JP4388226B2 - センサ装置 - Google Patents

センサ装置 Download PDF

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Publication number
JP4388226B2
JP4388226B2 JP2000514467A JP2000514467A JP4388226B2 JP 4388226 B2 JP4388226 B2 JP 4388226B2 JP 2000514467 A JP2000514467 A JP 2000514467A JP 2000514467 A JP2000514467 A JP 2000514467A JP 4388226 B2 JP4388226 B2 JP 4388226B2
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JP
Japan
Prior art keywords
signal
calibration
detection
sensor device
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2000514467A
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English (en)
Japanese (ja)
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JP2001518759A (ja
Inventor
ロナルド アレクサンダー バーリンガール
スティーヴン コリンズ
ディヴィッド ジョン リーズ
ギリアン フィオーナ マーシャル
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Qinetiq Ltd
Original Assignee
Qinetiq Ltd
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Filing date
Publication date
Priority claimed from GBGB9720384.8A external-priority patent/GB9720384D0/en
Application filed by Qinetiq Ltd filed Critical Qinetiq Ltd
Publication of JP2001518759A publication Critical patent/JP2001518759A/ja
Application granted granted Critical
Publication of JP4388226B2 publication Critical patent/JP4388226B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H04N25/674—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources based on the scene itself, e.g. defocusing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/20—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measuring Fluid Pressure (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Radiation Pyrometers (AREA)
  • Burglar Alarm Systems (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Liquid Crystal (AREA)
  • Picture Signal Circuits (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Push-Button Switches (AREA)
JP2000514467A 1997-09-26 1998-09-18 センサ装置 Expired - Fee Related JP4388226B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GBGB9720384.8A GB9720384D0 (en) 1997-09-26 1997-09-26 Sensor system
GB9720384.8 1997-09-26
GBGB9723742.4A GB9723742D0 (en) 1997-09-26 1997-11-11 Sensor system
GB9723742.4 1997-11-11
PCT/GB1998/002843 WO1999017541A1 (en) 1997-09-26 1998-09-18 Sensor apparatus

Publications (2)

Publication Number Publication Date
JP2001518759A JP2001518759A (ja) 2001-10-16
JP4388226B2 true JP4388226B2 (ja) 2009-12-24

Family

ID=26312317

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2000514467A Expired - Fee Related JP4388226B2 (ja) 1997-09-26 1998-09-18 センサ装置
JP2000514468A Pending JP2001518760A (ja) 1997-09-26 1998-09-23 センサシステム

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2000514468A Pending JP2001518760A (ja) 1997-09-26 1998-09-23 センサシステム

Country Status (9)

Country Link
US (2) US6396045B1 (https=)
EP (2) EP1018260B1 (https=)
JP (2) JP4388226B2 (https=)
CN (2) CN1280738A (https=)
AT (1) ATE229722T1 (https=)
CA (2) CA2304500A1 (https=)
DE (2) DE69807096T2 (https=)
GB (2) GB2344246B (https=)
WO (2) WO1999017541A1 (https=)

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US7166851B2 (en) * 2000-12-29 2007-01-23 Board Of Regents, The University Of Texas System Semiconductor chip-based radiation detector
JP3882640B2 (ja) * 2002-02-27 2007-02-21 日産自動車株式会社 赤外線カメラ
DE10240062A1 (de) * 2002-08-30 2004-03-11 Philips Intellectual Property & Standards Gmbh Detektoranordnung
US7301625B2 (en) * 2005-01-19 2007-11-27 Duke University Static two-dimensional aperture coding for multimodal multiplex spectroscopy
JP2006121358A (ja) * 2004-10-21 2006-05-11 Konica Minolta Holdings Inc 固体撮像装置
KR100645635B1 (ko) * 2004-11-30 2006-11-15 삼성전기주식회사 광학 소자를 포함하는 이미지 픽업 모듈
US8872906B2 (en) 2005-01-05 2014-10-28 Avantis Medical Systems, Inc. Endoscope assembly with a polarizing filter
US8235887B2 (en) 2006-01-23 2012-08-07 Avantis Medical Systems, Inc. Endoscope assembly with retroscope
US8182422B2 (en) 2005-12-13 2012-05-22 Avantis Medical Systems, Inc. Endoscope having detachable imaging device and method of using
US7235773B1 (en) * 2005-04-12 2007-06-26 Itt Manufacturing Enterprises, Inc. Method and apparatus for image signal compensation of dark current, focal plane temperature, and electronics temperature
US7880777B2 (en) * 2005-05-26 2011-02-01 Fluke Corporation Method for fixed pattern noise reduction in infrared imaging cameras
JP4771092B2 (ja) * 2005-06-03 2011-09-14 コニカミノルタホールディングス株式会社 撮像装置
US8057955B2 (en) * 2006-03-31 2011-11-15 Fuelcell Energy, Inc. Wet-seal caulk for carbonate fuel cell
US7702229B2 (en) * 2006-10-18 2010-04-20 Eastman Kodak Company Lens array assisted focus detection
US10337862B2 (en) * 2006-11-30 2019-07-02 Rafael Advanced Defense Systems Ltd. Digital mapping system based on continuous scanning line of sight
JP4885029B2 (ja) * 2007-03-28 2012-02-29 株式会社オーク製作所 露光描画装置
US8064666B2 (en) 2007-04-10 2011-11-22 Avantis Medical Systems, Inc. Method and device for examining or imaging an interior surface of a cavity
DE602007009798D1 (de) * 2007-04-17 2010-11-25 Accenture Global Services Gmbh Sensorennetzwerkkalibrierung
FR2918449B1 (fr) * 2007-07-02 2010-05-21 Ulis Dispositif de detection de rayonnement infrarouge a detecteurs bolometriques
US20090213211A1 (en) * 2007-10-11 2009-08-27 Avantis Medical Systems, Inc. Method and Device for Reducing the Fixed Pattern Noise of a Digital Image
FR2923121B1 (fr) * 2007-10-26 2010-05-14 Trixell Sas Procede de traitement d'images issues d'un detecteur photosensible et detecteur photosensible
ITLE20080007A1 (it) * 2008-02-18 2009-08-19 Donno Angela De Utilizzo e creazione di immagini termografiche per scopi artistici e decorativi.
US8224021B2 (en) 2008-03-14 2012-07-17 Millivision Technologies, Inc. Method and system for automatic detection of a class of objects
US20100044552A1 (en) * 2008-08-19 2010-02-25 Lockheed Martin Corporation Automatic simultaneous dual gain readout integrated circuit using threshold voltage shifts of mosfet bulk to source potential
US9544516B2 (en) 2008-12-26 2017-01-10 Digimarc Corporation Method and apparatus for sensor characterization
CA2749679C (en) 2009-02-09 2017-05-02 Shell Internationale Research Maatschappij B.V. Method of detecting fluid in-flows downhole
JP4854769B2 (ja) * 2009-06-30 2012-01-18 キヤノン株式会社 撮像装置、撮像システム及びそれらの制御方法
CN103310170A (zh) * 2012-03-16 2013-09-18 上海复旦微电子集团股份有限公司 一种非应答方式识别卡片进场的rfid读卡器及识别方法
CN103390147A (zh) * 2012-05-09 2013-11-13 上海复旦微电子集团股份有限公司 Rfid读卡器和提供rfid读卡器时钟源的方法
WO2016168744A1 (en) * 2015-04-17 2016-10-20 Flir Systems, Inc. Imaging device with shutter providing partial attenuation
WO2017073401A1 (ja) 2015-10-29 2017-05-04 富士フイルム株式会社 赤外線撮像装置および赤外線撮像装置による信号補正方法
JP2020530114A (ja) * 2017-08-01 2020-10-15 ナショナル ユニバーシティ オブ シンガポール 気圧計及び気圧分布決定方法
KR102228266B1 (ko) * 2019-02-12 2021-03-18 (주)유우일렉트로닉스 열화상 카메라를 이용한 온도 측정 장치, 방법 및 컴퓨터로 독출 가능한 기록 매체
WO2020217525A1 (ja) * 2019-04-26 2020-10-29 株式会社資生堂 液状体検出装置
US11611692B2 (en) 2020-11-09 2023-03-21 Rockwell Collins, Inc. Fixed pattern noise reduction and high spatial frequency filtering using vari-focus lenses in low contrast scenes
US12231789B1 (en) 2023-08-30 2025-02-18 Volkswagen Aktiengesellschaft Fixed pattern correction for Bayer pattern imager under low light conditions

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5436639B2 (https=) * 1974-05-21 1979-11-10
US4065788A (en) 1976-02-09 1977-12-27 Mcdonnell Douglas Corporation Realtime image processor
GB2147172B (en) 1983-09-21 1986-11-12 British Aerospace Imaging or like apparatus
GB2222738B (en) 1988-09-07 1992-09-23 Secr Defence Correction circuit for infrared detectors
DE4114272A1 (de) 1991-05-02 1992-11-05 Licentia Gmbh Photodetektoranordnung
JPH05149792A (ja) * 1991-11-27 1993-06-15 Mitsubishi Electric Corp 赤外線撮像装置
JP2965777B2 (ja) * 1992-01-29 1999-10-18 オリンパス光学工業株式会社 固体撮像装置
FR2699779B1 (fr) * 1992-12-22 1995-01-27 Thomson Csf Semiconducteurs Détecteur d'image thermique muni de moyens d'élimination du motif de bruit fixe.
US5373151A (en) * 1993-10-04 1994-12-13 Raytheon Company Optical system including focal plane array compensation technique for focusing and periodically defocusing a beam
DE69426253T2 (de) * 1993-10-04 2001-06-21 Raytheon Co., Lexington Optisches System mit Kompensation des Bildebenenarrays
JPH07255014A (ja) * 1994-03-15 1995-10-03 Fujitsu Ltd 撮像装置及びその制御方法
JP3584499B2 (ja) * 1994-09-27 2004-11-04 富士通株式会社 オフセット補正データ自動切替え回路
GB2303988A (en) * 1995-07-31 1997-03-05 Secr Defence Thermal imaging system with detector array calibration mode

Also Published As

Publication number Publication date
CA2304725A1 (en) 1999-04-08
CN1280739A (zh) 2001-01-17
EP1018261B1 (en) 2002-12-11
EP1018261A1 (en) 2000-07-12
GB2344246A (en) 2000-05-31
GB2344247B (en) 2002-08-07
DE69807096D1 (de) 2002-09-12
GB0005527D0 (en) 2000-04-26
US6396045B1 (en) 2002-05-28
DE69807096T2 (de) 2003-03-20
JP2001518759A (ja) 2001-10-16
GB2344247A (en) 2000-05-31
CA2304500A1 (en) 1999-04-08
EP1018260B1 (en) 2002-08-07
DE69810138D1 (de) 2003-01-23
GB2344246B (en) 2001-12-05
WO1999017541A1 (en) 1999-04-08
GB0005418D0 (en) 2000-04-26
JP2001518760A (ja) 2001-10-16
WO1999017542A1 (en) 1999-04-08
DE69810138T2 (de) 2003-07-17
ATE229722T1 (de) 2002-12-15
EP1018260A1 (en) 2000-07-12
US6414294B1 (en) 2002-07-02
CN1280738A (zh) 2001-01-17

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