JP4194110B2 - 磁気カプラ素子および磁気結合型アイソレータ - Google Patents
磁気カプラ素子および磁気結合型アイソレータ Download PDFInfo
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- JP4194110B2 JP4194110B2 JP2007062035A JP2007062035A JP4194110B2 JP 4194110 B2 JP4194110 B2 JP 4194110B2 JP 2007062035 A JP2007062035 A JP 2007062035A JP 2007062035 A JP2007062035 A JP 2007062035A JP 4194110 B2 JP4194110 B2 JP 4194110B2
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- magnetic field
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- magnetic coupler
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B5/00—Near-field transmission systems, e.g. inductive loop type
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/181—Low frequency amplifiers, e.g. audio preamplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/189—High frequency amplifiers, e.g. radio frequency amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
- H03F3/45968—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction
- H03F3/45991—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using balancing means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F5/00—Coils
- H01F5/003—Printed circuit coils
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/03—Indexing scheme relating to amplifiers the amplifier being designed for audio applications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/451—Indexing scheme relating to amplifiers the amplifier being a radio frequency amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/78—A comparator being used in a controlling circuit of an amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45538—Indexing scheme relating to differential amplifiers the IC comprising balancing means, e.g. trimming means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45554—Indexing scheme relating to differential amplifiers the IC comprising one or more coils
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45561—Indexing scheme relating to differential amplifiers the IC being controlled, e.g. by a signal derived from a non specified place in the dif amp circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45576—Indexing scheme relating to differential amplifiers the IC comprising input impedance adapting or controlling means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45591—Indexing scheme relating to differential amplifiers the IC comprising one or more potentiometers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45594—Indexing scheme relating to differential amplifiers the IC comprising one or more resistors, which are not biasing resistor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45621—Indexing scheme relating to differential amplifiers the IC comprising a transformer for phase splitting the input signal
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
Description
図1に、本発明の第1実施形態の磁気結合型アイソレータ1の回路図を示す。磁気結合型アイソレータ1は、磁気カプラ素子2と、差動アンプ3とからなる。
図15および図16に、本シミュレーションに用いた磁気カプラ素子のモデルを示す。図15は、本発明の第1実施形態に基づくモデルであり、図16は、比較のために用いた従来の磁気カプラのモデルである。また、図17および図18、シミュレーションに用いた2種類の差動アンプの特性を示す。図17に示す差動アンプは、800MHzまでに対応する低周波タイプの差動アンプであり、位相オフセットが0.05°、遅れ時間が0.02nsec、総合ゲインが11dBである。また、図18に示す差動アンプは、10GHzまでに対応する高周波タイプの差動アンプであり、位相オフセットが0.006°、遅れ時間が0.001nsec、総合ゲインが20dBである。
2 磁気カプラ素子
3 差動アンプ
4 磁界発生回路
5 検出ブリッジ回路
6,6a,6b 入力端子
7,7a,7b 励磁コイル
8,8a,8b グランド端子
9a,9b 磁気抵抗効果素子
10 固定抵抗
11,11a,11b 電源端子
12a,12b 出力端子
19a,19b 磁気抵抗効果膜
20a,20b 磁気抵抗効果膜
21a,21b 導電接続アーム
22a,22b 導電接続アーム
23a,23b 導電接続アーム
24a,24b 導電接続アーム
27 導電パターン
Claims (10)
- 入力電流に応じて磁界を発生させる磁界発生回路と、
前記磁界発生回路で発生した磁界を印加することで抵抗値が変化する1対の磁気抵抗効果素子を含み、前記磁界発生回路が発生した磁界の強度に応じた電圧差を生じる2つの出力を備える検出ブリッジ回路とを有し、
前記磁界発生回路および前記検出ブリッジ回路は、幾何学形状が線対称または点対称にそれぞれ形成され、
前記磁界発生回路は、電気的に並列に接続された幾何学形状が対称な2つの励磁コイルを含むことを特徴とする磁気カプラ素子。 - 前記2つの励磁コイルは、一端が同じ電極に接続され、前記電極を通る直線について線対称に形成されていることを特徴とする請求項1に記載の磁気カプラ素子。
- 前記磁気抵抗効果素子は、前記磁界発生回路が発生する磁界中に配置された磁気抵抗効果膜と、
前記磁気抵抗効果膜からそれぞれ互いに反対方向に延伸し、軟磁性材料で形成された導電接続アームの対とからなることを特徴とする請求項1または2に記載の磁気カプラ素子。 - 前記検出ブリッジ回路は、1対の固定抵抗を有し、
前記磁気抵抗効果素子と前記固定抵抗とが幾何学的に対称に配置されていることを特徴とする請求項3に記載の磁気カプラ素子。 - 前記固定抵抗は、1対の磁気抵抗効果膜と、該磁気抵抗効果膜からそれぞれ互いに反対方向に延伸し、前記磁界発生回路が発生する磁界中に配置され、非磁性材料で形成された導電接続アームの対とからなることを特徴とする請求項4に記載の磁気カプラ素子。
- 前記検出ブリッジ回路は、前記導電接続アームと前記磁界発生回路の外部で接続された1対の固定抵抗とを有し、
前記1対の前記磁気抵抗効果膜の中点について点対称に形成されていることを特徴とする請求項3に記載の磁気カプラ素子。 - 前記検出ブリッジ回路は、前記導電接続アームと前記磁界発生回路の外部で接続された1対の固定抵抗とを有し、
前記1対の前記磁気抵抗効果膜を結ぶ直線について線対称に形成されていることを特徴とする請求項3に記載の磁気カプラ素子。 - 前記磁気抵抗効果膜は、金属および絶縁体を含むナノグラニュラー材料で形成されていることを特徴とする請求項3から7のいずれかに記載の磁気カプラ素子。
- 請求項1から8のいずれかに記載の磁気カプラ素子と、
前記検出ブリッジ回路の2つの出力の差分を出力する差動アンプとを備えることを特徴とする磁気結合型アイソレータ。 - 前記検出ブリッジ回路の2つの出力をそれぞれ増幅するバッファアンプを備えることを特徴とする請求項9に記載の磁気結合型アイソレータ。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007062035A JP4194110B2 (ja) | 2007-03-12 | 2007-03-12 | 磁気カプラ素子および磁気結合型アイソレータ |
PCT/JP2008/051524 WO2008111336A1 (ja) | 2007-03-12 | 2008-01-31 | 磁気カプラ素子および磁気結合型アイソレータ |
CN2008800081177A CN101632183B (zh) | 2007-03-12 | 2008-01-31 | 磁耦合元件以及磁耦合型隔离器 |
US12/531,042 US8400748B2 (en) | 2007-03-12 | 2008-01-31 | Magnetic coupler device and magnetically coupled isolator |
EP08704271.9A EP2136420A4 (en) | 2007-03-12 | 2008-01-31 | MAGNETIC COUPLER ELEMENT AND MAGNETIC COUPLING ISOLATOR |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007062035A JP4194110B2 (ja) | 2007-03-12 | 2007-03-12 | 磁気カプラ素子および磁気結合型アイソレータ |
Related Child Applications (1)
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JP2008160780A Division JP4194111B1 (ja) | 2008-06-19 | 2008-06-19 | 磁気カプラ素子および磁気結合型アイソレータ |
Publications (2)
Publication Number | Publication Date |
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JP2008227081A JP2008227081A (ja) | 2008-09-25 |
JP4194110B2 true JP4194110B2 (ja) | 2008-12-10 |
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JP2007062035A Expired - Fee Related JP4194110B2 (ja) | 2007-03-12 | 2007-03-12 | 磁気カプラ素子および磁気結合型アイソレータ |
Country Status (5)
Country | Link |
---|---|
US (1) | US8400748B2 (ja) |
EP (1) | EP2136420A4 (ja) |
JP (1) | JP4194110B2 (ja) |
CN (1) | CN101632183B (ja) |
WO (1) | WO2008111336A1 (ja) |
Families Citing this family (16)
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WO2010032824A1 (ja) * | 2008-09-22 | 2010-03-25 | アルプス電気株式会社 | 磁気結合型アイソレータ |
WO2010032825A1 (ja) * | 2008-09-22 | 2010-03-25 | アルプス電気株式会社 | 磁気結合型アイソレータ |
CN102132168B (zh) | 2008-09-29 | 2013-07-24 | 欧姆龙株式会社 | 磁场检测元件及信号传递元件 |
WO2010137090A1 (ja) * | 2009-05-28 | 2010-12-02 | パナソニック株式会社 | 半導体装置 |
US9246486B2 (en) | 2011-12-16 | 2016-01-26 | Apple Inc. | Electronic device with noise-cancelling force sensor |
JP5865108B2 (ja) * | 2012-02-16 | 2016-02-17 | セイコーインスツル株式会社 | 磁気センサ装置 |
WO2014033904A1 (ja) * | 2012-08-31 | 2014-03-06 | 株式会社日立製作所 | 磁気抵抗センサ、グラジオメータ |
US9495899B2 (en) * | 2013-09-25 | 2016-11-15 | Qualcomm Incorporated | Contactless data communication using in-plane magnetic fields, and related systems and methods |
TWI595518B (zh) | 2015-11-04 | 2017-08-11 | 財團法人工業技術研究院 | 電隔離器構裝結構及電隔離器的製造方法 |
TWI573315B (zh) * | 2016-01-19 | 2017-03-01 | 財團法人工業技術研究院 | 電隔離器電路 |
JP2019033159A (ja) * | 2017-08-07 | 2019-02-28 | Tdk株式会社 | 磁気抵抗効果デバイス及び高周波デバイス |
JP7156839B2 (ja) * | 2018-07-09 | 2022-10-19 | アズビル株式会社 | 2線式プロセス装置 |
US11522436B2 (en) | 2019-10-15 | 2022-12-06 | Darrell Schmidt Enterprises, Inc. | Permanently magnetized enhanced generator |
US11296588B2 (en) | 2019-10-15 | 2022-04-05 | Darrell Schmidt Enterprises, Inc. | Magnetic coupler |
TWI737529B (zh) * | 2020-10-30 | 2021-08-21 | 精拓科技股份有限公司 | 數位隔離器 |
US11418026B1 (en) * | 2021-03-22 | 2022-08-16 | International Business Machines Corporation | Electrostatic protection device |
Family Cites Families (13)
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JPS6240786A (ja) * | 1985-08-19 | 1987-02-21 | Fujitsu Ltd | 磁気抵抗素子を用いた磁気結合アイソレ−タ− |
DE4446313A1 (de) * | 1994-12-23 | 1996-06-27 | Teves Gmbh Alfred | Aktiver Sensor mit einem magnetfeldabhängigen Meßelement |
US5831426A (en) | 1996-08-16 | 1998-11-03 | Nonvolatile Electronics, Incorporated | Magnetic current sensor |
US6054780A (en) | 1997-10-23 | 2000-04-25 | Analog Devices, Inc. | Magnetically coupled signal isolator using a Faraday shielded MR or GMR receiving element |
US20030042571A1 (en) | 1997-10-23 | 2003-03-06 | Baoxing Chen | Chip-scale coils and isolators based thereon |
US6300617B1 (en) | 1998-03-04 | 2001-10-09 | Nonvolatile Electronics, Incorporated | Magnetic digital signal coupler having selected/reversal directions of magnetization |
JP2001135537A (ja) * | 1999-11-05 | 2001-05-18 | Honda Motor Co Ltd | 電気信号伝達装置 |
US6376933B1 (en) * | 1999-12-31 | 2002-04-23 | Honeywell International Inc. | Magneto-resistive signal isolator |
FR2809185B1 (fr) * | 2000-05-19 | 2002-08-30 | Thomson Csf | Capteur de champ magnetique utilisant la magneto resistance, et procede de fabrication |
US7046117B2 (en) | 2002-01-15 | 2006-05-16 | Honeywell International Inc. | Integrated magnetic field strap for signal isolator |
JP4285695B2 (ja) * | 2004-03-15 | 2009-06-24 | 財団法人電気磁気材料研究所 | 薄膜磁気センサ及び回転センサ |
JP4105145B2 (ja) * | 2004-11-30 | 2008-06-25 | Tdk株式会社 | 電流センサ |
WO2006098372A1 (ja) * | 2005-03-17 | 2006-09-21 | Omron Corporation | 高周波インターフェース素子 |
-
2007
- 2007-03-12 JP JP2007062035A patent/JP4194110B2/ja not_active Expired - Fee Related
-
2008
- 2008-01-31 US US12/531,042 patent/US8400748B2/en not_active Expired - Fee Related
- 2008-01-31 CN CN2008800081177A patent/CN101632183B/zh not_active Expired - Fee Related
- 2008-01-31 WO PCT/JP2008/051524 patent/WO2008111336A1/ja active Application Filing
- 2008-01-31 EP EP08704271.9A patent/EP2136420A4/en not_active Withdrawn
Also Published As
Publication number | Publication date |
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JP2008227081A (ja) | 2008-09-25 |
EP2136420A4 (en) | 2015-11-04 |
CN101632183A (zh) | 2010-01-20 |
US8400748B2 (en) | 2013-03-19 |
EP2136420A1 (en) | 2009-12-23 |
CN101632183B (zh) | 2012-03-21 |
WO2008111336A1 (ja) | 2008-09-18 |
US20100134944A1 (en) | 2010-06-03 |
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