JP4505049B2 - シール不良検査機 - Google Patents

シール不良検査機 Download PDF

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Publication number
JP4505049B2
JP4505049B2 JP2000256455A JP2000256455A JP4505049B2 JP 4505049 B2 JP4505049 B2 JP 4505049B2 JP 2000256455 A JP2000256455 A JP 2000256455A JP 2000256455 A JP2000256455 A JP 2000256455A JP 4505049 B2 JP4505049 B2 JP 4505049B2
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Japan
Prior art keywords
electrode
seal
contact
subject
insulating resin
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Expired - Fee Related
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JP2000256455A
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Japanese (ja)
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JP2002039907A5 (enExample
JP2002039907A (ja
Inventor
康敬 前川
葉月 和佐
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Nissin Electronics Co Ltd
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Nissin Electronics Co Ltd
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Priority to JP2000256455A priority Critical patent/JP4505049B2/ja
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JP2000256455A 2000-07-25 2000-07-25 シール不良検査機 Expired - Fee Related JP4505049B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000256455A JP4505049B2 (ja) 2000-07-25 2000-07-25 シール不良検査機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000256455A JP4505049B2 (ja) 2000-07-25 2000-07-25 シール不良検査機

Publications (3)

Publication Number Publication Date
JP2002039907A JP2002039907A (ja) 2002-02-06
JP2002039907A5 JP2002039907A5 (enExample) 2007-11-29
JP4505049B2 true JP4505049B2 (ja) 2010-07-14

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Family Applications (1)

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JP2000256455A Expired - Fee Related JP4505049B2 (ja) 2000-07-25 2000-07-25 シール不良検査機

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JP (1) JP4505049B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4825954B2 (ja) * 2001-02-19 2011-11-30 日新電子工業株式会社 シール不良検査機
JP2003194662A (ja) * 2001-12-27 2003-07-09 Nihon Tetra Pak Kk シール状態検査装置
JP2003194663A (ja) 2001-12-28 2003-07-09 Nihon Tetra Pak Kk シール状態検査装置
JP4925178B2 (ja) * 2006-09-25 2012-04-25 大和製罐株式会社 容器のシール不良検査方法
JP2009236505A (ja) * 2008-03-26 2009-10-15 Daiwa Can Co Ltd 容器のシール不良検査方法
JP6918722B2 (ja) * 2018-02-16 2021-08-11 Pacraft株式会社 異常検出装置及び異常検出方法

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Publication number Publication date
JP2002039907A (ja) 2002-02-06

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