JP4918846B2 - 質量分析装置及び質量分析方法 - Google Patents

質量分析装置及び質量分析方法 Download PDF

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Publication number
JP4918846B2
JP4918846B2 JP2006314986A JP2006314986A JP4918846B2 JP 4918846 B2 JP4918846 B2 JP 4918846B2 JP 2006314986 A JP2006314986 A JP 2006314986A JP 2006314986 A JP2006314986 A JP 2006314986A JP 4918846 B2 JP4918846 B2 JP 4918846B2
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mass
ions
voltage
mass spectrometer
axial direction
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JP2006314986A
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Japanese (ja)
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JP2008130401A (ja
JP2008130401A5 (enExample
Inventor
雄一郎 橋本
英樹 長谷川
泉 和氣
益之 杉山
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2006314986A priority Critical patent/JP4918846B2/ja
Priority to CN200710085081XA priority patent/CN101188183B/zh
Priority to EP07008983.4A priority patent/EP1926123B1/en
Priority to US11/745,516 priority patent/US7820961B2/en
Publication of JP2008130401A publication Critical patent/JP2008130401A/ja
Publication of JP2008130401A5 publication Critical patent/JP2008130401A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2006314986A 2006-11-22 2006-11-22 質量分析装置及び質量分析方法 Expired - Fee Related JP4918846B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2006314986A JP4918846B2 (ja) 2006-11-22 2006-11-22 質量分析装置及び質量分析方法
CN200710085081XA CN101188183B (zh) 2006-11-22 2007-02-28 质量分析装置和质量分析方法
EP07008983.4A EP1926123B1 (en) 2006-11-22 2007-05-03 Mass spectrometer and method of mass spectrometry
US11/745,516 US7820961B2 (en) 2006-11-22 2007-05-08 Mass spectrometer and method of mass spectrometry

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006314986A JP4918846B2 (ja) 2006-11-22 2006-11-22 質量分析装置及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2008130401A JP2008130401A (ja) 2008-06-05
JP2008130401A5 JP2008130401A5 (enExample) 2009-09-17
JP4918846B2 true JP4918846B2 (ja) 2012-04-18

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JP2006314986A Expired - Fee Related JP4918846B2 (ja) 2006-11-22 2006-11-22 質量分析装置及び質量分析方法

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US (1) US7820961B2 (enExample)
EP (1) EP1926123B1 (enExample)
JP (1) JP4918846B2 (enExample)
CN (1) CN101188183B (enExample)

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WO2016203328A1 (en) * 2015-06-18 2016-12-22 Dh Technologies Development Pte. Ltd. Probability-based library search algorithm (prols)

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JP5542055B2 (ja) * 2008-08-29 2014-07-09 株式会社日立ハイテクノロジーズ 質量分析装置
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JP5303286B2 (ja) * 2009-01-21 2013-10-02 株式会社日立ハイテクノロジーズ 質量分析装置
US8138472B2 (en) * 2009-04-29 2012-03-20 Academia Sinica Molecular ion accelerator
JP5950913B2 (ja) * 2010-08-25 2016-07-13 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 有意な六重極および八重極成分を有する実質的に四重極の電場を提供するための方法およびシステム
JP5644863B2 (ja) * 2010-12-17 2014-12-24 株式会社島津製作所 イオンガイド及び質量分析装置
JP5771456B2 (ja) * 2011-06-24 2015-09-02 株式会社日立ハイテクノロジーズ 質量分析方法
DE102011115195B4 (de) * 2011-09-28 2016-03-10 Bruker Daltonik Gmbh Massenspektrometrischer Ionenspeicher für extrem verschiedene Massenbereiche
WO2013098607A1 (en) * 2011-12-28 2013-07-04 Dh Technologies Development Pte. Ltd. Dynamic multipole kingdon ion trap
US20140374589A1 (en) * 2012-02-01 2014-12-25 Dh Technologies Development Pte. Ltd Method and apparatus for improved sensitivity in a mass spectrometer
US8933397B1 (en) 2012-02-02 2015-01-13 University of Northern Iowa Research Foundati Ion trap mass analyzer apparatus, methods, and systems utilizing one or more multiple potential ion guide (MPIG) electrodes
CN104303259B (zh) * 2012-05-18 2016-12-14 Dh科技发展私人贸易有限公司 高动态范围检测器校正算法
CN102820202A (zh) * 2012-08-24 2012-12-12 上海斯善质谱仪器有限公司 一种可调节四极场中离子分布的装置和方法
WO2014045093A1 (en) 2012-09-18 2014-03-27 Dh Technologies Development Pte. Ltd. Systems and methods for acquiring data for mass spectrometry images
US8969794B2 (en) 2013-03-15 2015-03-03 1St Detect Corporation Mass dependent automatic gain control for mass spectrometer
CA2912998A1 (en) * 2013-05-30 2014-12-04 Dh Technologies Development Pte. Ltd. Inline ion reaction device cell and method of operation
US9105454B2 (en) * 2013-11-06 2015-08-11 Agilent Technologies, Inc. Plasma-based electron capture dissociation (ECD) apparatus and related systems and methods
GB2550739B (en) * 2015-02-23 2020-09-02 Hitachi High-Tech Corp Ion guide and mass spectrometer using same
US9818595B2 (en) * 2015-05-11 2017-11-14 Thermo Finnigan Llc Systems and methods for ion isolation using a dual waveform
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
JP7267865B2 (ja) * 2019-07-19 2023-05-02 株式会社日立ハイテク 分析装置及び分析方法
WO2021207494A1 (en) 2020-04-09 2021-10-14 Waters Technologies Corporation Ion detector
WO2023111707A1 (en) 2021-12-15 2023-06-22 Waters Technologies Corporation An inductive detector with integrated amplifier

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JP4275545B2 (ja) * 2004-02-17 2009-06-10 株式会社日立ハイテクノロジーズ 質量分析装置
JP4872088B2 (ja) * 2004-05-05 2012-02-08 ディーエイチ テクノロジーズ ディベロップメント ピーティーイー リミテッド 質量分析計用イオンガイド
JP4659395B2 (ja) * 2004-06-08 2011-03-30 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
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US7067802B1 (en) * 2005-02-11 2006-06-27 Thermo Finnigan Llc Generation of combination of RF and axial DC electric fields in an RF-only multipole
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US7582864B2 (en) * 2005-12-22 2009-09-01 Leco Corporation Linear ion trap with an imbalanced radio frequency field
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016203328A1 (en) * 2015-06-18 2016-12-22 Dh Technologies Development Pte. Ltd. Probability-based library search algorithm (prols)
US10115575B2 (en) 2015-06-18 2018-10-30 Dh Technologies Development Pte. Ltd. Probability-based library search algorithm (ProLS)

Also Published As

Publication number Publication date
JP2008130401A (ja) 2008-06-05
CN101188183A (zh) 2008-05-28
US20080116372A1 (en) 2008-05-22
US7820961B2 (en) 2010-10-26
EP1926123A2 (en) 2008-05-28
EP1926123B1 (en) 2013-04-10
CN101188183B (zh) 2010-09-29
EP1926123A3 (en) 2010-08-25

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