JP4862404B2 - Method and apparatus for polishing glass substrate for FPD - Google Patents

Method and apparatus for polishing glass substrate for FPD Download PDF

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JP4862404B2
JP4862404B2 JP2006012772A JP2006012772A JP4862404B2 JP 4862404 B2 JP4862404 B2 JP 4862404B2 JP 2006012772 A JP2006012772 A JP 2006012772A JP 2006012772 A JP2006012772 A JP 2006012772A JP 4862404 B2 JP4862404 B2 JP 4862404B2
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polishing
glass substrate
fpd
circular
tool
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JP2007190657A (en
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康成 生田
健雄 鈴木
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AGC Inc
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Asahi Glass Co Ltd
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Priority to JP2006012772A priority Critical patent/JP4862404B2/en
Priority to KR1020117031579A priority patent/KR101273729B1/en
Priority to CN200680051523.2A priority patent/CN101360584B/en
Priority to PCT/JP2006/323020 priority patent/WO2007083438A1/en
Priority to KR1020087010821A priority patent/KR101143290B1/en
Priority to TW095143579A priority patent/TW200728019A/en
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/06Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving conveyor belts, a sequence of travelling work-tables or the like
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/24Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/24Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass
    • B24B7/242Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass for plate glass
    • B24B7/244Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass for plate glass continuous
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/24Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass
    • B24B7/247Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass using reciprocating grinding tools

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Description

本発明は板状体の研磨方法及びその装置に係り、特に液晶ディスプレイ用等に使用されるFPD(Flat Panel Display)用のガラス基板を、連続研磨装置によって研磨する板状体の研磨方法及びその装置に関する。   TECHNICAL FIELD The present invention relates to a plate-like body polishing method and apparatus, and more particularly to a plate-like polishing method for polishing a glass substrate for an FPD (Flat Panel Display) used for a liquid crystal display or the like by a continuous polishing apparatus and the like. Relates to the device.

特に液晶ディスプレイ用等に使用されるFPD(Flat Panel Display)用のガラス基板は、フロート法と称されるガラス製法により溶融ガラスを板状に成形し、これを特許文献1等に開示された連続式の研磨装置によって、表面の微小な凹凸やうねりを研磨除去することにより、液晶ディスプレイ用ガラス基板で要求される平坦度を満足した厚さ0.4〜1.1mmの薄板状に製造される。   In particular, a glass substrate for an FPD (Flat Panel Display) used for a liquid crystal display or the like is formed by forming a molten glass into a plate shape by a glass manufacturing method called a float process, and this is disclosed in Patent Document 1 or the like. By polishing and removing fine irregularities and undulations on the surface with a polishing apparatus of the type, it is manufactured into a thin plate shape with a thickness of 0.4 to 1.1 mm that satisfies the flatness required for a glass substrate for liquid crystal display .

このような連続式の研磨装置においては、特許文献1に記載の如く、ガラス基板の幅よりも大きな直径を持ち自転及び公転する研磨具によって、ガラス基板幅全域を一度に研磨することが一般的に行われている。   In such a continuous polishing apparatus, as described in Patent Document 1, it is common to polish the entire width of the glass substrate at once with a polishing tool having a diameter larger than the width of the glass substrate and rotating and revolving. Has been done.

図5は、従来の連続式研磨装置によってガラス基板Gが研磨される状態を示した説明図である。ガラス基板Gは、テーブル(不図示)に接着された吸着シート1にその研磨対象面と反対側の面が吸着保持され、図の矢印Aで示すように不図示の搬送装置によって連続的に搬送され、その搬送路の上方に設置された研磨機の研磨具2、3によって研磨対象面が研磨される。同図に示すように、研磨具2、3は、ガラス基板Gの幅よりも大きな直径を持ち、自転/公転機構(不図示)によって所定の回転中心を中心に回転されるとともに、所定の公転中心を中心に公転されながらガラス基板Gの幅全域を一度に研磨する。なお、図5において、実線で示した円は、研磨具2、3の現在の姿勢を示しており、二点鎖線で示した多数の円は、ガラス基板Gが研磨具2、3と接触した部分のエッジ部が示されている。これらの円でも分かるように、研磨具2、3は所定の公転中心を中心に公転される。
特開2001−293656号公報
FIG. 5 is an explanatory view showing a state in which the glass substrate G is polished by a conventional continuous polishing apparatus. The glass substrate G is held by suction on the suction sheet 1 bonded to a table (not shown), and the surface opposite to the surface to be polished is sucked and held continuously by a transport device (not shown) as indicated by an arrow A in the figure. Then, the surface to be polished is polished by the polishing tools 2 and 3 of the polishing machine installed above the conveyance path. As shown in the figure, the polishing tools 2 and 3 have a diameter larger than the width of the glass substrate G, are rotated around a predetermined rotation center by a rotation / revolution mechanism (not shown), and have a predetermined revolution. The entire width of the glass substrate G is polished at once while revolving around the center. In FIG. 5, circles indicated by solid lines indicate the current postures of the polishing tools 2 and 3, and many circles indicated by two-dot chain lines indicate that the glass substrate G is in contact with the polishing tools 2 and 3. The edge of the part is shown. As can be seen from these circles, the polishing tools 2 and 3 are revolved around a predetermined revolution center.
JP 2001-293656 A

しかしながら、特許文献1及び図5に示した連続研磨装置は、サイズの小さいガラス基板の研磨には良好であるが、例えば幅2200mmを超える大型サイズのガラス基板の研磨に対応させることは困難である。なぜなら、このような大型サイズのガラス基板を研磨しようとすると、研磨具のサイズ(約φ2400mm)が大きくなり過ぎるため、研磨具の素材確保、研磨装置及び研磨具加工組立精度の維持、交換作業、取り扱い及び研磨精度の維持等に問題が発生するからである。   However, the continuous polishing apparatus shown in Patent Document 1 and FIG. 5 is good for polishing a glass substrate having a small size, but it is difficult to cope with polishing a glass substrate having a large size exceeding 2200 mm in width, for example. . Because, when trying to polish such a large-sized glass substrate, the size of the polishing tool (about φ2400 mm) becomes too large, so it is necessary to secure the polishing tool material, maintain the polishing apparatus and polishing tool processing assembly accuracy, replacement work, This is because a problem occurs in handling and maintenance of polishing accuracy.

本発明は、このような事情に鑑みてなされたもので、大型サイズの板状体を精度よく研磨することができる板状体の研磨方法及びその装置を提供することを目的とする。   This invention is made | formed in view of such a situation, and it aims at providing the grinding | polishing method and apparatus of a plate-shaped body which can grind | polish a large sized plate-shaped body accurately.

請求項1に記載の方法発明は、前記目的を達成するために、FPD用ガラス基板を所定の方向に移動させながら、複数台の自転及び公転する円形研磨具によってFPD用ガラス基板を連続研磨するFPD用ガラス基板の研磨方法において、前記FPD用ガラス基板の幅よりも直径が小さい前記円形研磨具を、前記FPD用ガラス基板の移動中心線を基準として対を成して配置するとともに、前記円形研磨具は、その公転半径Rが50mm≦R≦100mmに設定され、前記FPD用ガラス基板の移動方向に沿って少なくとも千鳥状に2対配置され、記円形研磨具が移動中心線を越えて前記FPD用ガラス基板を研磨することを特徴とする。 In order to achieve the above object, the method invention according to claim 1 continuously polishes the glass substrate for FPD with a plurality of rotating and revolving circular polishing tools while moving the glass substrate for FPD in a predetermined direction. in the glass substrate polishing method for FPD, the circular polishing tool diameter is smaller than the width of the glass substrate for the FPD, while arranged in pairs relative to the moving center line of the glass substrate for the FPD, the circular polishing tool, the radius of revolution R is set to 50 mm ≦ R ≦ 100 mm, along said direction of movement of the glass substrate for FPD at least staggered in two pairs placed, before Kien shaped grinding tool exceeds the moving center line The glass substrate for FPD is polished.

請求項に記載の装置発明は、前記目的を達成するために、FPD用ガラス基板を所定の方向に移動させながら、複数台の自転及び公転する円形研磨具によってFPD用ガラス基板を連続研磨するFPD用ガラス基板の研磨装置において、前記円形研磨具の直径は前記FPD用ガラス基板の幅よりも小さく設定されるとともに、前記FPD用ガラス基板の移動中心線を基準として対を成して配置され、前記円形研磨具の公転半径Rが、50mm≦R≦100mmに設定され、前記円形研磨具は、前記FPD用ガラス基板の移動方向に沿って少なくとも千鳥状に2対配置され、前記円形研磨具が中心線を越えて前記FPD用ガラス基板を研磨することを特徴とする。 In order to achieve the above object, the apparatus invention according to claim 5 continuously polishes the glass substrate for FPD with a plurality of rotating and revolving circular polishing tools while moving the glass substrate for FPD in a predetermined direction. in the polishing apparatus for a glass substrate for FPD, the diameter of the circular polishing tool, along with being set smaller than the width of the glass substrate for the FPD, they are arranged in pairs relative to the moving center line of the glass substrate for the FPD The revolution radius R of the circular polishing tool is set to 50 mm ≦ R ≦ 100 mm, and two pairs of the circular polishing tools are arranged in a staggered manner along the moving direction of the glass substrate for FPD. The glass substrate for FPD is polished beyond the center line.

請求項1、に記載の発明によれば、1台の大型研磨具を使用するのではなく、FPD用ガラス基板の幅よりも直径が小さい小型の円形研磨具を複数台揃え、これらの円形研磨具をFPD用ガラス基板の移動中心線を基準として対を成して配置し、円形研磨具が中心線を越えてFPD用ガラス基板を研磨することにより、FPD用ガラス基板の研磨面の全面を研磨する。また、本発明によれば、研磨具は小径化するので、研磨具の素材確保、研磨装置及び研磨具加工組立精度の維持、交換作業、取り扱い及び研磨精度の維持等の問題を解決することができる。 According to the first and fifth aspects of the invention, instead of using one large polishing tool, a plurality of small circular polishing tools having a diameter smaller than the width of the glass substrate for FPD are arranged, and these circular polishing tools are arranged. The polishing tool is arranged in pairs with respect to the movement center line of the FPD glass substrate , and the circular polishing tool polishes the FPD glass substrate beyond the center line, so that the entire polishing surface of the FPD glass substrate is obtained. To polish. Further, according to the present invention, since the diameter of the polishing tool is reduced, it is possible to solve problems such as securing the polishing tool material, maintaining the polishing apparatus and polishing tool processing and assembly accuracy, exchanging work, handling and maintaining the polishing accuracy. it can.

請求項に記載の発明によれば、円形研磨具の配列は、FPD用ガラス基板の移動中心線に対して対を成して等間隔に平行に配置する。また、FPD用ガラス基板の移動方向に円形研磨具を、例えば千鳥状に並列しても良いし、同位置に並列しても良いが、千鳥状に並列することが、研磨具動作の設定条件の自由度が多い点で好ましい。 According to invention of Claim 1 , 5 , the arrangement | sequence of a circular polishing tool makes a pair with respect to the movement centerline of the glass substrate for FPD, and arrange | positions in parallel at equal intervals. Further, circular polishing tools may be arranged in a staggered manner in the moving direction of the glass substrate for FPD, for example, and may be arranged in parallel at the same position. It is preferable in that it has a large degree of freedom.

請求項に記載の方法発明は、請求項1において、前記円形研磨具は、研磨時における前記FPD用ガラス基板移動方向の前記FPD用ガラス基板一端からのオーバーハング量Aが、20mm≦A≦250mmに設定されてFPD用ガラス基板を研磨することを特徴とする。 Method invention according to claim 2, Oite to claim 1, wherein the circular polishing tool, the overhang A from the FPD glass substrate one end of the FPD glass substrate moving direction during polishing, 20 mm ≦ A ≦ 250 mm is set, and the glass substrate for FPD is polished.

請求項に記載の装置発明は、請求項において、前記円形研磨具は、前記FPD用ガラス基板移動方向の前記FPD用ガラス基板一端からのオーバーハング量Aが、20mm≦A≦250mmに設定されていることを特徴とする。 The apparatus invention described in claim 6 is the apparatus according to claim 5 , wherein the circular polishing tool is set such that an overhang amount A from one end of the FPD glass substrate in the moving direction of the FPD glass substrate is 20 mm ≦ A ≦ 250 mm. It is characterized by being.

請求項に記載の発明によれば、FPD用ガラス基板のエッジは通常未面取りの場合が多いので、研磨具のオーバーハング量Aが20mm未満であるとエッジが傷付き易くなり、オーバーハング量Aが250mmを超えると研磨具が傾き易くなり、均一に研磨することが困難な場合がある。この点の改善の為、オーバーハング量Aは、20mm≦A≦250mmであることが好ましい。 According to the inventions of claims 2 and 6 , since the edge of the glass substrate for FPD is usually not chamfered, if the overhang amount A of the polishing tool is less than 20 mm, the edge is easily damaged, and the edge When the hang amount A exceeds 250 mm, the polishing tool tends to tilt and it may be difficult to polish uniformly. In order to improve this point, the overhang amount A is preferably 20 mm ≦ A ≦ 250 mm.

請求項に記載の発明によれば、公転半径Rが50mm未満であると、研磨具の自公転の合成方向変化が大きくなり、FPD用ガラス基板に付く研磨模様が目立ち易くなる場合がある。また、公転半径Rが100mmを超えると、支持装置が大きくなるので剛性が必要となってイニシャルコストがかかる。また、装置が振動し易くなる場合がある。これにより、公転半径Rは50≦R≦100mmが好ましい。 According to the inventions described in claims 1 and 5 , when the revolution radius R is less than 50 mm, the change in the direction of synthesis of the revolution of the polishing tool increases, and the polishing pattern attached to the FPD glass substrate may be noticeable. is there. Further, if the revolution radius R exceeds 100 mm, the support device becomes large, so that rigidity is required and an initial cost is required. In addition, the device may easily vibrate. Accordingly, the revolution radius R is preferably 50 ≦ R ≦ 100 mm.

請求項に記載の方法発明は、請求項1、2において、前記FPD用ガラス基板の移動中心線を基準として対を成して配置された一方の円形研磨具と他方の円形研磨具との研磨時における重なり量が少なくとも100mm以上であり、また、前記円形研磨具の研磨時における前記移動中心線からのはみ出し量の最小値をB、最大値をCとした時、25mm≦B≦100mm、175mm≦C≦250mmである条件においてFPD用ガラス基板を研磨することを特徴とする。 According to a third aspect of the present invention, there is provided a method invention according to any one of the first and second aspects, wherein one of the circular polishing tools and the other of the circular polishing tools arranged in pairs with respect to the movement center line of the FPD glass substrate . The overlapping amount at the time of polishing is at least 100 mm or more, and when the minimum value of the protruding amount from the moving center line at the time of polishing of the circular polishing tool is B and the maximum value is C, 25 mm ≦ B ≦ 100 mm, The glass substrate for FPD is polished under the condition of 175 mm ≦ C ≦ 250 mm.

請求項に記載の装置発明は、請求項5、6において、前記FPD用ガラス基板の移動中心線を基準として対を成して配置された一方の円形研磨具と他方の円形研磨具との研磨時における重なり量が少なくとも100mm以上であり、また、前記円形研磨具の研磨時における前記移動中心線からのはみ出し量の最小値をB、最大値をCとした時、25mm≦B≦100mm、175mm≦C≦250mmである条件に設定されていることを特徴とする。 According to a seventh aspect of the present invention, there is provided an apparatus invention according to any one of the fifth and sixth aspects, wherein one circular polishing tool and the other circular polishing tool arranged in pairs with respect to the movement center line of the FPD glass substrate . The overlapping amount at the time of polishing is at least 100 mm or more, and when the minimum value of the protruding amount from the moving center line at the time of polishing of the circular polishing tool is B and the maximum value is C, 25 mm ≦ B ≦ 100 mm, The condition is that 175 mm ≦ C ≦ 250 mm.

ところで、本発明の研磨方法及び研磨装置では、FPD用ガラス基板の移動方向の中心線を含むその近傍の一部が、移動中心線を挟んで配置された複数の研磨具によって研磨されるため、場合によっては各々の研磨具の継ぎ目(エッジ)において研磨ムラが生じる虞がある。よって、継ぎ目での研磨ムラを抑えるためには、前記一部(重合研磨部と称する)の適正化を図ることが好ましく、これによって、大型FPD用ガラス基板の精度の高い研磨が達成できる。 By the way, in the polishing method and the polishing apparatus of the present invention, a part of the vicinity including the center line in the moving direction of the glass substrate for FPD is polished by a plurality of polishing tools arranged across the moving center line. In some cases, uneven polishing may occur at the joints (edges) of the respective polishing tools. Therefore, in order to suppress polishing unevenness at the seam, it is preferable to optimize the part (referred to as a polymerization polishing portion), whereby high-precision polishing of a large FPD glass substrate can be achieved.

また、請求項に記載の発明においては、一方の円形研磨具と他方の円形研磨具との研磨時における重なり量、すなわち、重合研磨部を少なくとも100mm以上に設定し、且つ、円形研磨具の研磨時における前記移動中心線からのはみ出し量の最小値をB、最大値をCとした時、25mm≦B≦100mm、175mm≦C≦250mmとなるように設定する。重合研磨部が100mm未満であるとき、Bが25未満または100mmを超えるとき、およびCが175mm未満または250mmを超えるとき研磨ムラが生じる恐れがある。 Further, in the inventions according to claims 3 and 7 , the overlapping amount at the time of polishing between one circular polishing tool and the other circular polishing tool, that is, the overlapping polishing portion is set to at least 100 mm or more, and circular polishing is performed. When the minimum value of the amount of protrusion from the moving center line during polishing of the tool is B and the maximum value is C, 25 mm ≦ B ≦ 100 mm and 175 mm ≦ C ≦ 250 mm are set. When the polymerized polishing portion is less than 100 mm, when B is less than 25 or more than 100 mm, and when C is less than 175 mm or more than 250 mm, polishing unevenness may occur.

請求項に記載の方法発明は、請求項1〜において、前記円形研磨具の研磨圧を、前記円形研磨具中心から外周に分割設定してFPD用ガラス基板を研磨することを特徴とする。 According to a fourth aspect of the present invention, in the first to third aspects, the FPD glass substrate is polished by setting the polishing pressure of the circular polishing tool from the center of the circular polishing tool to the outer periphery. .

請求項に記載の装置発明は、請求項において、前記円形研磨具の研磨圧が、前記円形研磨具中心から外周に分割設定されていることを特徴とする。 The apparatus invention according to claim 8 is characterized in that, in claims 5 to 7 , the polishing pressure of the circular polishing tool is set to be divided from the center of the circular polishing tool to the outer periphery.

請求項に記載の発明において、研磨圧発生機となる空気ばねが研磨具に複数個内蔵され、この空気ばねは円周方向で内側、中間、外側に3分割されている。そして、それぞれの空気ばねに対して、異なる空気圧に設定することによって研磨圧を円周方向に分割制御する。これにより、主に研磨具の外側の研磨圧を調整することにより研磨具の位置を変更することなく均一に研磨することが可能であり、更に研磨圧の調整と研磨具の位置調整の両方を実施することで、研磨条件の設定をより細かく行うことができる。
In the inventions described in claims 4 and 8 , a plurality of air springs serving as a polishing pressure generator are built in the polishing tool, and the air springs are divided into three in the circumferential direction: inner, intermediate, and outer. Then, the polishing pressure is divided and controlled in the circumferential direction by setting different air pressures for the respective air springs. As a result, it is possible to perform uniform polishing without changing the position of the polishing tool mainly by adjusting the polishing pressure outside the polishing tool. Furthermore, both the adjustment of the polishing pressure and the position adjustment of the polishing tool can be performed. By carrying out, the setting of the polishing conditions can be performed more finely.

本発明に係る板状体の研磨方法及びその装置によれば、板状体の幅よりも直径が小さい小型の円形研磨具を複数台揃え、これらの円形研磨具を板状体の移動中心線を基準として対を成して配置し、円形研磨具が中心線を越えて板状体を研磨することにより、板状体全面を研磨することができる。また、本発明によれば、研磨具は小径化するので、研磨具の素材確保、研磨装置及び研磨具の加工組立精度の維持、交換作業及び取り扱い等の問題を解消でき、更に板状体の研磨精度の向上が図れる。   According to the polishing method and apparatus for a plate-like body according to the present invention, a plurality of small circular polishing tools having a diameter smaller than the width of the plate-like body are arranged, and these circular polishing tools are moved along the moving center line of the plate-like body. Are arranged in pairs, and the entire surface of the plate-like body can be polished by the circular polishing tool polishing the plate-like body beyond the center line. Further, according to the present invention, since the diameter of the polishing tool is reduced, problems such as securing the polishing tool material, maintaining the polishing apparatus and the processing and assembly accuracy of the polishing tool, replacement work, and handling can be solved. Polishing accuracy can be improved.

以下添付図面に従って、本発明に係るガラス基板からなる板状体の研磨方法及びその装置の好ましい実施の形態について詳説する。   DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of a method and apparatus for polishing a plate-like body comprising a glass substrate according to the present invention will be described in detail below with reference to the accompanying drawings.

図1には、実施の形態に係る研磨装置10の平面図が示されている。また、図1には、2200mm(幅)×2600mm(長さ)以上のサイズの液晶用ガラス基板Gの連続研磨装置10における研磨具12の形状、配置、及び動作に関する内容が示されている。   FIG. 1 shows a plan view of a polishing apparatus 10 according to the embodiment. FIG. 1 also shows the contents relating to the shape, arrangement, and operation of the polishing tool 12 in the continuous polishing apparatus 10 for a liquid crystal glass substrate G having a size of 2200 mm (width) × 2600 mm (length) or more.

図1によれば、研磨対象のガラス基板Gは、テーブル(不図示)に接着された吸着シート12にその研磨対象面と反対側の面が吸着保持され、図の矢印Xで示すように不図示の搬送装置によって連続的に搬送される。そして、搬送中に前記搬送路の上方に設置された研磨機の複数台の円形研磨具14、14…によって研磨対象面が、液晶ディスプレイ用ガラス基板で要求される平坦度に研磨される。   According to FIG. 1, the glass substrate G to be polished is held on the suction sheet 12 adhered to a table (not shown) by suction to hold the surface opposite to the surface to be polished, as shown by the arrow X in the figure. It is continuously conveyed by the illustrated conveying device. And the surface to be polished is polished to the flatness required for the glass substrate for a liquid crystal display by a plurality of circular polishing tools 14, 14... Of a polishing machine installed above the transfer path during transfer.

同図に示すように、円形研磨具14、14…は、ガラス基板Gの幅Wよりも小さい直径Dで構成され、自転/公転機構(不図示)によって所定の回転中心を中心に回転されるとともに、所定の公転中心を中心に公転されながらガラス基板Gを研磨する。なお、図1において、実線で示した円は、研磨具14、14…の現在の姿勢を示しており、二点鎖線で示した多数の円は、ガラス基板Gが研磨具14、14…と接触した部分のエッジ部が示されている。これらの円でも分かるように、研磨具14、14…は所定の公転中心を中心に公転される。   As shown in the figure, the circular polishing tools 14, 14... Are configured with a diameter D smaller than the width W of the glass substrate G, and are rotated around a predetermined rotation center by a rotation / revolution mechanism (not shown). At the same time, the glass substrate G is polished while being revolved around a predetermined revolution center. In FIG. 1, circles indicated by solid lines indicate the current postures of the polishing tools 14, 14..., And many circles indicated by two-dot chain lines indicate that the glass substrate G is the polishing tools 14, 14. The edge part of the contact part is shown. As can be seen from these circles, the polishing tools 14, 14... Are revolved around a predetermined revolution center.

また、研磨具14、14…はガラス基板Gの移動中心線Lを基準として対を成して配置されるとともに、移動方向に位置をずらした千鳥状に配置され、円形研磨具14、14…が移動中心線Lを越えてガラス基板Gを研磨するように配置される。   Further, the polishing tools 14, 14... Are arranged in pairs with respect to the movement center line L of the glass substrate G, and are arranged in a staggered manner in which the positions are shifted in the movement direction, and the circular polishing tools 14, 14. Is disposed so as to polish the glass substrate G beyond the moving center line L.

このように構成された研磨装置10によれば、1台の大型研磨具を使用するのではなく、ガラス基板Gの幅Wよりも直径Dが小さい小型の円形研磨具14を複数台揃え、これらの円形研磨具14、14…をガラス基板Gの移動中心線Lを基準として左右に対を成して配置し、円形研磨具14、14…が中心線Lを越えてガラス基板Gを研磨することにより、ガラス基板G全面を研磨することができる。   According to the polishing apparatus 10 configured in this way, a single large polishing tool is not used, but a plurality of small circular polishing tools 14 having a diameter D smaller than the width W of the glass substrate G are arranged. Are arranged in pairs on the left and right with respect to the movement center line L of the glass substrate G, and the circular polishing tools 14, 14... Polish the glass substrate G beyond the center line L. As a result, the entire surface of the glass substrate G can be polished.

また、この研磨装置10によれば、研磨具14は小型小径化するので、研磨具14の素材確保、加工組立精度の維持、交換作業及び取り扱い等の問題は解消できる。更に、円形研磨具14、14…は、ガラス基板Gの移動方向に沿って少なくとも千鳥状に2対配置されているので、板状体を均等に精度よく研磨することができる。   Further, according to the polishing apparatus 10, since the polishing tool 14 is reduced in size and diameter, problems such as securing the material of the polishing tool 14, maintaining processing and assembly accuracy, replacement work, and handling can be solved. Further, since the circular polishing tools 14, 14... Are arranged at least in a staggered manner along the moving direction of the glass substrate G, the plate-like body can be polished evenly and accurately.

ところで、実施の形態の研磨具14は、研磨具14の大型化による不具合(研磨具の素材確保、研磨装置及び研磨具加工組立精度の維持、交換作業、取り扱い及び研磨精度の維持等に問題)、及び制約条件(一般扉サイズ幅1800mmであること、コンテナ幅2250mmであること、素材汎用サイズ1800mmであること)を考慮してφ1750mm以下に構成されている。   By the way, the polishing tool 14 of the embodiment has a problem due to an increase in the size of the polishing tool 14 (problems in securing the polishing tool material, maintaining the polishing apparatus and polishing tool processing and assembly accuracy, replacement work, handling, and maintaining the polishing accuracy). , And restrictions (general door size width is 1800 mm, container width is 2250 mm, material general-purpose size is 1800 mm).

一例として、ガラス基板Gの幅は2200mm、研磨具14のサイズはφ1290mm、公転半径は75mm、公転中心は、移動中心線Lから直交方向に左右に600mm離れた位置とする。   As an example, the width of the glass substrate G is 2200 mm, the size of the polishing tool 14 is φ1290 mm, the revolution radius is 75 mm, and the revolution center is a position 600 mm away from the moving center line L in the right and left directions.

上記仕様において、実施の形態の研磨装置10では、円形研磨具14の研磨時におけるガラス基板Gの一端からのオーバーハング量Aが、図2の如く20mm≦A≦250mmに設定されている。   In the above specification, in the polishing apparatus 10 of the embodiment, the overhang amount A from one end of the glass substrate G at the time of polishing the circular polishing tool 14 is set to 20 mm ≦ A ≦ 250 mm as shown in FIG.

研磨対象のガラス基板Gのエッジは通常未面取りの場合が多いので、研磨具14のオーバーハング量Aが20mm未満であるとエッジが傷付き易くなり、オーバーハング量Aが250mmを超えると研磨具14が傾き易くなり、均一な研磨が困難となる場合がある。よって、オーバーハング量Aを、20mm≦A≦250mmの範囲に設定することが好ましい。   Since the edge of the glass substrate G to be polished is usually not chamfered, the edge tends to be damaged when the overhang amount A of the polishing tool 14 is less than 20 mm, and the polishing tool when the overhang amount A exceeds 250 mm. 14 tends to tilt, and uniform polishing may be difficult. Therefore, it is preferable to set the overhang amount A in a range of 20 mm ≦ A ≦ 250 mm.

更に、上記仕様において、図3の如く研磨具14の公転半径Rが50mm≦R≦100mmに設定されている。   Furthermore, in the above specifications, the revolution radius R of the polishing tool 14 is set to 50 mm ≦ R ≦ 100 mm as shown in FIG.

公転半径Rが50mm未満であると、研磨具14の自公転の合成方向変化が大きくなり、ガラス基板Gに付く研磨模様が目立ち易くなる場合がある。また、公転半径Rが100mmを超えると、支持装置が大きくなり剛性が必要となる。また、装置が振動し易くなる場合がある。これにより、公転半径Rを50≦R≦100mmとすることが好ましい。   When the revolution radius R is less than 50 mm, the change in the direction of rotation of the polishing tool 14 is increased, and the polishing pattern on the glass substrate G may be noticeable. On the other hand, when the revolution radius R exceeds 100 mm, the support device becomes large and rigidity is required. In addition, the device may easily vibrate. Thereby, it is preferable to set the revolution radius R to 50 ≦ R ≦ 100 mm.

更に、上記仕様において、図4の如くガラス基板Gの移動中心線Lを基準として対を成して配置された一方の円形研磨具14と他方の円形研磨具14との研磨時における重なり量Pが少なくとも100mm以上であり、且つ、研磨具14の研磨時における移動中心線Lからのはみ出し量の最小値をB、最大値をCとした時、25mm≦B≦100mm、175mm≦C≦250mmである条件に設定されている。   Furthermore, in the above specifications, the overlap amount P during polishing between one circular polishing tool 14 and the other circular polishing tool 14 arranged in pairs with respect to the movement center line L of the glass substrate G as shown in FIG. Is at least 100 mm, and when the minimum value of the protruding amount from the moving center line L during polishing of the polishing tool 14 is B and the maximum value is C, 25 mm ≦ B ≦ 100 mm, 175 mm ≦ C ≦ 250 mm A certain condition is set.

実施の形態の研磨装置10では、ガラス基板Gの移動方向の中心線を含むその近傍の一部が、移動中心線Lを挟んで千鳥状に対を成して配置された4台の研磨具14、14…によって研磨されるため、各々の研磨具14、14…の継ぎ目(エッジ)において研磨ムラが生じる虞がある。よって、継ぎ目での研磨ムラを抑えるためには、前記一部(重合研磨部)の適正化を図ることが好ましく、これによって、大型ガラス基板Gの精度よい研磨が可能になる。   In the polishing apparatus 10 according to the embodiment, four polishing tools in which a part of the vicinity including the center line in the moving direction of the glass substrate G is arranged in a staggered manner with the moving center line L interposed therebetween. 14, 14..., So that polishing unevenness may occur at the joints (edges) of the respective polishing tools 14, 14. Therefore, in order to suppress polishing unevenness at the seam, it is preferable to optimize the part (polymerization polishing portion), and thereby, the large glass substrate G can be polished with high accuracy.

そこで、実施の形態の研磨装置10は、図4の如く一方の研磨具14と他方の円形研磨具14との研磨時における重なり量、すなわち、重合研磨部を少なくとも100mm以上に設定し、且つ、研磨具14の研磨時における移動中心線Lからのはみ出し量の最小値をB、最大値をCとした時、25mm≦B≦100mm、175mm≦C≦250mmとなるように設定している。 Therefore, the polishing apparatus 10 of the embodiment sets the overlap amount at the time of polishing between one polishing tool 14 and the other circular polishing tool 14 as shown in FIG. 4, that is, the overlap polishing portion is set to at least 100 mm or more, and When the minimum value of the amount of protrusion from the movement center line L during polishing of the polishing tool 14 is B and the maximum value is C, 25 mm ≦ B ≦ 100 mm and 175 mm ≦ C ≦ 250 mm are set.

これは、重合研磨部が100mm未満であるとき、Bが25未満または100mmを超えるとき、およびCが175mm未満または250mmを超えるとき研磨ムラの原因となる。 This causes uneven polishing when the polymerized polishing portion is less than 100 mm, when B is less than 25 or more than 100 mm, and when C is less than 175 mm or more than 250 mm.

また、研磨具14には、研磨圧発生機となる空気ばねが複数個内蔵され、この空気ばねは研磨具の中心から外周方向で内側、中間、外側に3分割されている。そして、それぞれの空気ばねに対して、異なる空気圧に設定することにより研磨圧を研磨具の中心から外周方向に分割制御している。これにより、主に研磨具の外側の研磨圧を調整することにより研磨具の位置を変更することなく均一に研磨することが可能であり、更に研磨圧の調整と研磨具14の位置調整の両方を実施することで、研磨条件の設定をより細かく行うことができる。   Further, the polishing tool 14 includes a plurality of air springs serving as polishing pressure generators, and the air spring is divided into an inner side, an intermediate side, and an outer side in the outer circumferential direction from the center of the polishing tool. And by setting different air pressure to each air spring, the polishing pressure is divided and controlled from the center of the polishing tool to the outer peripheral direction. Thereby, it is possible to perform uniform polishing without changing the position of the polishing tool mainly by adjusting the polishing pressure outside the polishing tool, and both the adjustment of the polishing pressure and the position adjustment of the polishing tool 14 are possible. By carrying out the above, the polishing conditions can be set more finely.

なお、実施の形態の研磨装置10では、ガラス基板幅方向に研磨具14を2列配置した例について説明したが、理論的には、ガラス基板幅方向に研磨具14を3列以上分散配置することも可能である。しかし、複数台の研磨具14、14…による研磨の継ぎ目箇所を最小限に留める方が研磨品質を確保し易く、また研磨具が取り付けられる研磨ヘッド(研磨定盤)の台数の点でも少なく抑えることができるので、実施の形態の如く2列が有利である。   In the polishing apparatus 10 of the embodiment, the example in which the polishing tools 14 are arranged in two rows in the glass substrate width direction has been described. Theoretically, the polishing tools 14 are distributed in three rows or more in the glass substrate width direction. It is also possible. However, it is easier to ensure polishing quality by minimizing the number of polishing seams by a plurality of polishing tools 14, 14... And the number of polishing heads (polishing surface plates) to which the polishing tools are attached is also reduced. As a result, two rows are advantageous as in the embodiment.

また、研磨具14、14の配置距離を調整する方法としては、研磨具14を駆動するスピンドルモータの取付座をスライド可能構造とし、これをジャッキボルトやボールねじ等の移動装置によって押し引きして位置決めする。継ぎ目の研磨代が多すぎる場合には研磨具14、14の間隔を広げ、研磨代が少なすぎる場合には研磨具14、14の間隔を狭めるという調整を行うことで、ガラス基板幅方向を均一に研磨することができる。   Further, as a method of adjusting the arrangement distance of the polishing tools 14, 14, a spindle motor mounting seat for driving the polishing tool 14 is made a slidable structure, and this is pushed and pulled by a moving device such as a jack bolt or a ball screw. Position. When the polishing allowance of the seam is too large, the gap between the polishing tools 14 and 14 is widened, and when the polishing allowance is too small, the gap between the polishing tools 14 and 14 is narrowed to make the glass substrate width direction uniform. Can be polished.

本発明の板状体の研磨装置は、建材用やミラー用等の一般的なガラス板にも適用でき、金属等板状体の材質を問わずに適用可能である。   The plate-like polishing apparatus of the present invention can also be applied to general glass plates for building materials and mirrors, and can be applied regardless of the material of the plate-like body such as metal.

実施の形態のガラス基板研磨装置の平面図Plan view of glass substrate polishing apparatus of embodiment 図1に示したガラス基板研磨装置における研磨具の配置関係を示した説明図Explanatory drawing which showed the arrangement | positioning relationship of the polishing tool in the glass substrate polishing apparatus shown in FIG. 図1に示したガラス基板研磨装置における研磨具の公転半径を示した説明図Explanatory drawing which showed the revolution radius of the polishing tool in the glass substrate polishing apparatus shown in FIG. 図1に示したガラス基板研磨装置における研磨具の配置関係を示した説明図Explanatory drawing which showed the arrangement | positioning relationship of the polishing tool in the glass substrate polishing apparatus shown in FIG. 従来のガラス基板研磨装置を示した平面図Plan view showing a conventional glass substrate polishing apparatus

符号の説明Explanation of symbols

10…研磨装置、12…吸着シート、14…研磨具、G…ガラス基板   DESCRIPTION OF SYMBOLS 10 ... Polishing apparatus, 12 ... Adsorption sheet, 14 ... Polishing tool, G ... Glass substrate

Claims (8)

FPD用ガラス基板を所定の方向に移動させながら、複数台の自転及び公転する円形研磨具によってFPD用ガラス基板を連続研磨するFPD用ガラス基板の研磨方法において、
前記FPD用ガラス基板の幅よりも直径が小さい前記円形研磨具を、前記FPD用ガラス基板の移動中心線を基準として対を成して配置するとともに、
前記円形研磨具は、その公転半径Rが50mm≦R≦100mmに設定され、前記FPD用ガラス基板の移動方向に沿って少なくとも千鳥状に2対配置され、
記円形研磨具が移動中心線を越えて前記FPD用ガラス基板を研磨することを特徴とするFPD用ガラス基板の研磨方法。
In the method for polishing an FPD glass substrate , the FPD glass substrate is continuously polished by a plurality of rotating and revolving circular polishing tools while moving the FPD glass substrate in a predetermined direction.
It said circular polishing tool diameter is smaller than the width of the glass substrate for the FPD, while arranged in pairs relative to the moving center line of the glass substrate for the FPD,
The circular polishing tool has its revolution radius R set to 50 mm ≦ R ≦ 100 mm, and is arranged in two pairs at least in a staggered manner along the moving direction of the glass substrate for FPD,
Polishing method of a glass substrate for FPD, wherein the pre-Kien type polishing tool to polish a glass substrate for the FPD beyond the moving center line.
前記円形研磨具は、研磨時における前記FPD用ガラス基板移動方向の前記FPD用ガラス基板一端からのオーバーハング量Aが、20mm≦A≦250mmに設定されてFPD用ガラス基板を研磨する請求項1に記載のFPD用ガラス基板の研磨方法。2. The circular polishing tool polishes an FPD glass substrate by setting an overhang amount A from one end of the FPD glass substrate in the direction of movement of the FPD glass substrate during polishing to 20 mm ≦ A ≦ 250 mm. A method for polishing a glass substrate for FPD as described in 1 above. 前記FPD用ガラス基板の移動中心線を基準として対を成して配置された一方の円形研磨具と他方の円形研磨具との研磨時における重なり量が少なくとも100mm以上であり、また、前記円形研磨具の研磨時における前記移動中心線からのはみ出し量の最小値をB、最大値をCとした時、25mm≦B≦100mm、175mm≦C≦250mmである条件においてFPD用ガラス基板を研磨する請求項1又は2に記載のFPD用ガラス基板の研磨方法。The overlap amount at the time of polishing between one circular polishing tool and the other circular polishing tool arranged in pairs with respect to the moving center line of the glass substrate for FPD is at least 100 mm or more, and the circular polishing The FPD glass substrate is polished under the conditions of 25 mm ≦ B ≦ 100 mm and 175 mm ≦ C ≦ 250 mm, where B is the minimum value of the amount of protrusion from the moving center line during polishing of the tool, and C is the maximum value. Item 3. A method for polishing an FPD glass substrate according to Item 1 or 2. 前記円形研磨具の研磨圧を、前記円形研磨具の中心から外周方向に分割設定してFPD用ガラス基板を研磨する請求項1、2又は3に記載のFPD用ガラス基板の研磨方法。4. The method for polishing an FPD glass substrate according to claim 1, wherein the FPD glass substrate is polished by setting the polishing pressure of the circular polishing tool in a circumferential direction from the center of the circular polishing tool. 5. FPD用ガラス基板を所定の方向に移動させながら、複数台の自転及び公転する円形研磨具によってFPD用ガラス基板を連続研磨するFPD用ガラス基板の研磨装置において、In a polishing apparatus for an FPD glass substrate that continuously polishes an FPD glass substrate with a plurality of rotating and revolving circular polishing tools while moving the FPD glass substrate in a predetermined direction,
前記円形研磨具の直径は前記FPD用ガラス基板の幅よりも小さく設定されるとともに、前記FPD用ガラス基板の移動中心線を基準として対を成して配置され、The diameter of the circular polishing tool is set smaller than the width of the glass substrate for FPD, and is arranged in pairs with respect to the movement center line of the glass substrate for FPD,
前記円形研磨具の公転半径Rが、50mm≦R≦100mmに設定され、前記円形研磨具は、前記FPD用ガラス基板の移動方向に沿って少なくとも千鳥状に2対配置され、前記円形研磨具が中心線を越えて前記FPD用ガラス基板を研磨することを特徴とするFPD用ガラス基板の研磨装置。The revolution radius R of the circular polishing tool is set to 50 mm ≦ R ≦ 100 mm, and the circular polishing tools are arranged in at least two staggered forms along the moving direction of the glass substrate for FPD. An apparatus for polishing an FPD glass substrate, wherein the FPD glass substrate is polished beyond a center line.
前記円形研磨具は、前記FPD用ガラス基板移動方向の前記FPD用ガラス基板一端からのオーバーハング量Aが、20mm≦A≦250mmに設定されている請求項5に記載のFPD用ガラス基板の研磨装置。6. The polishing of a glass substrate for FPD according to claim 5, wherein the circular polishing tool has an overhang amount A from one end of the glass substrate for FPD in the moving direction of the glass substrate for FPD set to 20 mm ≦ A ≦ 250 mm. apparatus. 前記FPD用ガラス基板の移動中心線を基準として対を成して配置された一方の円形研磨具と他方の円形研磨具との研磨時における重なり量が少なくとも100mm以上であり、また、前記円形研磨具の研磨時における前記移動中心線からのはみ出し量の最小値をB、最大値をCとした時、25mm≦B≦100mm、175mm≦C≦250mmである条件に設定されている請求項5又は6に記載のFPD用ガラス基板の研磨装置。The overlap amount at the time of polishing between one circular polishing tool and the other circular polishing tool arranged in pairs with respect to the moving center line of the glass substrate for FPD is at least 100 mm or more, and the circular polishing The condition is set such that 25 mm ≦ B ≦ 100 mm and 175 mm ≦ C ≦ 250 mm, where B is the minimum value of the amount of protrusion from the moving center line during polishing of the tool, and C is the maximum value. 7. A polishing apparatus for a glass substrate for FPD as described in 6. 前記円形研磨具の研磨圧が、前記円形研磨具の中心から外周方向に分割設定されていることを特徴とする請求項5、6又は7に記載のFPD用ガラス基板の研磨装置。The polishing apparatus for a glass substrate for FPD according to claim 5, 6 or 7, wherein the polishing pressure of the circular polishing tool is set to be divided from the center of the circular polishing tool to the outer peripheral direction.
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