JP5089139B2 - 半導体装置の作製方法 - Google Patents
半導体装置の作製方法 Download PDFInfo
- Publication number
- JP5089139B2 JP5089139B2 JP2006304812A JP2006304812A JP5089139B2 JP 5089139 B2 JP5089139 B2 JP 5089139B2 JP 2006304812 A JP2006304812 A JP 2006304812A JP 2006304812 A JP2006304812 A JP 2006304812A JP 5089139 B2 JP5089139 B2 JP 5089139B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- conductive film
- insulating film
- etching
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Electrodes Of Semiconductors (AREA)
- Thin Film Transistor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006304812A JP5089139B2 (ja) | 2005-11-15 | 2006-11-10 | 半導体装置の作製方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005329806 | 2005-11-15 | ||
| JP2005329806 | 2005-11-15 | ||
| JP2006304812A JP5089139B2 (ja) | 2005-11-15 | 2006-11-10 | 半導体装置の作製方法 |
Related Child Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009076053A Division JP5089636B2 (ja) | 2005-11-15 | 2009-03-26 | 半導体装置の作製方法及び液晶表示装置の作製方法 |
| JP2009236821A Division JP2010010721A (ja) | 2005-11-15 | 2009-10-14 | ダイオード及びアクティブマトリクス表示装置 |
| JP2011002880A Division JP5178850B2 (ja) | 2005-11-15 | 2011-01-11 | 半導体装置の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007165861A JP2007165861A (ja) | 2007-06-28 |
| JP2007165861A5 JP2007165861A5 (enExample) | 2009-05-14 |
| JP5089139B2 true JP5089139B2 (ja) | 2012-12-05 |
Family
ID=38248347
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006304812A Active JP5089139B2 (ja) | 2005-11-15 | 2006-11-10 | 半導体装置の作製方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5089139B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20100097053A (ko) * | 2009-02-25 | 2010-09-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
Families Citing this family (65)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8008670B2 (en) | 2006-02-21 | 2011-08-30 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
| JP5393058B2 (ja) * | 2007-09-05 | 2014-01-22 | キヤノン株式会社 | 電界効果型トランジスタ |
| JP5525778B2 (ja) * | 2008-08-08 | 2014-06-18 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| TWI508282B (zh) * | 2008-08-08 | 2015-11-11 | Semiconductor Energy Lab | 半導體裝置及其製造方法 |
| TWI642113B (zh) | 2008-08-08 | 2018-11-21 | 半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
| JP5627071B2 (ja) | 2008-09-01 | 2014-11-19 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| KR20110056542A (ko) * | 2008-09-12 | 2011-05-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
| KR101644406B1 (ko) * | 2008-09-12 | 2016-08-01 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
| KR101623224B1 (ko) | 2008-09-12 | 2016-05-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제조 방법 |
| KR101545460B1 (ko) * | 2008-09-12 | 2015-08-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 생산 방법 |
| KR101507324B1 (ko) * | 2008-09-19 | 2015-03-31 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
| KR101722409B1 (ko) | 2008-09-19 | 2017-04-03 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| WO2010032639A1 (en) * | 2008-09-19 | 2010-03-25 | Semiconductor Energy Laboratory Co., Ltd. | Display device and manufacturing method of the same |
| KR101273972B1 (ko) * | 2008-10-03 | 2013-06-12 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치 |
| JP5484853B2 (ja) * | 2008-10-10 | 2014-05-07 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| KR101634411B1 (ko) * | 2008-10-31 | 2016-06-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 구동 회로, 표시 장치 및 전자 장치 |
| KR20130138352A (ko) * | 2008-11-07 | 2013-12-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| TWI467663B (zh) * | 2008-11-07 | 2015-01-01 | Semiconductor Energy Lab | 半導體裝置和該半導體裝置的製造方法 |
| TW202025500A (zh) | 2008-11-07 | 2020-07-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置和其製造方法 |
| EP2184783B1 (en) * | 2008-11-07 | 2012-10-03 | Semiconductor Energy Laboratory Co, Ltd. | Semiconductor device and method for manufacturing the same |
| TWI536577B (zh) * | 2008-11-13 | 2016-06-01 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
| TWI616707B (zh) | 2008-11-28 | 2018-03-01 | 半導體能源研究所股份有限公司 | 液晶顯示裝置 |
| TWI476915B (zh) * | 2008-12-25 | 2015-03-11 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
| KR101719350B1 (ko) * | 2008-12-25 | 2017-03-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
| US8114720B2 (en) | 2008-12-25 | 2012-02-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| US8461582B2 (en) | 2009-03-05 | 2013-06-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| TWI529942B (zh) | 2009-03-27 | 2016-04-11 | 半導體能源研究所股份有限公司 | 半導體裝置 |
| US8338226B2 (en) * | 2009-04-02 | 2012-12-25 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| KR101579453B1 (ko) | 2009-04-29 | 2015-12-24 | 삼성디스플레이 주식회사 | 박막 트랜지스터 표시판 및 이의 제조 방법 |
| WO2010125986A1 (en) * | 2009-05-01 | 2010-11-04 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| WO2011010545A1 (en) * | 2009-07-18 | 2011-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| CN102473732B (zh) | 2009-07-27 | 2015-09-16 | 株式会社神户制钢所 | 布线结构以及具备布线结构的显示装置 |
| WO2011027649A1 (en) | 2009-09-02 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including a transistor, and manufacturing method of semiconductor device |
| WO2011027656A1 (en) | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Transistor and display device |
| WO2011027723A1 (en) | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| WO2011027664A1 (en) * | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and method for manufacturing the same |
| WO2011027701A1 (en) | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device and method for manufacturing the same |
| KR101740943B1 (ko) * | 2009-09-24 | 2017-06-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
| WO2011037010A1 (en) * | 2009-09-24 | 2011-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor element and method for manufacturing the same |
| WO2011043194A1 (en) * | 2009-10-09 | 2011-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| KR101082254B1 (ko) * | 2009-11-04 | 2011-11-09 | 삼성모바일디스플레이주식회사 | 유기전계발광 표시 장치 및 그의 제조 방법 |
| KR20170091760A (ko) * | 2009-11-27 | 2017-08-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| KR102333270B1 (ko) | 2009-12-04 | 2021-12-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| WO2011077946A1 (en) | 2009-12-25 | 2011-06-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US8415731B2 (en) * | 2010-01-20 | 2013-04-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor storage device with integrated capacitor and having transistor overlapping sections |
| KR102088281B1 (ko) * | 2010-01-22 | 2020-03-13 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| US8436403B2 (en) * | 2010-02-05 | 2013-05-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including transistor provided with sidewall and electronic appliance |
| KR20250150667A (ko) * | 2010-02-26 | 2025-10-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| KR101780841B1 (ko) * | 2010-02-26 | 2017-09-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| CN106098788B (zh) | 2010-04-02 | 2020-10-16 | 株式会社半导体能源研究所 | 半导体装置 |
| US9473714B2 (en) * | 2010-07-01 | 2016-10-18 | Semiconductor Energy Laboratory Co., Ltd. | Solid-state imaging device and semiconductor display device |
| US8797487B2 (en) | 2010-09-10 | 2014-08-05 | Semiconductor Energy Laboratory Co., Ltd. | Transistor, liquid crystal display device, and manufacturing method thereof |
| US9117916B2 (en) * | 2011-10-13 | 2015-08-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising oxide semiconductor film |
| JP5933895B2 (ja) * | 2011-11-10 | 2016-06-15 | 株式会社半導体エネルギー研究所 | 半導体装置および半導体装置の作製方法 |
| US8941113B2 (en) * | 2012-03-30 | 2015-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor element, semiconductor device, and manufacturing method of semiconductor element |
| JP6060972B2 (ja) * | 2012-07-05 | 2017-01-18 | 株式会社ニコン | 酸化亜鉛薄膜の製造方法、薄膜トランジスタの製造方法および透明酸化物配線の製造方法 |
| KR20140029202A (ko) | 2012-08-28 | 2014-03-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
| US9625764B2 (en) | 2012-08-28 | 2017-04-18 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device |
| KR102161078B1 (ko) | 2012-08-28 | 2020-09-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 그 제작 방법 |
| DE102013111501B4 (de) | 2013-10-18 | 2024-02-08 | Universität Stuttgart | Dünnschichttransistor und Verfahren zu seiner Herstellung |
| CN104637950A (zh) * | 2013-11-14 | 2015-05-20 | 上海和辉光电有限公司 | 薄膜晶体管驱动背板及其制造方法 |
| WO2016067144A1 (en) | 2014-10-28 | 2016-05-06 | Semiconductor Energy Laboratory Co., Ltd. | Display device, manufacturing method of display device, and electronic device |
| CN107111972B (zh) | 2014-10-28 | 2020-04-28 | 株式会社半导体能源研究所 | 功能面板、功能面板的制造方法、模块、数据处理装置 |
| US10141544B2 (en) | 2016-08-10 | 2018-11-27 | Semiconductor Energy Laboratory Co., Ltd. | Electroluminescent display device and manufacturing method thereof |
| JP6542329B2 (ja) * | 2017-11-14 | 2019-07-10 | 株式会社半導体エネルギー研究所 | 半導体装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62252973A (ja) * | 1986-04-25 | 1987-11-04 | Nec Corp | 順スタガ−ド型薄膜トランジスタ |
| JPH01236655A (ja) * | 1988-03-17 | 1989-09-21 | Matsushita Electric Ind Co Ltd | 薄膜電界効果トランジスタとその製造方法 |
| JP3106786B2 (ja) * | 1993-08-26 | 2000-11-06 | 松下電器産業株式会社 | 半導体装置およびその製造方法 |
| JP2003037268A (ja) * | 2001-07-24 | 2003-02-07 | Minolta Co Ltd | 半導体素子及びその製造方法 |
| JP4090716B2 (ja) * | 2001-09-10 | 2008-05-28 | 雅司 川崎 | 薄膜トランジスタおよびマトリクス表示装置 |
| US7339187B2 (en) * | 2002-05-21 | 2008-03-04 | State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University | Transistor structures |
| JP4483235B2 (ja) * | 2003-09-01 | 2010-06-16 | カシオ計算機株式会社 | トランジスタアレイ基板の製造方法及びトランジスタアレイ基板 |
| JP2006344849A (ja) * | 2005-06-10 | 2006-12-21 | Casio Comput Co Ltd | 薄膜トランジスタ |
-
2006
- 2006-11-10 JP JP2006304812A patent/JP5089139B2/ja active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20100097053A (ko) * | 2009-02-25 | 2010-09-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
| KR101669608B1 (ko) | 2009-02-25 | 2016-10-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2007165861A (ja) | 2007-06-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5089139B2 (ja) | 半導体装置の作製方法 | |
| JP5890494B2 (ja) | 半導体装置の作製方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090327 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20090327 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20091013 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20120419 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120424 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120612 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20120904 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20120911 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150921 Year of fee payment: 3 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5089139 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150921 Year of fee payment: 3 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |