JP5078873B2 - 電気的応答デバイス - Google Patents

電気的応答デバイス Download PDF

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Publication number
JP5078873B2
JP5078873B2 JP2008505449A JP2008505449A JP5078873B2 JP 5078873 B2 JP5078873 B2 JP 5078873B2 JP 2008505449 A JP2008505449 A JP 2008505449A JP 2008505449 A JP2008505449 A JP 2008505449A JP 5078873 B2 JP5078873 B2 JP 5078873B2
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JP
Japan
Prior art keywords
electrically responsive
substrate
electrode
electrical response
responsive material
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JP2008505449A
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English (en)
Japanese (ja)
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JP2008536395A5 (enExample
JP2008536395A (ja
Inventor
マスターズ,ブレット・ピー
ミラー,マイケル・エフ
Original Assignee
バイオスケール・インコーポレーテッド
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Publication of JP2008536395A5 publication Critical patent/JP2008536395A5/ja
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02Analysing fluids
    • G01N29/036Analysing fluids by measuring frequency or resonance of acoustic waves
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/02Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
    • H03H3/04Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/08Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
    • H03H3/10Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves for obtaining desired frequency or temperature coefficient
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/025Change of phase or condition
    • G01N2291/0256Adsorption, desorption, surface mass change, e.g. on biosensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/002Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity using variation of the resonant frequency of an element vibrating in contact with the material submitted to analysis

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  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Manufacturing & Machinery (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Micromachines (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
JP2008505449A 2005-04-06 2006-04-05 電気的応答デバイス Expired - Fee Related JP5078873B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US66893305P 2005-04-06 2005-04-06
US60/668,933 2005-04-06
PCT/US2006/012491 WO2006107961A2 (en) 2005-04-06 2006-04-05 Electrically responsive device

Publications (3)

Publication Number Publication Date
JP2008536395A JP2008536395A (ja) 2008-09-04
JP2008536395A5 JP2008536395A5 (enExample) 2009-05-21
JP5078873B2 true JP5078873B2 (ja) 2012-11-21

Family

ID=36717063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008505449A Expired - Fee Related JP5078873B2 (ja) 2005-04-06 2006-04-05 電気的応答デバイス

Country Status (5)

Country Link
US (1) US8536037B2 (enExample)
EP (1) EP1872474A2 (enExample)
JP (1) JP5078873B2 (enExample)
KR (1) KR101245296B1 (enExample)
WO (1) WO2006107961A2 (enExample)

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DE10224567B4 (de) * 2002-06-03 2014-10-23 Boehringer Ingelheim Vetmedica Gmbh Sensor-Anordnung und Verfahren zum Betreiben einer Sensor-Anordnung
US7497133B2 (en) 2004-05-24 2009-03-03 Drexel University All electric piezoelectric finger sensor (PEFS) for soft material stiffness measurement
CA2637930C (en) * 2006-01-23 2016-09-06 Drexel University Self-exciting, self-sensing piezoelectric cantilever sensor
US8171795B1 (en) 2006-01-23 2012-05-08 Drexel University Self-exciting, self-sensing piezoelectric cantilever sensor for detection of airborne analytes directly in air
WO2007133619A1 (en) * 2006-05-10 2007-11-22 Drexel University Molecular control of surface coverage
US8481335B2 (en) * 2006-11-27 2013-07-09 Drexel University Specificity and sensitivity enhancement in cantilever sensing
EP2100125A4 (en) 2006-11-28 2012-02-15 Univ Drexel MICROPORTE-TO-FALSE PIEZOELECTRIC SENSORS FOR BIODETECTION
US7992431B2 (en) 2006-11-28 2011-08-09 Drexel University Piezoelectric microcantilevers and uses in atomic force microscopy
CA2677196A1 (en) 2007-02-01 2008-09-12 Drexel University A hand-held phase-shift detector for sensor applications
US7892759B2 (en) 2007-02-16 2011-02-22 Drexel University Enhanced sensitivity of a cantilever sensor via specific bindings
US8512947B2 (en) 2007-02-16 2013-08-20 Drexel University Detection of nucleic acids using a cantilever sensor
FR2916271B1 (fr) * 2007-05-14 2009-08-28 St Microelectronics Sa Circuit electronique permettant la mesure de masse de materiau biologique et procede de fabrication
US7993854B2 (en) * 2007-05-30 2011-08-09 Drexel University Detection and quantification of biomarkers via a piezoelectric cantilever sensor
US20090120168A1 (en) * 2007-11-08 2009-05-14 Schlumberger Technology Corporation Microfluidic downhole density and viscosity sensor
WO2009079154A2 (en) 2007-11-23 2009-06-25 Drexel University Lead-free piezoelectric ceramic films and a method for making thereof
US8236508B2 (en) * 2008-01-29 2012-08-07 Drexel University Detecting and measuring live pathogens utilizing a mass detection device
US8741663B2 (en) 2008-03-11 2014-06-03 Drexel University Enhanced detection sensitivity with piezoelectric sensors
CN102066928B (zh) 2008-05-16 2015-08-05 德瑞索大学 评估组织的系统和方法
IT1392736B1 (it) 2008-12-09 2012-03-16 St Microelectronics Rousset Dispositivo a microbilancia torsionale integrata in tecnologia mems e relativo processo di fabbricazione
US8722427B2 (en) * 2009-10-08 2014-05-13 Drexel University Determination of dissociation constants using piezoelectric microcantilevers
US20110086368A1 (en) * 2009-10-08 2011-04-14 Drexel University Method for immune response detection
CN104596906B (zh) * 2015-01-16 2017-08-25 上海大学 多测量头的水氧透气率测量系统
CN106556626B (zh) * 2015-01-22 2019-04-26 江西师范大学 基于纳米材料的传感器的形成方法
JP6945357B2 (ja) * 2017-06-08 2021-10-06 東京エレクトロン株式会社 制御装置。
KR102321513B1 (ko) 2018-08-21 2021-11-02 주식회사 엘지에너지솔루션 버스바 플레이트를 포함하는 배터리 모듈
CN109450401B (zh) * 2018-09-20 2022-03-18 天津大学 柔性单晶兰姆波谐振器及其形成方法

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US4278492A (en) * 1980-01-21 1981-07-14 Hewlett-Packard Company Frequency trimming of surface acoustic wave devices
US4364016A (en) * 1980-11-03 1982-12-14 Sperry Corporation Method for post fabrication frequency trimming of surface acoustic wave devices
US5189914A (en) * 1988-02-29 1993-03-02 The Regents Of The University Of California Plate-mode ultrasonic sensor
WO1989008336A1 (en) * 1988-02-29 1989-09-08 The Regents Of The University Of California Plate-mode ultrasonic sensor
US5490034A (en) * 1989-01-13 1996-02-06 Kopin Corporation SOI actuators and microsensors
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Also Published As

Publication number Publication date
US20060228657A1 (en) 2006-10-12
WO2006107961A2 (en) 2006-10-12
KR101245296B1 (ko) 2013-03-19
WO2006107961A3 (en) 2007-04-12
KR20080007552A (ko) 2008-01-22
EP1872474A2 (en) 2008-01-02
US8536037B2 (en) 2013-09-17
JP2008536395A (ja) 2008-09-04

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