JP4636917B2 - 検体保持用のデバイス、それを用いた検体検出装置及び検体検出方法 - Google Patents

検体保持用のデバイス、それを用いた検体検出装置及び検体検出方法 Download PDF

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JP4636917B2
JP4636917B2 JP2005091565A JP2005091565A JP4636917B2 JP 4636917 B2 JP4636917 B2 JP 4636917B2 JP 2005091565 A JP2005091565 A JP 2005091565A JP 2005091565 A JP2005091565 A JP 2005091565A JP 4636917 B2 JP4636917 B2 JP 4636917B2
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electromagnetic wave
antenna
transmission line
sample
polarization
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JP2006275592A (ja
JP2006275592A5 (enExample
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亮治 黒坂
健明 井辻
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Canon Inc
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Canon Inc
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JP2005091565A 2005-03-28 2005-03-28 検体保持用のデバイス、それを用いた検体検出装置及び検体検出方法 Expired - Fee Related JP4636917B2 (ja)

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JP2005091565A JP4636917B2 (ja) 2005-03-28 2005-03-28 検体保持用のデバイス、それを用いた検体検出装置及び検体検出方法

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JP2005091565A JP4636917B2 (ja) 2005-03-28 2005-03-28 検体保持用のデバイス、それを用いた検体検出装置及び検体検出方法

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JP2006275592A JP2006275592A (ja) 2006-10-12
JP2006275592A5 JP2006275592A5 (enExample) 2008-06-19
JP4636917B2 true JP4636917B2 (ja) 2011-02-23

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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5035618B2 (ja) * 2006-12-05 2012-09-26 独立行政法人理化学研究所 電磁波を用いた検出方法、及び検出装置
JP4928249B2 (ja) 2006-12-20 2012-05-09 キヤノン株式会社 検出装置
JP4958278B2 (ja) * 2007-03-13 2012-06-20 キヤノン株式会社 検査装置
JP4859250B2 (ja) * 2007-08-31 2012-01-25 キヤノン株式会社 検査物に関する距離調整装置及び方法、検査装置及び方法
JP6477693B2 (ja) * 2014-05-14 2019-03-06 コニカミノルタ株式会社 検出デバイスおよびその製造方法
JP6395049B2 (ja) * 2014-12-24 2018-09-26 大日本印刷株式会社 物体に付着した付着物を検出する検査方法および検査装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003121355A (ja) * 2001-10-10 2003-04-23 Tochigi Nikon Corp 試料情報取得方法及びテラヘルツ光装置
JP2004061455A (ja) * 2002-07-31 2004-02-26 Communication Research Laboratory テラヘルツ電磁波による粉体物性測定装置および方法
JP4012125B2 (ja) * 2003-06-25 2007-11-21 キヤノン株式会社 電磁波制御装置およびセンシングシステム
JP3950820B2 (ja) * 2003-06-25 2007-08-01 キヤノン株式会社 高周波電気信号制御装置及びセンシングシステム
US7709247B2 (en) * 2004-08-04 2010-05-04 Intel Corporation Methods and systems for detecting biomolecular binding using terahertz radiation
JP2006145512A (ja) * 2004-11-17 2006-06-08 Semiconductor Res Found 流体中含有物質を高感度検出する測定装置および方法
JP4878180B2 (ja) * 2005-03-24 2012-02-15 キヤノン株式会社 電磁波を用いる検査装置

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