JP4725710B2 - 光学式変位センサのセンサヘッド - Google Patents
光学式変位センサのセンサヘッド Download PDFInfo
- Publication number
- JP4725710B2 JP4725710B2 JP2004361836A JP2004361836A JP4725710B2 JP 4725710 B2 JP4725710 B2 JP 4725710B2 JP 2004361836 A JP2004361836 A JP 2004361836A JP 2004361836 A JP2004361836 A JP 2004361836A JP 4725710 B2 JP4725710 B2 JP 4725710B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- light receiving
- optical system
- side block
- light projecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000003287 optical effect Effects 0.000 title claims description 63
- 238000006073 displacement reaction Methods 0.000 title claims description 11
- 238000005259 measurement Methods 0.000 claims description 26
- 230000008878 coupling Effects 0.000 claims description 10
- 238000010168 coupling process Methods 0.000 claims description 10
- 238000005859 coupling reaction Methods 0.000 claims description 10
- 230000000149 penetrating effect Effects 0.000 claims 1
- 239000011521 glass Substances 0.000 description 26
- 239000000853 adhesive Substances 0.000 description 18
- 230000001070 adhesive effect Effects 0.000 description 15
- 239000000758 substrate Substances 0.000 description 14
- 238000000034 method Methods 0.000 description 5
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C5/00—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
- B05C5/02—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
- B05C5/0208—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work for applying liquid or other fluent material to separate articles
- B05C5/0212—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work for applying liquid or other fluent material to separate articles only at particular parts of the articles
- B05C5/0216—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work for applying liquid or other fluent material to separate articles only at particular parts of the articles by relative movement of article and outlet according to a predetermined path
Description
2 投光側ブロック
3 受光側ブロック
4 投光側カバー
4a 面
5 受光側カバー
5a 面
6 支持プレート
7 電気コード
8 プラグ
9 投光窓
10 受光窓
11 切欠
12 取付孔
13 取付孔
14 取付孔
15 取付孔
17 空所
18 発光素子基板
19 投光レンズ
20 レンズホルダ
21 受光レンズ
22 レンズホルダ
23 反射鏡
24 受光素子組立体
25 ディスペンサのヘッド
26 ディスペンサのノズル
27 ガラス板
L1 投光光軸
L2 受光光軸
a ステージ
b ガラス板
c 接着剤
d ノズルの相対移動方向
e ディスペンサのヘッド
f ディスペンサのノズル
h ノズルの昇降方向
j センサヘッド
G ギャップ
Claims (1)
- 光源となる発光部と、前記発光部からの光を計測対象物に対して傾斜させた投光光軸に沿って照射する投光用光学系と、計測対象物からの反射光を前記投光光軸の傾斜方位と反対側の方位に対称的に傾斜させた受光光軸に沿って取り込む受光用光学系と、前記受光用光学系を介して取り込まれた反射光を受光して光電変換する受光素子とを有してなり、さらに
所定の投光窓が開設された投光側ブロックと所定の受光窓が開設された受光側ブロックとを有すると共に、前記発光部と前記投光用光学系とは前記投光側ブロックに、また前記受光用光学系と前記受光素子とは前記受光側ブロックに収容され、
前記投光側ブロックは、垂直姿勢で支持された板状結合部材の水平方向一端側の所定領域に、投光窓を有する投光側カバーを被せて、前記発光部と前記投光用光学系とを包囲してなると共に、前記受光側ブロックは、前記板状結合部材の水平方向他端側の所定領域に、受光窓を有する受光用カバーを被せて、前記受光用光学系と前記受光素子とを包囲してなり、それにより、前記投光側カバーと前記受光側カバーと前記板状結合部材とで三方を囲まれてなる、上下に連通する空所が形成され、
前記受光側ブロックの上下方向の寸法は、前記投光側ブロックの上下方向の寸法よりも大きく設定され、さらに、
前記受光側ブロックには、前記上下に連通する空所の上下貫通方向と同じ方向へ引き出される電気コードが設けられており、
それにより、前記空所内に、ディスペンサの直線状ノズルを上下に貫通させて配置することにより、ノズル先端とほぼその真下の計測対象物の表面とのギャップを計測可能とした、ことを特徴とする光学式変位センサのセンサヘッド。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004361836A JP4725710B2 (ja) | 2004-12-14 | 2004-12-14 | 光学式変位センサのセンサヘッド |
KR1020050116301A KR100785631B1 (ko) | 2004-12-14 | 2005-12-01 | 광학식 변위 센서의 센서 헤드 |
TW094143975A TWI280350B (en) | 2004-12-14 | 2005-12-13 | Sensor head of optical displacement sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004361836A JP4725710B2 (ja) | 2004-12-14 | 2004-12-14 | 光学式変位センサのセンサヘッド |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009014098A Division JP5126544B2 (ja) | 2009-01-26 | 2009-01-26 | 光学式変位センサのセンサヘッド |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006170724A JP2006170724A (ja) | 2006-06-29 |
JP2006170724A5 JP2006170724A5 (ja) | 2007-02-08 |
JP4725710B2 true JP4725710B2 (ja) | 2011-07-13 |
Family
ID=36671653
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004361836A Active JP4725710B2 (ja) | 2004-12-14 | 2004-12-14 | 光学式変位センサのセンサヘッド |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4725710B2 (ja) |
KR (1) | KR100785631B1 (ja) |
TW (1) | TWI280350B (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100899674B1 (ko) * | 2008-01-22 | 2009-05-28 | 주식회사 탑 엔지니어링 | 시린지 장착이 가능한 변위 센서 및 이를 구비한 디스펜서 |
JP5558091B2 (ja) * | 2009-12-18 | 2014-07-23 | 株式会社キーエンス | 光学式変位センサのセンサヘッド及びそのセンサヘッドを備える光学式変位センサ |
JP6381909B2 (ja) * | 2013-12-27 | 2018-08-29 | パナソニック デバイスSunx株式会社 | 変位センサ |
JP6787294B2 (ja) * | 2017-10-31 | 2020-11-18 | セイコーエプソン株式会社 | ロボットシステム、制御方法、及びロボット |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03293512A (ja) * | 1990-04-12 | 1991-12-25 | Omron Corp | 光センサ |
JPH11276962A (ja) * | 1998-03-27 | 1999-10-12 | Toshiba Corp | ぺースト塗布装置 |
JP3940499B2 (ja) * | 1998-06-01 | 2007-07-04 | 東海旅客鉄道株式会社 | レール変位量測定装置 |
US6747745B2 (en) * | 2000-03-31 | 2004-06-08 | Omron Corporation | Displacement sensor |
JP3587303B2 (ja) * | 2001-06-26 | 2004-11-10 | オムロン株式会社 | 光学式変位センサ |
KR100710683B1 (ko) * | 2004-05-12 | 2007-04-24 | 주식회사 탑 엔지니어링 | 씰런트 디스펜서 |
-
2004
- 2004-12-14 JP JP2004361836A patent/JP4725710B2/ja active Active
-
2005
- 2005-12-01 KR KR1020050116301A patent/KR100785631B1/ko active IP Right Grant
- 2005-12-13 TW TW094143975A patent/TWI280350B/zh active
Also Published As
Publication number | Publication date |
---|---|
TWI280350B (en) | 2007-05-01 |
TW200632279A (en) | 2006-09-16 |
KR100785631B1 (ko) | 2007-12-12 |
JP2006170724A (ja) | 2006-06-29 |
KR20060067822A (ko) | 2006-06-20 |
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