JP4833972B2 - 半導体構成部品を組み付ける方法 - Google Patents
半導体構成部品を組み付ける方法 Download PDFInfo
- Publication number
- JP4833972B2 JP4833972B2 JP2007521469A JP2007521469A JP4833972B2 JP 4833972 B2 JP4833972 B2 JP 4833972B2 JP 2007521469 A JP2007521469 A JP 2007521469A JP 2007521469 A JP2007521469 A JP 2007521469A JP 4833972 B2 JP4833972 B2 JP 4833972B2
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- JP
- Japan
- Prior art keywords
- flange
- window frame
- pedestal
- alignment
- solder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 55
- 238000000034 method Methods 0.000 title claims description 18
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 38
- 229910000679 solder Inorganic materials 0.000 claims description 24
- 238000010438 heat treatment Methods 0.000 claims description 15
- 238000012876 topography Methods 0.000 claims description 15
- 238000011156 evaluation Methods 0.000 claims description 7
- 238000003825 pressing Methods 0.000 claims description 3
- 239000000853 adhesive Substances 0.000 claims 4
- 230000001070 adhesive effect Effects 0.000 claims 4
- 239000012212 insulator Substances 0.000 claims 1
- 230000007246 mechanism Effects 0.000 description 17
- 239000007789 gas Substances 0.000 description 11
- 230000008569 process Effects 0.000 description 9
- 230000008901 benefit Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 239000011810 insulating material Substances 0.000 description 5
- 238000012805 post-processing Methods 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910000881 Cu alloy Inorganic materials 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000013011 mating Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- QCEUXSAXTBNJGO-UHFFFAOYSA-N [Ag].[Sn] Chemical compound [Ag].[Sn] QCEUXSAXTBNJGO-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- LQBJWKCYZGMFEV-UHFFFAOYSA-N lead tin Chemical compound [Sn].[Pb] LQBJWKCYZGMFEV-UHFFFAOYSA-N 0.000 description 1
- 229910052756 noble gas Inorganic materials 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/52—Mounting semiconductor bodies in containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
- Wire Bonding (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
Claims (3)
- 半導体構成部品を組み付ける方法であって、
第一曲面台座を提供するステップと、
前記第一曲面台座上に第一部材を配置するステップであって、前記第一部材が半導体ダイを備えるステップと、
前記第一部材上に第二部材を配置するステップと、
前記第一部材と前記第二部材との間に接着剤を提供するステップと、
前記第一部材を前記第二部材に嵌合させるため、第一プレートにより前記第一部材と前記第二部材とに圧力を加えるステップと、
第二プレートにより熱を加えて接着剤をリフローし、評価用半導体構成部品を形成するステップであって、加熱が加圧と同時に行われるステップと、
前記評価用半導体構成部品のトポグラフィを測定するステップと、
前記評価用半導体構成部品のトポグラフィを所定のトポグラフィと比較するステップと、
第二曲面台座を選択するステップであって、前記第二曲面台座が前記第一曲面台座とは異なる湾曲を有しているステップと、
前記第二曲面台座を提供するステップと
を備える方法。 - 請求項1記載の方法において、
前記第一曲面台座上に前記第一部材を配置するステップは、更に、フランジを備えた前記第一部材を配置するステップを含み、
前記第一部材上に前記第二部材を配置するステップは、更に、絶縁体を備えた前記第二部材を配置するステップを含み、
前記接着剤を提供するステップは、更に、はんだからなる前記接着剤を提供するステップを含む方法。 - 半導体構成部品を形成する方法であって、
キャビティを備えた加熱板を提供するステップと、
前記キャビティ内に第一曲面台座を配置するステップと、
前記第一曲面台座上に半導体ダイを備えたフランジを配置するステップと、
前記フランジ上にはんだを配置するステップと、
前記はんだ上に窓枠を配置するステップと、
整列ヘッダを下降させて前記窓枠及び前記フランジに接触させるステップであって、前記整列ヘッダが前記窓枠への前記フランジの整列を確保する整列部を備えるステップと、
前記整列ヘッダにより前記窓枠と前記フランジとに圧力を加えるステップと、
前記加熱板により熱を加えてはんだをリフローすることにより、前記フランジ、前記はんだ及び前記窓枠を連結して評価用半導体構成部品を形成するステップと、
前記評価用半導体構成部品のトポグラフィを測定するステップと、
前記評価用半導体構成部品のトポグラフィを所定のトポグラフィと比較するステップと、
第二曲面台座を選択するステップであって、前記第二曲面台座が前記第一曲面台座とは異なる湾曲を有しているステップと、
前記第二曲面台座を提供するステップと
を備える方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/891,648 | 2004-07-15 | ||
US10/891,648 US7101736B2 (en) | 2004-07-15 | 2004-07-15 | Method of assembling a semiconductor component and apparatus therefor |
PCT/US2005/018863 WO2006019460A2 (en) | 2004-07-15 | 2005-05-27 | Method of assembling a semiconductor component and apparatus therefor |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008507132A JP2008507132A (ja) | 2008-03-06 |
JP2008507132A5 JP2008507132A5 (ja) | 2008-07-10 |
JP4833972B2 true JP4833972B2 (ja) | 2011-12-07 |
Family
ID=35599987
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007521469A Expired - Fee Related JP4833972B2 (ja) | 2004-07-15 | 2005-05-27 | 半導体構成部品を組み付ける方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7101736B2 (ja) |
JP (1) | JP4833972B2 (ja) |
CN (1) | CN1973174B (ja) |
WO (1) | WO2006019460A2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090309199A1 (en) * | 2008-06-12 | 2009-12-17 | Keith Richard Barkley | Chip package for semiconductor devices |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07249705A (ja) * | 1994-03-09 | 1995-09-26 | Fujitsu Ltd | 電子デバイスのキャップ封止装置 |
JP2001351999A (ja) * | 2000-06-09 | 2001-12-21 | Seiko Epson Corp | パッケージ形成方法及び装置 |
JP2004014827A (ja) * | 2002-06-07 | 2004-01-15 | Sumitomo Metal Electronics Devices Inc | 高周波用パッケージの製造方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5854085A (en) * | 1992-06-04 | 1998-12-29 | Lsi Logic Corporation | Multi-layer tab tape having distinct signal, power and ground planes, semiconductor device assembly employing same, apparatus for and method of assembling same |
US5509464A (en) * | 1993-07-30 | 1996-04-23 | Applied Materials, Inc. | Method and apparatus for cooling rectangular substrates |
US5535515A (en) * | 1995-03-13 | 1996-07-16 | Jacoby; John | Method of manufacturing a stress-free heatsink assembly |
US5877555A (en) * | 1996-12-20 | 1999-03-02 | Ericsson, Inc. | Direct contact die attach |
US6020646A (en) * | 1997-12-05 | 2000-02-01 | The Charles Stark Draper Laboratory, Inc. | Intergrated circuit die assembly |
US6028365A (en) * | 1998-03-30 | 2000-02-22 | Micron Technology, Inc. | Integrated circuit package and method of fabrication |
JP2950821B1 (ja) * | 1998-04-02 | 1999-09-20 | 三星電子株式会社 | ダイボンディング装置 |
US6261868B1 (en) * | 1999-04-02 | 2001-07-17 | Motorola, Inc. | Semiconductor component and method for manufacturing the semiconductor component |
US6462413B1 (en) | 1999-07-22 | 2002-10-08 | Polese Company, Inc. | LDMOS transistor heatsink package assembly and manufacturing method |
US6534839B1 (en) * | 1999-12-23 | 2003-03-18 | Texas Instruments Incorporated | Nanomechanical switches and circuits |
US6351032B1 (en) * | 2000-01-20 | 2002-02-26 | National Semiconductor Corporation | Method and structure for heatspreader attachment in high thermal performance IC packages |
US6576494B1 (en) * | 2000-06-28 | 2003-06-10 | Micron Technology, Inc. | Recessed encapsulated microelectronic devices and methods for formation |
US6741470B2 (en) * | 2001-06-01 | 2004-05-25 | Intel Corporation | Reusable thermal solution attachment mechanism and methods of using same |
US6534859B1 (en) * | 2002-04-05 | 2003-03-18 | St. Assembly Test Services Ltd. | Semiconductor package having heat sink attached to pre-molded cavities and method for creating the package |
-
2004
- 2004-07-15 US US10/891,648 patent/US7101736B2/en active Active
-
2005
- 2005-05-27 JP JP2007521469A patent/JP4833972B2/ja not_active Expired - Fee Related
- 2005-05-27 WO PCT/US2005/018863 patent/WO2006019460A2/en active Application Filing
- 2005-05-27 CN CN200580020481.1A patent/CN1973174B/zh not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07249705A (ja) * | 1994-03-09 | 1995-09-26 | Fujitsu Ltd | 電子デバイスのキャップ封止装置 |
JP2001351999A (ja) * | 2000-06-09 | 2001-12-21 | Seiko Epson Corp | パッケージ形成方法及び装置 |
JP2004014827A (ja) * | 2002-06-07 | 2004-01-15 | Sumitomo Metal Electronics Devices Inc | 高周波用パッケージの製造方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2008507132A (ja) | 2008-03-06 |
WO2006019460A3 (en) | 2006-09-14 |
US7101736B2 (en) | 2006-09-05 |
CN1973174A (zh) | 2007-05-30 |
WO2006019460A2 (en) | 2006-02-23 |
CN1973174B (zh) | 2011-04-20 |
US20060014325A1 (en) | 2006-01-19 |
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