JP4053040B2 - 表示装置 - Google Patents
表示装置 Download PDFInfo
- Publication number
- JP4053040B2 JP4053040B2 JP2004500270A JP2004500270A JP4053040B2 JP 4053040 B2 JP4053040 B2 JP 4053040B2 JP 2004500270 A JP2004500270 A JP 2004500270A JP 2004500270 A JP2004500270 A JP 2004500270A JP 4053040 B2 JP4053040 B2 JP 4053040B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- film transistor
- electrode
- display device
- tft
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- 239000010409 thin film Substances 0.000 claims description 66
- 239000010408 film Substances 0.000 claims description 53
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 32
- 238000005401 electroluminescence Methods 0.000 claims description 31
- 239000003990 capacitor Substances 0.000 claims description 30
- 239000004065 semiconductor Substances 0.000 claims description 14
- 239000011159 matrix material Substances 0.000 claims description 13
- 239000003086 colorant Substances 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 description 13
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 229910052782 aluminium Inorganic materials 0.000 description 9
- 239000000463 material Substances 0.000 description 9
- 229910004205 SiNX Inorganic materials 0.000 description 7
- 239000011521 glass Substances 0.000 description 7
- 230000001681 protective effect Effects 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000000206 photolithography Methods 0.000 description 6
- 229910052804 chromium Inorganic materials 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 5
- 229920005591 polysilicon Polymers 0.000 description 5
- 229910052750 molybdenum Inorganic materials 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 229920003986 novolac Polymers 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229920000547 conjugated polymer Polymers 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
Images
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- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
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- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
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- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/14—Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material, or by the simultaneous addition of the electroluminescent material in or onto the light source
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
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- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/417—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
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- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
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- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
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- H10K59/122—Pixel-defining structures or layers, e.g. banks
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
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- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/30—Devices specially adapted for multicolour light emission
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Theoretical Computer Science (AREA)
- Geometry (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Electroluminescent Light Sources (AREA)
Description
2 ゲート信号線
3 ソース信号線
4 電力供給線
5 駆動用TFT
6 制御用TFT
8 ソース電極(駆動用TFT)
9 ドレイン電極(駆動用TFT)
10 ゲート電極(駆動用TFT)
11 ソース電極(制御用TFT)
12 ドレイン電極(制御用TFT)
13 ゲート電極(制御用TFT)
16 発光層
17 バンク層
33 対向電極
34 補助容量
134 補助電極
Claims (16)
- 複数の画素をマトリクス状に配置した表示装置において、各画素内に設けた縦長状の有機エレクトロルミネッセンス素子と、各画素毎に設けるとともに前記有機エレクトロルミネッセンス素子に電流を供給して発光させる駆動用薄膜トランジスタと、前記駆動用薄膜トランジスタの動作を制御する制御用薄膜トランジスタを備え、前記駆動用薄膜トランジスタを横長状に形成して、その長手方向が前記有機エレクトロルミネッセンス素子の長手方向と直交するように配置すると共に、前記駆動用薄膜トランジスタは、ソース電極とドレイン電極のうち一方の電極は直線状に形成され、他方の電極は一方の電極を囲む形状に形成されており、前記駆動用薄膜トランジスタ及び制御用薄膜トランジスタの半導体層がアモルファスシリコンで形成されていることを特徴とする表示装置。
- 複数の画素をマトリクス状に配置した表示装置において、各画素内に設けた縦長状の有機エレクトロルミネッセンス素子と、各画素毎に設けるとともに前記有機エレクトロルミネッセンス素子に電流を供給して発光させる駆動用薄膜トランジスタと、前記駆動用薄膜トランジスタの動作を制御する制御用薄膜トランジスタを備え、前記駆動用薄膜トランジスタを横長状に形成して、その長手方向が前記有機エレクトロルミネッセンス素子の長手方向と直交するように配置すると共に、前記駆動用薄膜トランジスタは、U字状のソース電極と、前記U字状の二又の間に配置されたドレイン電極とを有しており、前記駆動用薄膜トランジスタ及び制御用薄膜トランジスタの半導体層がアモルファスシリコンで形成されていることを特徴とする表示装置。
- 請求項1又は請求項2に記載の表示装置において、
有機エレクトロルミネッセンス素子を縦長状に形成し、前記駆動用薄膜トランジスタを横長状に形成し、前記制御用薄膜トランジスタに接続するゲート信号線とソース信号線をマトリクス状に配置し、前記有機エレクトロルミネッセンス素子をその長手方向が前記ソース信号線と平行になるように配置し、前記駆動用薄膜トランジスタをその長手方向が前記ゲート信号線と平行になるように配置する。 - 請求項3に記載の表示装置において、
前記駆動用薄膜トランジスタはチャネル領域を細長状に形成し、そのチャネル領域の長手方向が前記ゲート信号線と平行になるように配置する。 - 請求項1又は請求項2に記載の表示装置において、
前記制御用薄膜トランジスタは、ソース電極とドレイン電極の互いの一辺が対向する。 - 請求項1又は請求項2に記載の表示装置において、
前記駆動用薄膜トランジスタのチャネル幅は、前記制御用薄膜トランジスタのチャネル幅よりも大きい。 - 請求項1又は請求項2に記載の表示装置において、
マトリクスの行方向の各画素内に設けられた前記制御用薄膜トランジスタのゲート電極に共通に接続されたゲート信号線と、前記駆動用薄膜トランジスタを介して前記有機エレクトロルミネッセンス素子に電流を供給する電力供給線とを行ごとに備え、列方向の各画素内に設けられた前記制御用薄膜トランジスタのソース電極に共通に接続されるとともに前記ゲート信号線に交差するソース信号線を列ごとに備え、前記ゲート信号線と前記ソース信号線とで囲まれた領域内では、平面的に見てソース信号線に沿って有機エレクトロルミネッセンス素子、駆動用薄膜トランジスタ、電力供給線、制御用薄膜トランジスタの順に配置されている。 - 請求項7に記載の表示装置において、
前記駆動用薄膜トランジスタと前記制御用薄膜トランジスタの間には保持容量が設けられ、前記保持容量の一方の電極は電力供給線が兼ね、他方の電極は前記制御用薄膜トランジスタのドレイン電極と接続する補助電極によって形成し、前記補助電極は前記駆動用薄膜トランジスタのゲート電極と電気的に接続されている。 - 請求項7に記載の表示装置において、
異なる色を発する有機エレクトロルミネッセンス素子を備え、その発光色毎に対応した複数の電力供給線を設け、その複数の電力供給線を駆動用薄膜トランジスタと制御用薄膜トランジスタの間に配置し、有機エレクトロルミネッセンス素子には対応する電力供給線からの電流を供給する。 - 請求項7に記載の表示装置において、
前記制御用薄膜トランジスタのゲート電極としてゲート信号線を用い、前記制御用薄膜トランジスタはゲート信号線上に形成されている。 - 請求項1又は請求項2に記載の表示装置において、
前記有機エレクトロルミネッセンス素子の周囲にバンク層が配置されており、前記バンク層は前記駆動用薄膜トランジスタ上にも重なるように形成され、前記有機エレクトロルミネッセンス素子と前記駆動用薄膜トランジスタとの間の前記バンク層に切り欠き部が形成され、少なくとも切り欠き部付近の前記バンク層には遮光性の膜が積層されている。 - 請求項1又は請求項2に記載の表示装置において、
前記有機エレクトロルミネッセンス素子の周囲にバンク層が配置されており、前記バンク層は前記制御用薄膜トランジスタ上にも重なるように形成され、前記有機エレクトロルミネッセンス素子と隣接する画素に設けられた前記制御用薄膜トランジスタとの間の前記バンク層に切り欠き部が形成され、少なくとも切り欠き部付近の前記バンク層には遮光性の膜が積層されている。 - 請求項1又は請求項2に記載の表示装置において、
前記駆動用薄膜トランジスタ及び前記制御用薄膜トランジスタを覆うようにバンク層が形成され、前記バンク層の端縁が駆動用薄膜トランジスタ及び制御用薄膜トランジスタと前記有機エレクトロルミネッセンス素子との間に位置し、前記バンク層には遮光性の膜が積層されている。 - 請求項11乃至請求項13のいずれかに記載の表示装置において、
前記有機エレクトロルミネッセンス素子の発光層の下方に配置されるとともに前記駆動用薄膜トランジスタに接続する画素電極と、前記発光層を挟んで前記画素電極と対向配置するとともに前記バンク層を覆う対向電極とを備え、前記遮光性の膜は前記対向電極により形成されている。 - 請求項1乃至請求項13のいずれかに記載の表示装置において、
前記駆動用薄膜トランジスタと前記制御用薄膜トランジスタはnチャネル型により形成されている。 - 請求項1乃至請求項13のいずれかに記載の表示装置において、
前記駆動用薄膜トランジスタと前記制御用薄膜トランジスタはpチャネル型により形成されている。
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