JP4154388B2 - 被対象物を透過した電磁波の状態を検出するための検出装置 - Google Patents

被対象物を透過した電磁波の状態を検出するための検出装置 Download PDF

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JP4154388B2
JP4154388B2 JP2004376370A JP2004376370A JP4154388B2 JP 4154388 B2 JP4154388 B2 JP 4154388B2 JP 2004376370 A JP2004376370 A JP 2004376370A JP 2004376370 A JP2004376370 A JP 2004376370A JP 4154388 B2 JP4154388 B2 JP 4154388B2
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terahertz wave
waveguide
substance
gap
parallel plate
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JP2004376370A
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JP2006184078A5 (enExample
JP2006184078A (ja
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信太郎 笠井
敏彦 尾内
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Canon Inc
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Canon Inc
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Priority to JP2004376370A priority Critical patent/JP4154388B2/ja
Priority to EP05844596A priority patent/EP1834170A4/en
Priority to US10/584,800 priority patent/US8039801B2/en
Priority to CN2005800447315A priority patent/CN101088004B/zh
Priority to PCT/JP2005/024017 priority patent/WO2006070852A1/en
Publication of JP2006184078A publication Critical patent/JP2006184078A/ja
Publication of JP2006184078A5 publication Critical patent/JP2006184078A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3577—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2004376370A 2004-12-27 2004-12-27 被対象物を透過した電磁波の状態を検出するための検出装置 Expired - Fee Related JP4154388B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2004376370A JP4154388B2 (ja) 2004-12-27 2004-12-27 被対象物を透過した電磁波の状態を検出するための検出装置
EP05844596A EP1834170A4 (en) 2004-12-27 2005-12-21 DETECTION DEVICE FOR DETECTING AN ELECTROMAGNETIC SHAFT THROUGH A SUBJECT
US10/584,800 US8039801B2 (en) 2004-12-27 2005-12-21 Detection apparatus for detecting electromagnetic wave passed through object
CN2005800447315A CN101088004B (zh) 2004-12-27 2005-12-21 用来探测通过对象的电磁波的探测设备
PCT/JP2005/024017 WO2006070852A1 (en) 2004-12-27 2005-12-21 Detection apparatus for detecting electromagnetic wave passed through object

Applications Claiming Priority (1)

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JP2004376370A JP4154388B2 (ja) 2004-12-27 2004-12-27 被対象物を透過した電磁波の状態を検出するための検出装置

Publications (3)

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JP2006184078A JP2006184078A (ja) 2006-07-13
JP2006184078A5 JP2006184078A5 (enExample) 2006-08-24
JP4154388B2 true JP4154388B2 (ja) 2008-09-24

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JP2004376370A Expired - Fee Related JP4154388B2 (ja) 2004-12-27 2004-12-27 被対象物を透過した電磁波の状態を検出するための検出装置

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US (1) US8039801B2 (enExample)
EP (1) EP1834170A4 (enExample)
JP (1) JP4154388B2 (enExample)
CN (1) CN101088004B (enExample)
WO (1) WO2006070852A1 (enExample)

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Publication number Priority date Publication date Assignee Title
US9553370B2 (en) 2013-03-15 2017-01-24 Nitto Denko Corporation Antenna module and method for manufacturing the same

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JP4800244B2 (ja) * 2007-03-13 2011-10-26 浜松ホトニクス株式会社 テラヘルツ波測定装置
JP4871176B2 (ja) 2007-03-13 2012-02-08 浜松ホトニクス株式会社 全反射テラヘルツ波測定装置
JP5063325B2 (ja) * 2007-12-14 2012-10-31 独立行政法人理化学研究所 キャリア濃度測定装置およびキャリア濃度測定方法
GB2455722A (en) * 2007-12-18 2009-06-24 Hong Siang Tan A spaced plate waveguide probe for dielectric measurement of biological tissue
JP5231538B2 (ja) * 2008-04-30 2013-07-10 浜松ホトニクス株式会社 全反射テラヘルツ波測定装置
US8259022B2 (en) * 2008-05-02 2012-09-04 William Marsh Rice University Ultra low loss waveguide for broadband Terahertz radiation
JP2009288047A (ja) * 2008-05-29 2009-12-10 Epson Toyocom Corp テラヘルツ分光分析用液体セルおよびテラヘルツ分光分析用液体セルの製造方法
US8309925B2 (en) * 2009-09-17 2012-11-13 William Marsh Rice University Resonant cavity integrated into a waveguide for terahertz sensing
JP5521245B2 (ja) * 2010-02-03 2014-06-11 独立行政法人情報通信研究機構 記録情報読出装置
US9035258B2 (en) 2011-01-08 2015-05-19 Canon Kabushiki Kaisha Tomography apparatus and electromagnetic pulse transmitting apparatus
CN102097685A (zh) * 2011-01-15 2011-06-15 广东通宇通讯股份有限公司 基于法布里谐振腔原理的平行板天线
JP2012185151A (ja) * 2011-02-17 2012-09-27 Arkray Inc テラヘルツ波の特性測定方法、物質検出方法、測定用具、テラヘルツ波の特性測定装置、及び物質検出装置
JP6034616B2 (ja) * 2011-09-09 2016-11-30 キヤノン株式会社 導波路及びその製造方法、ならびに電磁波分析装置
JP5957294B2 (ja) 2012-05-29 2016-07-27 浜松ホトニクス株式会社 プリズム部材、テラヘルツ波分光計測装置、及びテラヘルツ波分光計測方法
JP6477693B2 (ja) 2014-05-14 2019-03-06 コニカミノルタ株式会社 検出デバイスおよびその製造方法
US11255768B2 (en) * 2014-06-25 2022-02-22 Halliburton Energy Services, Inc. In situ evaluation of filter parameters with opticoanalytical devices
KR101644799B1 (ko) * 2015-01-30 2016-08-02 한국해양대학교 산학협력단 테라헤르츠파 평행 도파관 센서
EP3220113B1 (en) * 2016-03-16 2019-05-01 Centre National de la Recherche Scientifique - CNRS - Optomechanical transducer for terahertz electromagnetic waves
KR102133543B1 (ko) * 2018-09-20 2020-07-21 홍익대학교 산학협력단 테라 헤르츠 대역에서 금속-절연체-금속 도파관을 해석하는 장치 및 방법
CN113088565B (zh) * 2021-04-26 2023-07-14 中国人民解放军陆军军医大学第一附属医院 一种快速检测microRNA的太赫兹芯片及其检测方法
CN115133246B (zh) * 2022-08-01 2024-10-22 四川太赫兹通信有限公司 太赫兹集成波导腔体、波导结构、辐射计系统及电子设备

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9553370B2 (en) 2013-03-15 2017-01-24 Nitto Denko Corporation Antenna module and method for manufacturing the same

Also Published As

Publication number Publication date
US20090134329A1 (en) 2009-05-28
CN101088004B (zh) 2011-06-15
EP1834170A1 (en) 2007-09-19
US8039801B2 (en) 2011-10-18
EP1834170A4 (en) 2008-01-16
WO2006070852A1 (en) 2006-07-06
CN101088004A (zh) 2007-12-12
JP2006184078A (ja) 2006-07-13

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