JP4369454B2 - イオントラップ質量分析方法 - Google Patents

イオントラップ質量分析方法 Download PDF

Info

Publication number
JP4369454B2
JP4369454B2 JP2006239070A JP2006239070A JP4369454B2 JP 4369454 B2 JP4369454 B2 JP 4369454B2 JP 2006239070 A JP2006239070 A JP 2006239070A JP 2006239070 A JP2006239070 A JP 2006239070A JP 4369454 B2 JP4369454 B2 JP 4369454B2
Authority
JP
Japan
Prior art keywords
ion
ions
ion trap
amount
mass spectrometry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2006239070A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008058281A (ja
JP2008058281A5 (enExample
Inventor
博幸 安田
伸治 永井
哲也 西田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Priority to JP2006239070A priority Critical patent/JP4369454B2/ja
Priority to US11/889,232 priority patent/US7989764B2/en
Publication of JP2008058281A publication Critical patent/JP2008058281A/ja
Publication of JP2008058281A5 publication Critical patent/JP2008058281A5/ja
Application granted granted Critical
Publication of JP4369454B2 publication Critical patent/JP4369454B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/4265—Controlling the number of trapped ions; preventing space charge effects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0081—Tandem in time, i.e. using a single spectrometer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2006239070A 2006-09-04 2006-09-04 イオントラップ質量分析方法 Expired - Fee Related JP4369454B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2006239070A JP4369454B2 (ja) 2006-09-04 2006-09-04 イオントラップ質量分析方法
US11/889,232 US7989764B2 (en) 2006-09-04 2007-08-10 Ion trap mass spectrometry method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006239070A JP4369454B2 (ja) 2006-09-04 2006-09-04 イオントラップ質量分析方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009175006A Division JP5107977B2 (ja) 2009-07-28 2009-07-28 イオントラップ質量分析装置

Publications (3)

Publication Number Publication Date
JP2008058281A JP2008058281A (ja) 2008-03-13
JP2008058281A5 JP2008058281A5 (enExample) 2008-07-17
JP4369454B2 true JP4369454B2 (ja) 2009-11-18

Family

ID=39150189

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006239070A Expired - Fee Related JP4369454B2 (ja) 2006-09-04 2006-09-04 イオントラップ質量分析方法

Country Status (2)

Country Link
US (1) US7989764B2 (enExample)
JP (1) JP4369454B2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0624679D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
US8704166B2 (en) 2010-07-27 2014-04-22 Hitachi High-Technologies Corporation Ion trap type mass spectrometer and mass spectrometry
JP5812881B2 (ja) * 2012-01-23 2015-11-17 株式会社日立ハイテクノロジーズ タンデム型質量分析装置及びその質量分析方法
CN104204791B (zh) * 2012-03-22 2016-06-15 株式会社岛津制作所 质量分析装置
US8669520B2 (en) * 2012-07-26 2014-03-11 Hamilton Sundstrand Corporation Waveform generation for ion trap
JP6409987B2 (ja) * 2016-01-18 2018-10-24 株式会社島津製作所 イオントラップ質量分析装置及び該装置を用いた質量分析方法
RU2650497C2 (ru) * 2016-08-15 2018-04-16 Федеральное государственное бюджетное образовательное учреждение высшего образования "Рязанский государственный радиотехнический университет" Способ масс-спектрометрического анализа ионов в трехмерной ионной ловушке и устройство для его осуществления
WO2020075068A1 (en) * 2018-10-09 2020-04-16 Dh Technologies Development Pte. Ltd. Electron beam throttling for electron capture dissociation

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0202943B2 (en) 1985-05-24 2004-11-24 Thermo Finnigan LLC Method of operating an ion trap
US5381007A (en) 1991-02-28 1995-01-10 Teledyne Mec A Division Of Teledyne Industries, Inc. Mass spectrometry method with two applied trapping fields having same spatial form
US5436445A (en) * 1991-02-28 1995-07-25 Teledyne Electronic Technologies Mass spectrometry method with two applied trapping fields having same spatial form
US5479012A (en) 1992-05-29 1995-12-26 Varian Associates, Inc. Method of space charge control in an ion trap mass spectrometer
US5572022A (en) 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
JPH095298A (ja) 1995-06-06 1997-01-10 Varian Assoc Inc 四重極イオントラップ内の選択イオン種を検出する方法
JP3413079B2 (ja) * 1997-10-09 2003-06-03 株式会社日立製作所 イオントラップ型質量分析装置
JP3756365B2 (ja) 1999-12-02 2006-03-15 株式会社日立製作所 イオントラップ質量分析方法
JP2001160373A (ja) * 1999-12-02 2001-06-12 Hitachi Ltd イオントラップ質量分析方法並びにイオントラップ質量分析計
JP2002313276A (ja) * 2001-04-17 2002-10-25 Hitachi Ltd イオントラップ型質量分析装置及び方法
US6608303B2 (en) * 2001-06-06 2003-08-19 Thermo Finnigan Llc Quadrupole ion trap with electronic shims
WO2003019614A2 (en) 2001-08-30 2003-03-06 Mds Inc., Doing Busness As Mds Sciex A method of reducing space charge in a linear ion trap mass spectrometer
JPWO2003041116A1 (ja) * 2001-11-07 2005-03-03 株式会社日立ハイテクノロジーズ 質量分析方法及びイオントラップ質量分析計
WO2003056604A1 (en) * 2001-12-21 2003-07-10 Mds Inc., Doing Business As Mds Sciex Use of notched broadband waveforms in a linear ion trap
US6710336B2 (en) * 2002-01-30 2004-03-23 Varian, Inc. Ion trap mass spectrometer using pre-calculated waveforms for ion isolation and collision induced dissociation
JP3653504B2 (ja) * 2002-02-12 2005-05-25 株式会社日立ハイテクノロジーズ イオントラップ型質量分析装置
JP3971958B2 (ja) * 2002-05-28 2007-09-05 株式会社日立ハイテクノロジーズ 質量分析装置
US7019289B2 (en) * 2003-01-31 2006-03-28 Yang Wang Ion trap mass spectrometry
JP4332482B2 (ja) 2004-09-21 2009-09-16 株式会社日立ハイテクノロジーズ イオントラップ質量分析方法および装置
DE102005061425B4 (de) * 2005-12-22 2009-06-10 Bruker Daltonik Gmbh Rückgesteuerte Fragmentierung in Ionenfallen-Massenspektrometern
US7378653B2 (en) * 2006-01-10 2008-05-27 Varian, Inc. Increasing ion kinetic energy along axis of linear ion processing devices
US7351965B2 (en) * 2006-01-30 2008-04-01 Varian, Inc. Rotating excitation field in linear ion processing apparatus

Also Published As

Publication number Publication date
JP2008058281A (ja) 2008-03-13
US20080054173A1 (en) 2008-03-06
US7989764B2 (en) 2011-08-02

Similar Documents

Publication Publication Date Title
JP5124293B2 (ja) 質量分析計および質量分析方法
JP5603246B2 (ja) 質量分析装置
JP5001965B2 (ja) 質量分析装置
JP4918846B2 (ja) 質量分析装置及び質量分析方法
EP2309531B1 (en) Mass spectrometer
US7956322B2 (en) Mass spectrometer and mass spectrometric analysis method
JP3752470B2 (ja) 質量分析装置
US8164053B2 (en) Mass analyzer and mass analyzing method
JP5481115B2 (ja) 質量分析計及び質量分析方法
CN101213634A (zh) 质谱测定法中的多离子注入
CN108474762B (zh) 离子阱质谱分析装置及使用该装置的质谱分析方法
US20120112054A1 (en) High resolution excitation/isolation of ions in a low pressure linear ion trap
US7989764B2 (en) Ion trap mass spectrometry method
JP5530531B2 (ja) 質量分析装置および質量分析方法
JP5039656B2 (ja) 質量分析装置および質量分析方法
CN107690691A (zh) 陷阱填充时间动态范围增强
JP4996962B2 (ja) 質量分析装置
JP5107977B2 (ja) イオントラップ質量分析装置
JP2005183329A (ja) 質量分析装置及びそのキャリブレーション方法
JP5737144B2 (ja) イオントラップ質量分析装置
JP4332482B2 (ja) イオントラップ質量分析方法および装置
JP2007171200A (ja) イオン断片化パラメータ選択システムおよび方法
CN117716466A (zh) 蛋白质自上而下ecd分析中的内部碎片减少
JP2007179865A (ja) イオントラップ質量分析方法および装置
WO2019211918A1 (ja) 直交加速飛行時間型質量分析装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080530

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20080530

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20081029

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20081111

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090109

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090203

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090406

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090602

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090728

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20090825

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20090827

R150 Certificate of patent or registration of utility model

Ref document number: 4369454

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120904

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130904

Year of fee payment: 4

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees