JP4470680B2 - 気相成長装置 - Google Patents
気相成長装置 Download PDFInfo
- Publication number
- JP4470680B2 JP4470680B2 JP2004297504A JP2004297504A JP4470680B2 JP 4470680 B2 JP4470680 B2 JP 4470680B2 JP 2004297504 A JP2004297504 A JP 2004297504A JP 2004297504 A JP2004297504 A JP 2004297504A JP 4470680 B2 JP4470680 B2 JP 4470680B2
- Authority
- JP
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- Prior art keywords
- susceptor
- rotation
- susceptors
- rotating
- vapor phase
- Prior art date
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- 239000004065 semiconductor Substances 0.000 claims description 44
- 238000001947 vapour-phase growth Methods 0.000 claims description 32
- 230000002093 peripheral effect Effects 0.000 claims description 12
- 238000010438 heat treatment Methods 0.000 claims description 5
- 235000012431 wafers Nutrition 0.000 description 33
- 239000007789 gas Substances 0.000 description 26
- 239000002994 raw material Substances 0.000 description 12
- 239000013078 crystal Substances 0.000 description 8
- 239000010409 thin film Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 210000000078 claw Anatomy 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000002109 crystal growth method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 150000004678 hydrides Chemical class 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/08—Reaction chambers; Selection of materials therefor
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4584—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally the substrate being rotated
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/12—Substrate holders or susceptors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- Chemical Vapour Deposition (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
請求項1に係る気相成長装置は、原料ガス導入口、半導体ウエハを加熱するヒータ及びガス排出口を有すると共に、各々半導体ウエハを保持する複数個の自転サセプタ及びこれら自転サセプタを夫々ベアリングを介して回転自在に設置した円板状の公転サセプタを有し、前記複数個の自転サセプタを前記円板状の公転サセプタの周辺部に環状に並べて配置すると共に、前記複数個の自転サセプタの外周部に夫々形成された小歯車をこれら小歯車の外側に位置する共通の内歯車と噛み合わせてなる気相成長装置において前記自転サセプタの外周部に一体に形成された前記小歯車は、前記自転サセプタ外周部の水平方向外側へ突出することなく、ベアリングの上部に位置するよう形成されることを特徴とする。
請求項2の発明に係る気相成長装置は、原料ガス導入口、半導体ウエハを加熱するヒータ及びガス排出口を有すると共に、各々半導体ウエハを保持する複数個の自転サセプタ及びこれら自転サセプタを夫々ベアリングを介して回転自在に設置した円板状の公転サセプタを有し、前記複数個の自転サセプタを前記円板状の公転サセプタの周辺部に環状に並べて配置すると共に、前記複数個の自転サセプタの外周部に夫々形成された小歯車をこれら小歯車の内側に存在する共通の外歯車と噛み合わせてなる気相成長装置において、前記自転サセプタの外周部に一体に形成された前記小歯車は、前記自転サセプタ外周部の水平方向外側へ突出することなく、ベアリングの上部に位置するよう形成されることを特徴とする。
2 原料ガス導入口
3 原料ガス
4 排出ガス
5 ガス排出口
6 半導体ウエハ
7 自転サセプタ
8 公転サセプタ
9 ヒータ
10 モーター
11 軸
12 ベアリング
13 小歯車
14 内歯車
15 噛み合わせ部
Claims (2)
- 原料ガス導入口、半導体ウエハを加熱するヒータ及びガス排出口を有すると共に、各々半導体ウエハを保持する複数個の自転サセプタ及びこれら自転サセプタを夫々ベアリングを介して回転自在に設置した円板状の公転サセプタを有し、前記複数個の自転サセプタを前記円板状の公転サセプタの周辺部に環状に並べて配置すると共に、前記複数個の自転サセプタの外周部に夫々形成された小歯車をこれら小歯車の外側に位置する共通の内歯車と噛み合わせてなる気相成長装置において、前記自転サセプタの外周部に一体に形成された前記小歯車は、前記自転サセプタ外周部の水平方向外側へ突出することなく、ベアリングの上部に位置するよう形成されることを特徴とする気相成長装置。
- 原料ガス導入口、半導体ウエハを加熱するヒータ及びガス排出口を有すると共に、各々半導体ウエハを保持する複数個の自転サセプタ及びこれら自転サセプタを夫々ベアリングを介して回転自在に設置した円板状の公転サセプタを有し、前記複数個の自転サセプタを前記円板状の公転サセプタの周辺部に環状に並べて配置すると共に、前記複数個の自転サセプタの外周部に夫々形成された小歯車をこれら小歯車の内側に存在する共通の外歯車と噛み合わせてなる気相成長装置において、前記自転サセプタの外周部に一体に形成された前記小歯車は、前記自転サセプタ外周部の水平方向外側へ突出することなく、ベアリングの上部に位置するよう形成されることを特徴とする気相成長装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004297504A JP4470680B2 (ja) | 2004-10-12 | 2004-10-12 | 気相成長装置 |
US11/070,162 US7494562B2 (en) | 2004-10-12 | 2005-03-03 | Vapor phase growth apparatus |
CNB2005100569456A CN100477088C (zh) | 2004-10-12 | 2005-03-24 | 气相生长装置 |
US12/318,104 US7662733B2 (en) | 2004-10-12 | 2008-12-22 | Vapor phase growth apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004297504A JP4470680B2 (ja) | 2004-10-12 | 2004-10-12 | 気相成長装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006114547A JP2006114547A (ja) | 2006-04-27 |
JP4470680B2 true JP4470680B2 (ja) | 2010-06-02 |
Family
ID=36382841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004297504A Expired - Lifetime JP4470680B2 (ja) | 2004-10-12 | 2004-10-12 | 気相成長装置 |
Country Status (3)
Country | Link |
---|---|
US (2) | US7494562B2 (ja) |
JP (1) | JP4470680B2 (ja) |
CN (1) | CN100477088C (ja) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101419389B1 (ko) | 2007-07-25 | 2014-07-21 | 주성엔지니어링(주) | 기판 지지 어셈블리 및 이를 포함하는 기판 처리 장치 |
DE102008010041A1 (de) * | 2007-09-28 | 2009-04-02 | Osram Opto Semiconductors Gmbh | Schichtabscheidevorrichtung und Verfahren zu deren Betrieb |
JP2010219225A (ja) * | 2009-03-16 | 2010-09-30 | Japan Pionics Co Ltd | Iii族窒化物半導体の気相成長装置 |
JP5436043B2 (ja) * | 2009-05-22 | 2014-03-05 | 大陽日酸株式会社 | 気相成長装置 |
KR101650839B1 (ko) * | 2009-06-19 | 2016-08-24 | 다이요 닛산 가부시키가이샤 | 기상 성장 장치 |
JP2012162752A (ja) * | 2011-02-03 | 2012-08-30 | Taiyo Nippon Sanso Corp | 気相成長装置 |
WO2012104928A1 (ja) * | 2011-02-04 | 2012-08-09 | フジエピ セミコンダクダー イクイップメント インコーポレイティッド | 半導体基板の回転保持装置及び搬送装置 |
JP2012227231A (ja) * | 2011-04-15 | 2012-11-15 | Japan Pionics Co Ltd | Iii族窒化物半導体の気相成長装置 |
JP2013004730A (ja) * | 2011-06-16 | 2013-01-07 | Japan Pionics Co Ltd | 気相成長装置 |
JP2013016549A (ja) * | 2011-06-30 | 2013-01-24 | Japan Pionics Co Ltd | 気相成長装置 |
CN102492938B (zh) * | 2011-12-30 | 2013-10-30 | 东莞市中镓半导体科技有限公司 | 一种单接触式自转公转基舟 |
KR102508025B1 (ko) * | 2015-05-11 | 2023-03-10 | 주성엔지니어링(주) | 공정챔버 내부에 배치되는 기판 처리장치 및 그 작동방법 |
KR102510956B1 (ko) * | 2016-01-21 | 2023-03-16 | 주성엔지니어링(주) | 기판 처리장치 |
TWI718501B (zh) * | 2019-03-20 | 2021-02-11 | 漢民科技股份有限公司 | 用於氣相沉積設備之晶圓承載裝置 |
JP7257941B2 (ja) * | 2019-11-28 | 2023-04-14 | 東京エレクトロン株式会社 | 自転駆動機構及び自転駆動方法、並びにこれらを用いた基板処理装置及び基板処理方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6041187A (en) * | 1993-04-30 | 2000-03-21 | Olympus Optical Co., Ltd. | Power transmission apparatus |
JP3610376B2 (ja) | 1995-12-05 | 2005-01-12 | 大陽日酸株式会社 | 気相成長装置用基板保持装置 |
US6465043B1 (en) * | 1996-02-09 | 2002-10-15 | Applied Materials, Inc. | Method and apparatus for reducing particle contamination in a substrate processing chamber |
JPH10219447A (ja) | 1997-02-12 | 1998-08-18 | Fujitsu Ltd | 気相成長装置 |
JP4537566B2 (ja) * | 2000-12-07 | 2010-09-01 | 大陽日酸株式会社 | 基板回転機構を備えた成膜装置 |
JP2003347228A (ja) | 2002-05-30 | 2003-12-05 | Renesas Technology Corp | 半導体装置の製造方法および熱処理装置 |
-
2004
- 2004-10-12 JP JP2004297504A patent/JP4470680B2/ja not_active Expired - Lifetime
-
2005
- 2005-03-03 US US11/070,162 patent/US7494562B2/en active Active
- 2005-03-24 CN CNB2005100569456A patent/CN100477088C/zh active Active
-
2008
- 2008-12-22 US US12/318,104 patent/US7662733B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN100477088C (zh) | 2009-04-08 |
US7494562B2 (en) | 2009-02-24 |
CN1761037A (zh) | 2006-04-19 |
US20090117721A1 (en) | 2009-05-07 |
US20060124062A1 (en) | 2006-06-15 |
US7662733B2 (en) | 2010-02-16 |
JP2006114547A (ja) | 2006-04-27 |
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