JP4557657B2 - 接触式プローブおよび形状測定装置 - Google Patents
接触式プローブおよび形状測定装置 Download PDFInfo
- Publication number
- JP4557657B2 JP4557657B2 JP2004280827A JP2004280827A JP4557657B2 JP 4557657 B2 JP4557657 B2 JP 4557657B2 JP 2004280827 A JP2004280827 A JP 2004280827A JP 2004280827 A JP2004280827 A JP 2004280827A JP 4557657 B2 JP4557657 B2 JP 4557657B2
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- Prior art keywords
- probe
- yoke
- permanent magnet
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- A Measuring Device Byusing Mechanical Method (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004280827A JP4557657B2 (ja) | 2004-09-28 | 2004-09-28 | 接触式プローブおよび形状測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004280827A JP4557657B2 (ja) | 2004-09-28 | 2004-09-28 | 接触式プローブおよび形状測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006098060A JP2006098060A (ja) | 2006-04-13 |
| JP2006098060A5 JP2006098060A5 (enExample) | 2007-11-15 |
| JP4557657B2 true JP4557657B2 (ja) | 2010-10-06 |
Family
ID=36238050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004280827A Expired - Fee Related JP4557657B2 (ja) | 2004-09-28 | 2004-09-28 | 接触式プローブおよび形状測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4557657B2 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4291849B2 (ja) * | 2006-12-20 | 2009-07-08 | パナソニック株式会社 | 三次元測定プローブ |
| JP5209440B2 (ja) * | 2008-10-30 | 2013-06-12 | 独立行政法人理化学研究所 | 形状測定プローブ |
| JP5255422B2 (ja) * | 2008-12-16 | 2013-08-07 | 独立行政法人理化学研究所 | 形状測定プローブ |
| JP4850265B2 (ja) * | 2009-03-12 | 2012-01-11 | パナソニック株式会社 | 形状測定装置用プローブ及び形状測定装置 |
| JP4875180B2 (ja) * | 2010-03-25 | 2012-02-15 | ファナック株式会社 | 微細接触力調整機構を有する接触式計測装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2519823B2 (ja) * | 1990-08-17 | 1996-07-31 | 株式会社東芝 | 変位測定装置 |
| JPH04113210A (ja) * | 1990-09-03 | 1992-04-14 | Toshiba Corp | 変位測定装置 |
| JP3420327B2 (ja) * | 1994-05-26 | 2003-06-23 | 株式会社ミツトヨ | タッチ信号プローブ |
| JP2000155002A (ja) * | 1998-11-19 | 2000-06-06 | Mitsutoyo Corp | 形状計測用プローブ |
| JP4557466B2 (ja) * | 2001-08-02 | 2010-10-06 | キヤノン株式会社 | 接触式プローブ |
| JP4376592B2 (ja) * | 2003-10-31 | 2009-12-02 | 株式会社リコー | 形状測定装置 |
-
2004
- 2004-09-28 JP JP2004280827A patent/JP4557657B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006098060A (ja) | 2006-04-13 |
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