JP4647938B2 - Ｘ線検出器を製作する方法 - Google Patents

Ｘ線検出器を製作する方法 Download PDF

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Publication number
JP4647938B2
JP4647938B2 JP2004162780A JP2004162780A JP4647938B2 JP 4647938 B2 JP4647938 B2 JP 4647938B2 JP 2004162780 A JP2004162780 A JP 2004162780A JP 2004162780 A JP2004162780 A JP 2004162780A JP 4647938 B2 JP4647938 B2 JP 4647938B2
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Japan
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layer
backing layer
photoreceptor
ray detector
connection point
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JP2004162780A
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Japanese (ja)
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JP2004361402A5 (enExample
JP2004361402A (ja
Inventor
ハビブ・ヴァフィ
ジェフリー・エー・カウツァー
デビッド・シー・ニューマン
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GE Medical Systems Global Technology Co LLC
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GE Medical Systems Global Technology Co LLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)
JP2004162780A 2003-06-02 2004-06-01 Ｘ線検出器を製作する方法 Expired - Fee Related JP4647938B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/452,460 US6982424B2 (en) 2003-06-02 2003-06-02 X-ray and CT image detector

Publications (3)

Publication Number Publication Date
JP2004361402A JP2004361402A (ja) 2004-12-24
JP2004361402A5 JP2004361402A5 (enExample) 2007-07-12
JP4647938B2 true JP4647938B2 (ja) 2011-03-09

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JP2004162780A Expired - Fee Related JP4647938B2 (ja) 2003-06-02 2004-06-01 Ｘ線検出器を製作する方法

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US (1) US6982424B2 (enExample)
JP (1) JP4647938B2 (enExample)
DE (1) DE102004026948A1 (enExample)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL143851A0 (en) * 2001-06-19 2002-04-21 Real Time Radiography Ltd Systems for detection, imaging and absorption of high energy radiation
US20050017182A1 (en) * 2003-07-25 2005-01-27 Siemens Medical Solutions Usa, Inc. Registered collimator device for nuclear imaging camera and method of forming the same
US7476040B2 (en) * 2004-02-02 2009-01-13 Jds Uniphase Corporation Compact optical sub-assembly with ceramic package
GB0504415D0 (en) 2005-03-03 2005-04-06 E2V Tech Uk Ltd Non-planar x-ray sensor
US7291842B2 (en) * 2005-06-14 2007-11-06 Varian Medical Systems Technologies, Inc. Photoconductor imagers with sandwich structure
JP2007101256A (ja) * 2005-09-30 2007-04-19 Fujifilm Corp Ｘ線撮像装置及びｘ線ｃｔ装置
DE102006002083B4 (de) * 2006-01-16 2009-06-10 Siemens Ag Halterung mit Röntgendetektor
US7687790B2 (en) * 2007-06-07 2010-03-30 General Electric Company EMI shielding of digital x-ray detectors with non-metallic enclosures
EP2181345B1 (en) * 2007-08-22 2017-04-19 Koninklijke Philips N.V. Reflector and light collimator arrangement for improved light collection in scintillation detectors
EP2168486B1 (de) * 2008-09-29 2011-10-05 MIR Medical Imaging Research Holding GmbH Modulares System zur Brustdiagnose und -intervention
CN105044758B (zh) * 2008-11-18 2022-06-14 皇家飞利浦电子股份有限公司 光谱成像检测器
US20100128843A1 (en) * 2008-11-22 2010-05-27 Mir Medical Imaging Research Holding Gmbh Device for Locating a Female Breast for Diagnostic Imaging and Intervention
KR101111011B1 (ko) 2008-12-26 2012-02-15 연세대학교 산학협력단 감마선 영상측정을 위한 다층 평판형 검출기 및 3차원 위치검출방법
EP2433156B1 (en) * 2009-05-20 2016-03-16 Koninklijke Philips N.V. Detector array with pre-focused anti-scatter grid
EP2476016B1 (en) 2009-09-08 2017-06-14 Koninklijke Philips N.V. Imaging measurement system with a printed photodetector array
WO2011073819A2 (en) * 2009-12-15 2011-06-23 Koninklijke Philips Electronics N.V. Radiation dose based imaging detector tile parameter compensation
JP2011247686A (ja) * 2010-05-25 2011-12-08 Fujifilm Corp 放射線画像撮影装置
US8204171B2 (en) * 2010-10-11 2012-06-19 General Electric Company Multi-faceted tileable detector for volumetric computed tomography imaging
US8399847B2 (en) 2010-11-11 2013-03-19 General Electric Company Ruggedized enclosure for a radiographic device
JP2013050364A (ja) * 2011-08-30 2013-03-14 Fujifilm Corp 放射線画像検出装置
US9935152B2 (en) 2012-12-27 2018-04-03 General Electric Company X-ray detector having improved noise performance
US9917133B2 (en) 2013-12-12 2018-03-13 General Electric Company Optoelectronic device with flexible substrate
EP3117204B1 (en) 2014-03-13 2021-06-16 General Electric Company Curved digital x-ray detector for weld inspection
US9515276B2 (en) 2014-09-02 2016-12-06 General Electric Company Organic X-ray detector and X-ray systems
US9689997B2 (en) 2014-09-04 2017-06-27 General Electric Company Systems and methods for modular imaging detectors
US9535173B2 (en) 2014-09-11 2017-01-03 General Electric Company Organic x-ray detector and x-ray systems
CN105628717B (zh) * 2014-10-30 2020-05-19 通用电气公司 光检测器、x射线检测装置和x射线成像设备
US10890669B2 (en) * 2015-01-14 2021-01-12 General Electric Company Flexible X-ray detector and methods for fabricating the same
JPWO2017145578A1 (ja) * 2016-02-22 2018-12-20 ソニー株式会社 撮像装置、撮像表示システムおよび表示装置
WO2017202738A1 (en) * 2016-05-26 2017-11-30 Koninklijke Philips N.V. Multifunctional radiation detector
JP7167060B2 (ja) * 2017-05-01 2022-11-08 コーニンクレッカ フィリップス エヌ ヴェ 多層検出器
KR102051957B1 (ko) * 2017-11-13 2019-12-04 주식회사 토비스 곡면 디텍터의 제조방법
CN110148602B (zh) * 2019-05-07 2022-07-19 上海奕瑞光电子科技股份有限公司 一种x射线探测器
WO2021077006A1 (en) * 2019-10-18 2021-04-22 The University Of North Carolina At Chapel Hill Membrane-perovskite films, devices, and methods of preparation
KR102373241B1 (ko) * 2021-06-15 2022-03-15 주식회사 디알텍 방사선 디텍터 및 이를 포함하는 방사선 검사장치
JP7636284B2 (ja) * 2021-07-19 2025-02-26 富士フイルム株式会社 放射線検出器、および放射線撮影装置
CN115144417A (zh) * 2022-06-08 2022-10-04 北京纳米维景科技有限公司 一种柔性ct探测器及其静态ct系统

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4403939A (en) * 1979-02-21 1983-09-13 Trustees Boston University Process and apparatus for producing a molecularly oriented film
JPS6243585A (ja) * 1985-08-21 1987-02-25 Toshiba Corp Ｘ線ｃｔ用検出器
JPS6314469A (ja) * 1986-07-07 1988-01-21 Komatsu Ltd フオトセンサアレイ装置およびその製造方法
JPS6457871A (en) * 1987-08-28 1989-03-06 Hitachi Ltd Image sensor
JPH01126584A (ja) * 1987-11-12 1989-05-18 Toshiba Corp Ｘ線ｃｔ用放射線検出器
JPH01202989A (ja) * 1988-02-09 1989-08-15 Nec Corp 固体撮像装置
JPH0637331B2 (ja) * 1988-08-12 1994-05-18 吉田工業株式会社 セラミックス押出長尺形材の焼成方法
US5864146A (en) * 1996-11-13 1999-01-26 University Of Massachusetts Medical Center System for quantitative radiographic imaging
JPH0511301U (ja) * 1991-07-26 1993-02-12 日本板硝子株式会社 Ｘ線イメージセンサ
JPH0634763A (ja) * 1992-07-17 1994-02-10 Fuji Electric Co Ltd 放射線検出器
US5315113A (en) * 1992-09-29 1994-05-24 The Perkin-Elmer Corporation Scanning and high resolution x-ray photoelectron spectroscopy and imaging
US5515411A (en) * 1993-03-31 1996-05-07 Shimadzu Corporation X-ray image pickup tube
US5686733A (en) * 1996-03-29 1997-11-11 Mcgill University Megavoltage imaging method using a combination of a photoreceptor with a high energy photon converter and intensifier
EP0816873B1 (en) * 1996-06-27 2002-10-09 Analogic Corporation Quadrature transverse computed tomography detection system
JP3597017B2 (ja) * 1996-07-16 2004-12-02 日本碍子株式会社 セラミック部材
CA2184667C (en) * 1996-09-03 2000-06-20 Bradley Trent Polischuk Multilayer plate for x-ray imaging and method of producing same
US6011575A (en) * 1996-09-10 2000-01-04 Konica Corporation Image forming apparatus with line-shaped image exposure means
US6091795A (en) * 1997-10-10 2000-07-18 Analogic Corporation Area detector array for computer tomography scanning system
US6139337A (en) * 1997-11-26 2000-10-31 General Electric Company Elastomeric connection for computed tomography system
GB2332608B (en) * 1997-12-18 2000-09-06 Simage Oy Modular imaging apparatus
JP2000058995A (ja) * 1998-08-11 2000-02-25 Sumitomo Kinzoku Electro Device:Kk セラミック回路基板及び半導体モジュール
CA2366536A1 (en) * 1999-04-14 2000-10-19 Jack Edward Juni Single photon emission computed tomography system
US20010054723A1 (en) * 2000-03-17 2001-12-27 Tadashi Narui Image sensor, method of fabricating the same, and exposure apparatus, measuring device, alignment device, and aberration measuring device using the image sensor
US6510195B1 (en) * 2001-07-18 2003-01-21 Koninklijke Philips Electronics, N.V. Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same

Also Published As

Publication number Publication date
US6982424B2 (en) 2006-01-03
DE102004026948A1 (de) 2004-12-30
JP2004361402A (ja) 2004-12-24
US20040238750A1 (en) 2004-12-02

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