JP4607097B2 - X線回折システム及び方法 - Google Patents
X線回折システム及び方法 Download PDFInfo
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- JP4607097B2 JP4607097B2 JP2006507161A JP2006507161A JP4607097B2 JP 4607097 B2 JP4607097 B2 JP 4607097B2 JP 2006507161 A JP2006507161 A JP 2006507161A JP 2006507161 A JP2006507161 A JP 2006507161A JP 4607097 B2 JP4607097 B2 JP 4607097B2
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- 238000002441 X-ray diffraction Methods 0.000 title claims description 57
- 238000000034 method Methods 0.000 title claims description 38
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- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
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- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
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- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
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- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
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- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
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- Analysing Materials By The Use Of Radiation (AREA)
Description
Claims (11)
- ベースと、
該ベースに取り外し可能に接続される複数のモジュラー式X線ヘッドと、
X線回折測定操作の間、円弧状軌跡で、ベースに接続されているヘッドを移動させる、ベースに付随する共通の駆動アセンブリと、
ヘッドをベースに接続し、及び該ベースから取り外し、操作者が特定のX線回折測定操作のために使用されるヘッドを選択することを可能とする、ベースとX線ヘッドの間のアダプターと、
を備え、
複数のX線ヘッドは、異なる大きさのヘッドを含み、限定された空間への接近が望まれる場合、比較的小さなヘッドが使用されることを可能とすることを特徴とする異なる部品からX線回折測定をするモジュラー式X線回折システム。 - アダプターは、ベースに付随する部分と所定の嵌合構造を有する部分を持つヘッド各々とを含み、それで、ベース・アダプター部分とヘッド・アダプター部分とが一方が他方の中に取り外し可能に受け入れられることを特徴とする請求項1に記載されるモジュラー式X線回折システム。
- アダプターは、駆動アセンブリの出力シャフト部分、及びヘッド各々に付随し、シャフト部分を受け入れるように構成されている同じソケットを備えていることを特徴とする請求項1に記載されるモジュラー式X線回折システム。
- ヘッドは、お互いとは異なる所定の操作特性を含み、着手される特定の測定操作に対して測定性能を最適化するように、ベースに接続されるために、ヘッドが選択されることを可能とすることを特徴とする請求項1に記載されるモジュラー式X線回折システム。
- 操作特性は、X線ヘッドの出力、X線の波長、及びX線ビームの形状を含んでいることを特徴とする請求項4に記載されるモジュラー式X線回折システム。
- ヘッド各々は、制御モジュールを含み、ベースは、これに付随する制御器を有し、
ヘッド各々は、ヘッドの所定の操作特性の制御器への転送のために、モジュールを制御器に相互接続する連結装置を含んでいることを特徴とする請求項4に記載されるモジュラー式X線回折システム。 - 駆動アセンブリは、X線回折測定操作の間、円弧状の軌跡でヘッドが正確に移動するために、抗バックラッシュ機構を有する歯車装置を含んでいることを特徴とする請求項1に記載されるモジュラー式X線回折システム。
- 駆動アセンブリは、モーター、モーター操作により駆動される駆動シャフト、及び出力シャフトを含み、アダプターは、出力シャフトのアダプター用端部及びそれにシャフト端部を受け入れる、ヘッド各々に付随するアダプター用ソケット開口を含み、
駆動アセンブリは、アダプターを介して接続されているヘッドを円弧状軌跡で移動させるために、出力を駆動シャフトから出力シャフトに伝えるべく協働する駆動シャフト歯車及び出力シャフト歯車を含み、一方の歯車は、2つの歯車部分に分割され、駆動シャフト歯車の歯と出力シャフト歯車の歯との間の遊びを最小限に抑えるために、お互いに対して回転することができるように偏倚されている2つの歯車部分を含んでいることを特徴とする請求項1に記載されるモジュラー式X線回折システム。 - ヘッドは、X線検出器及びX線放射源、及び
2つの異なるX線回折測定技法に付随する少なくとも2つの位置の間で検出器を移動させる検出器用調整アセンブリ、
を含んでいることを特徴とする請求項1に記載されるモジュラー式X線回折システム。 - 複数のモジュラー式X線ヘッドは、限定された空間に適合するために、直径が約31.75mm又はそれ未満の管状のハウジングを含む極小ヘッドを含んでいることを特徴とする請求項1に記載されるモジュラー式X線回折システム。
- 複数のモジュラー式X線ヘッドは、限定された空間への最適化された接近のために最小限の大きさを持つハウジング、X線検出器、及び検出器からの信号を処理する回路配線を有するフレキシブル基板を有する極小ヘッドを含み、フレキシブル基板は、ハウジングに巻きつけられ、ハウジングの大きさを最小限に維持すべくそれに略合致していることを特徴とする請求項1に記載されるモジュラー式X線回折システム。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/390,479 US6925146B2 (en) | 2003-03-17 | 2003-03-17 | X-ray diffraction system |
PCT/US2004/007756 WO2004083815A2 (en) | 2003-03-17 | 2004-03-12 | X-ray diffraction system and method |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006520902A JP2006520902A (ja) | 2006-09-14 |
JP2006520902A5 JP2006520902A5 (ja) | 2007-04-26 |
JP4607097B2 true JP4607097B2 (ja) | 2011-01-05 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006507161A Expired - Lifetime JP4607097B2 (ja) | 2003-03-17 | 2004-03-12 | X線回折システム及び方法 |
Country Status (7)
Country | Link |
---|---|
US (3) | US6925146B2 (ja) |
EP (1) | EP1608957B1 (ja) |
JP (1) | JP4607097B2 (ja) |
KR (1) | KR101089597B1 (ja) |
CN (1) | CN1816740B (ja) |
CA (1) | CA2519657C (ja) |
WO (1) | WO2004083815A2 (ja) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6721393B1 (en) * | 1999-03-31 | 2004-04-13 | Proto Manufacturing Ltd. | X-ray diffraction apparatus and method |
US6925146B2 (en) * | 2003-03-17 | 2005-08-02 | Proto Manufacturing Ltd. | X-ray diffraction system |
US7265754B2 (en) * | 2003-11-12 | 2007-09-04 | Proto Manufacturing Ltd. | Method for displaying material characteristic information |
FI20041538A (fi) * | 2004-11-29 | 2006-05-30 | Stresstech Oy | Goniometri |
US20070269018A1 (en) * | 2006-05-03 | 2007-11-22 | Geoffrey Harding | Systems and methods for generating a diffraction profile |
WO2008119868A1 (en) * | 2007-04-03 | 2008-10-09 | Stresstech Oy | Goniometer |
CN103512909A (zh) * | 2012-06-18 | 2014-01-15 | 中国航空工业第六一八研究所 | 一种x射线对焦装置 |
CN102980903B (zh) * | 2012-12-04 | 2015-08-19 | 中国科学院上海硅酸盐研究所 | 一种用于分析电极材料电化学性能的同步辐射x射线衍射装置及其应用 |
JP6685078B2 (ja) * | 2013-03-15 | 2020-04-22 | プロト マニュファクチャリング リミテッド | X線回折装置およびx線回折装置駆動方法 |
CN103278273B (zh) * | 2013-06-14 | 2015-04-22 | 广西工学院 | 桥壳残余应力检测方法及装置 |
CN103389315B (zh) * | 2013-08-14 | 2015-11-25 | 中国工程物理研究院流体物理研究所 | 瞬态x射线衍射实验方法及其专用定位支架 |
US10794844B2 (en) * | 2016-08-10 | 2020-10-06 | Proto Manufacturing, Ltd. | Mounting system and sample holder for X-ray diffraction apparatus |
JP6815933B2 (ja) * | 2017-05-31 | 2021-01-20 | 株式会社神戸製鋼所 | 応力測定方法 |
US11519798B2 (en) * | 2018-12-18 | 2022-12-06 | Metal Industries Research & Development Centre | Residual stress detection device and detection method thereof |
US11519464B2 (en) | 2019-06-17 | 2022-12-06 | Allison Transmission, Inc. | Profiled wheel retainer |
CN113049614B (zh) * | 2019-12-11 | 2022-11-08 | 同方威视技术股份有限公司 | 射线源组件的调节定位装置和方法以及辐射扫描成像设备 |
CN111272050B (zh) * | 2020-03-18 | 2020-12-11 | 新沂市锡沂高新材料产业技术研究院有限公司 | 一种陶瓷变形度测试机 |
CN114858586B (zh) * | 2022-05-19 | 2023-09-29 | 成都飞机工业(集团)有限责任公司 | 一种受力轴可自行对正的残余应力测量标定装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5222553B2 (ja) * | 1973-02-20 | 1977-06-17 | ||
JPS5116984A (en) * | 1974-08-02 | 1976-02-10 | Hitachi Ltd | X senoryokusokuteisochi |
JPS5425437A (en) * | 1977-07-28 | 1979-02-26 | Suwa Seikosha Kk | Method of charging |
US4412345A (en) * | 1981-08-03 | 1983-10-25 | The United States Of America As Represented By The Secretary Of The Army | Apparatus and method for precise determinations of crystallographic orientation in crystalline substances |
US4561062A (en) * | 1983-02-18 | 1985-12-24 | Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources | Stress measurement by X-ray diffractometry |
US4656357A (en) * | 1985-04-16 | 1987-04-07 | Twin City International, Inc. | Apparatus for measuring coating thickness |
JP2833834B2 (ja) * | 1990-07-10 | 1998-12-09 | 日本電子株式会社 | X線分析装置におけるゴニオメータ |
JP3262831B2 (ja) * | 1992-02-07 | 2002-03-04 | 理学電機株式会社 | X線回折装置用ゴニオメータの光軸調整装置 |
JPH09131338A (ja) * | 1995-11-07 | 1997-05-20 | Toshiba Corp | X線検出装置 |
US6925146B2 (en) * | 2003-03-17 | 2005-08-02 | Proto Manufacturing Ltd. | X-ray diffraction system |
-
2003
- 2003-03-17 US US10/390,479 patent/US6925146B2/en not_active Expired - Lifetime
-
2004
- 2004-03-12 CN CN2004800117518A patent/CN1816740B/zh not_active Expired - Lifetime
- 2004-03-12 EP EP04720449.0A patent/EP1608957B1/en not_active Expired - Lifetime
- 2004-03-12 CA CA2519657A patent/CA2519657C/en not_active Expired - Lifetime
- 2004-03-12 JP JP2006507161A patent/JP4607097B2/ja not_active Expired - Lifetime
- 2004-03-12 WO PCT/US2004/007756 patent/WO2004083815A2/en active Application Filing
- 2004-03-12 KR KR1020057017464A patent/KR101089597B1/ko active IP Right Grant
-
2005
- 2005-08-02 US US11/195,298 patent/US20050281375A1/en not_active Abandoned
-
2006
- 2006-11-17 US US11/561,178 patent/US7283612B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1608957A2 (en) | 2005-12-28 |
KR101089597B1 (ko) | 2011-12-07 |
CA2519657A1 (en) | 2004-09-30 |
US20070071170A1 (en) | 2007-03-29 |
WO2004083815A2 (en) | 2004-09-30 |
US6925146B2 (en) | 2005-08-02 |
EP1608957A4 (en) | 2007-06-27 |
CN1816740A (zh) | 2006-08-09 |
US7283612B2 (en) | 2007-10-16 |
KR20060015478A (ko) | 2006-02-17 |
CN1816740B (zh) | 2012-01-11 |
CA2519657C (en) | 2015-09-08 |
JP2006520902A (ja) | 2006-09-14 |
WO2004083815A3 (en) | 2005-02-03 |
EP1608957B1 (en) | 2015-09-30 |
US20040184580A1 (en) | 2004-09-23 |
US20050281375A1 (en) | 2005-12-22 |
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