multimedia (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
JP2008248481A 2008-09-26 2008-09-26 顕微鏡システム、該制御プログラム、及び該制御方法 Active JP5192965B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2008248481A JP5192965B2 (ja) 2008-09-26 2008-09-26 顕微鏡システム、該制御プログラム、及び該制御方法
EP09815836.3A EP2328009B1 (en) 2008-09-26 2009-09-09 Microscope system, storage medium in which control program therefor is stored, and control method therefor
PCT/JP2009/004463 WO2010035414A1 (ja) 2008-09-26 2009-09-09 顕微鏡システム、該制御プログラムが格納された記憶媒体、及び該制御方法
EP11002414.8A EP2339389B1 (en) 2008-09-26 2009-09-09 Microscope system, storage medium storing control program, and control method
US13/052,530 US8699129B2 (en) 2008-09-26 2011-03-21 Microscope system, storage medium storing control program, and control method
US13/178,146 US8339702B2 (en) 2008-09-26 2011-07-07 Microscope system, storage medium storing control program, and control method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008248481A JP5192965B2 (ja) 2008-09-26 2008-09-26 顕微鏡システム、該制御プログラム、及び該制御方法

Publications (3)

Publication Number Publication Date
JP2010079035A JP2010079035A (ja) 2010-04-08
JP2010079035A5 JP2010079035A5 (enExample) 2011-10-13
JP5192965B2 true JP5192965B2 (ja) 2013-05-08

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Family Applications (1)

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JP2008248481A Active JP5192965B2 (ja) 2008-09-26 2008-09-26 顕微鏡システム、該制御プログラム、及び該制御方法

Country Status (1)

Country Link
JP (1) JP5192965B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010043919A1 (de) * 2010-11-15 2012-05-16 Leica Microsystems (Schweiz) Ag Tragbares Mikroskop
JP5841379B2 (ja) * 2011-08-31 2016-01-13 株式会社ミツトヨ 硬さ試験機
JP2014002190A (ja) * 2012-06-15 2014-01-09 Dainippon Printing Co Ltd コンピュータ装置及びプログラム
CN105988208A (zh) * 2015-02-02 2016-10-05 长沙明鹏科技有限公司 一种污水在线镜检方法及镜检装置
JP6062028B2 (ja) * 2015-12-22 2017-01-18 オリンパス株式会社 拡大観察装置、及び、拡大観察方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002007498A (ja) * 2000-06-22 2002-01-11 Hitachi Ltd 半導体設計グラフィカルユーザインターフェース装置
JP2002090632A (ja) * 2000-09-19 2002-03-27 Olympus Optical Co Ltd マウスを用いた調整方法及びコンピュータにより読み取り可能な記憶媒体
JP2002098897A (ja) * 2000-09-21 2002-04-05 Shimadzu Corp 顕微鏡
JP2003019679A (ja) * 2001-07-09 2003-01-21 Suruga Seiki Kk マイクロマニピュレータ駆動制御装置、マイクロマニピュレータ駆動制御方法およびマイクロマニピュレータ駆動制御プログラムを記録した媒体
JP2007192776A (ja) * 2006-01-23 2007-08-02 Shimadzu Corp X線検査装置

Also Published As

Publication number Publication date
JP2010079035A (ja) 2010-04-08

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