JP4159473B2 - 導電性ブラシとのローラ接触 - Google Patents

導電性ブラシとのローラ接触 Download PDF

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Publication number
JP4159473B2
JP4159473B2 JP2003557007A JP2003557007A JP4159473B2 JP 4159473 B2 JP4159473 B2 JP 4159473B2 JP 2003557007 A JP2003557007 A JP 2003557007A JP 2003557007 A JP2003557007 A JP 2003557007A JP 4159473 B2 JP4159473 B2 JP 4159473B2
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Japan
Prior art keywords
roller
spool
rolling
conductive
contact
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JP2003557007A
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English (en)
Japanese (ja)
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JP2005514605A5 (https=
JP2005514605A (ja
Inventor
ダグラス、 ジェイ ガルシア、
ドリュー、 アール ヴァーケイド、
Original Assignee
エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド
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Publication of JP2005514605A5 publication Critical patent/JP2005514605A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
JP2003557007A 2001-11-14 2002-11-01 導電性ブラシとのローラ接触 Expired - Lifetime JP4159473B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US33514601P 2001-11-14 2001-11-14
PCT/US2002/035150 WO2003056577A2 (en) 2001-11-14 2002-11-01 Roller contact with conductive brushes

Publications (3)

Publication Number Publication Date
JP2005514605A JP2005514605A (ja) 2005-05-19
JP2005514605A5 JP2005514605A5 (https=) 2005-12-22
JP4159473B2 true JP4159473B2 (ja) 2008-10-01

Family

ID=23310467

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003557007A Expired - Lifetime JP4159473B2 (ja) 2001-11-14 2002-11-01 導電性ブラシとのローラ接触

Country Status (9)

Country Link
US (1) US6714028B2 (https=)
JP (1) JP4159473B2 (https=)
KR (1) KR100921264B1 (https=)
CN (1) CN1582397B (https=)
AU (1) AU2002353973A1 (https=)
DE (1) DE10297410B4 (https=)
GB (1) GB2397702B (https=)
TW (1) TW567512B (https=)
WO (1) WO2003056577A2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102269689B1 (ko) * 2021-04-27 2021-06-24 성연우 유지보수가 용이한 전자부품 검사용 프로브 조립체 및 이를 이용한 전자부품 검사장치

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Publication number Priority date Publication date Assignee Title
TWI223084B (en) * 2002-04-25 2004-11-01 Murata Manufacturing Co Electronic component characteristic measuring device
JP4017586B2 (ja) * 2003-10-29 2007-12-05 三洋電機株式会社 電池の充電方法
FR2872305B1 (fr) * 2004-06-24 2006-09-22 St Microelectronics Sa Procede de controle du fonctionnement d'un regulateur a faible chute de tension et circuit integre correspondant
US7402994B2 (en) * 2004-08-09 2008-07-22 Electro Scientific Industries, Inc. Self-cleaning lower contact
US7905471B2 (en) * 2004-11-22 2011-03-15 Electro Scientific Industries, Inc. Vacuum ring designs for electrical contacting improvement
US7683630B2 (en) * 2006-11-30 2010-03-23 Electro Scientific Industries, Inc. Self test, monitoring, and diagnostics in grouped circuitry modules
US7443179B2 (en) * 2006-11-30 2008-10-28 Electro Scientific Industries, Inc. Zero motion contact actuation
US7602192B2 (en) * 2006-11-30 2009-10-13 Electro Scientific Industries, Inc. Passive station power distribution for cable reduction
US7839138B2 (en) * 2007-01-29 2010-11-23 Electro Scientific Industries, Inc. Adjustable force electrical contactor
GB2452769B (en) * 2007-09-17 2011-06-01 Motorola Inc Device and electrical contact mechanism therefor
JP5326501B2 (ja) * 2008-10-31 2013-10-30 株式会社村田製作所 積層セラミックコンデンサの選別方法
TWI399545B (en) * 2009-03-16 2013-06-21 Detector for testing electric properties of passive components
KR101273611B1 (ko) 2011-11-15 2013-06-11 주식회사 오킨스전자 배터리테스트용 단자접촉장치 및 이를 포함하는 배터리성능테스트 장치
JP6623896B2 (ja) * 2016-03-30 2019-12-25 株式会社村田製作所 電子部品の特性測定装置
US10497521B1 (en) * 2018-10-29 2019-12-03 Xerox Corporation Roller electric contact
CN111927219B (zh) * 2020-09-08 2025-05-06 苏州市运泰利自动化设备有限公司 治具气动锁紧机构
KR102247261B1 (ko) * 2020-12-15 2021-04-30 김상길 내마모성 및 윤활성능이 개선된 전자부품 검사용 회전접촉롤러, 이를 포함하는 프로브 조립체 및 전자부품 검사장치
WO2022225675A1 (en) * 2021-04-22 2022-10-27 Electro Scientific Industries, Inc. Roller contact with reduced contact resistance variation
DE102021209292A1 (de) 2021-08-24 2023-03-02 Montratec Gmbh Vorrichtung zur Energie- und/oder Signalübertragung und Schienenfahrzeug umfassend eine derartige Vorrichtung
DE102022107387A1 (de) 2022-03-29 2023-10-05 Infineon Technologies Ag Eine vorrichtung zum testen von halbleiterbauelementen und ein rollender kontaktgeber zur verwendung in einer solchen vorrichtung

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Publication number Priority date Publication date Assignee Title
US2653298A (en) 1951-04-09 1953-09-22 Brown & Williamson Tobacco Corp Apparatus for measuring moisture content of a traveling layer of material
US3915850A (en) 1973-11-14 1975-10-28 Gti Corp Component handler and method and apparatus utilizing same
US4786876A (en) * 1986-05-30 1988-11-22 Essex Group, Inc. Continuity test method and test card circuit
JPH02128962U (https=) * 1989-03-30 1990-10-24
JPH0471172U (https=) * 1990-10-30 1992-06-24
JPH05196681A (ja) 1991-06-26 1993-08-06 Digital Equip Corp <Dec> 連続移動する電気回路の相互接続試験方法及び装置
US5670878A (en) * 1993-06-21 1997-09-23 Atlantic Richfield Company Inspecting a conductive object with a steady state magnetic field and induced eddy current
US5568870A (en) 1994-08-18 1996-10-29 Testec, Inc. Device for testing and sorting small electronic components
JPH08278328A (ja) * 1995-04-04 1996-10-22 Adtec Eng:Kk なぞり測定装置の集合電極
US6040705A (en) * 1997-08-20 2000-03-21 Electro Scientific Industries, Inc. Rolling electrical contactor
EP0950273A4 (en) * 1997-11-04 2000-10-11 Electro Scient Ind Inc ROLLING MULTIPLE CONTACTS
US6204464B1 (en) * 1998-06-19 2001-03-20 Douglas J. Garcia Electronic component handler
US6100707A (en) 1998-09-25 2000-08-08 Electro Scientific Industries, Inc. Apparatus for testing multi-terminal electronic components
US6194679B1 (en) * 1999-08-06 2001-02-27 Douglas J. Garcia Four electrical contact testing machine for miniature inductors and process of using

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102269689B1 (ko) * 2021-04-27 2021-06-24 성연우 유지보수가 용이한 전자부품 검사용 프로브 조립체 및 이를 이용한 전자부품 검사장치

Also Published As

Publication number Publication date
TW200300560A (en) 2003-06-01
KR100921264B1 (ko) 2009-10-09
WO2003056577A2 (en) 2003-07-10
GB0408542D0 (en) 2004-05-19
WO2003056577A3 (en) 2003-11-20
AU2002353973A1 (en) 2003-07-15
US20030090279A1 (en) 2003-05-15
DE10297410T5 (de) 2004-10-14
AU2002353973A8 (en) 2003-07-15
US6714028B2 (en) 2004-03-30
DE10297410B4 (de) 2012-01-26
JP2005514605A (ja) 2005-05-19
CN1582397B (zh) 2011-04-06
GB2397702A (en) 2004-07-28
CN1582397A (zh) 2005-02-16
KR20040070356A (ko) 2004-08-07
TW567512B (en) 2003-12-21
GB2397702B (en) 2005-06-29

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