JP4001700B2 - Casレイテンシー制御回路及びこれを採用したsdram - Google Patents

Casレイテンシー制御回路及びこれを採用したsdram Download PDF

Info

Publication number
JP4001700B2
JP4001700B2 JP33109399A JP33109399A JP4001700B2 JP 4001700 B2 JP4001700 B2 JP 4001700B2 JP 33109399 A JP33109399 A JP 33109399A JP 33109399 A JP33109399 A JP 33109399A JP 4001700 B2 JP4001700 B2 JP 4001700B2
Authority
JP
Japan
Prior art keywords
data
cas latency
signal
control circuit
control signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP33109399A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000163954A (ja
Inventor
金東均
金聖勲
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Hynix Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hynix Semiconductor Inc filed Critical Hynix Semiconductor Inc
Publication of JP2000163954A publication Critical patent/JP2000163954A/ja
Application granted granted Critical
Publication of JP4001700B2 publication Critical patent/JP4001700B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408Address circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1057Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4076Timing circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/106Data output latches
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/10Aspects relating to interfaces of memory device to external buses
    • G11C2207/105Aspects related to pads, pins or terminals
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/18Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
JP33109399A 1998-11-24 1999-11-22 Casレイテンシー制御回路及びこれを採用したsdram Expired - Fee Related JP4001700B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR50441/1998 1998-11-24
KR1019980050441A KR100308119B1 (ko) 1998-11-24 1998-11-24 카스(CAS)레이턴시(Latency)제어회로

Publications (2)

Publication Number Publication Date
JP2000163954A JP2000163954A (ja) 2000-06-16
JP4001700B2 true JP4001700B2 (ja) 2007-10-31

Family

ID=19559487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33109399A Expired - Fee Related JP4001700B2 (ja) 1998-11-24 1999-11-22 Casレイテンシー制御回路及びこれを採用したsdram

Country Status (3)

Country Link
JP (1) JP4001700B2 (de)
KR (1) KR100308119B1 (de)
DE (1) DE19953323B4 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6292428B1 (en) 1998-02-03 2001-09-18 Fujitsu Limited Semiconductor device reconciling different timing signals
KR100428759B1 (ko) * 2001-06-25 2004-04-28 삼성전자주식회사 반도체 메모리 장치 및 이 장치의 데이터 리드 방법
KR100562645B1 (ko) * 2004-10-29 2006-03-20 주식회사 하이닉스반도체 반도체 기억 소자
KR100609621B1 (ko) * 2005-07-19 2006-08-08 삼성전자주식회사 메모리 블락별로 레이턴시 제어가 가능한 동기식 반도체메모리 장치
KR101013555B1 (ko) * 2008-10-09 2011-02-14 주식회사 하이닉스반도체 반도체 패키지 및 이의 제조 방법
JP6054017B2 (ja) * 2011-07-13 2016-12-27 ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. 半導体記憶装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03222192A (ja) * 1990-01-26 1991-10-01 Hitachi Ltd 半導体集積回路装置
US5802005A (en) * 1996-09-23 1998-09-01 Texas Instruments Incorporated Four bit pre-fetch sDRAM column select architecture

Also Published As

Publication number Publication date
KR100308119B1 (ko) 2001-10-20
DE19953323B4 (de) 2008-04-24
JP2000163954A (ja) 2000-06-16
KR20000033542A (ko) 2000-06-15
DE19953323A1 (de) 2000-05-25

Similar Documents

Publication Publication Date Title
KR100240539B1 (ko) 입력 버퍼 회로의 소모 전류가 저감된 동기형 반도체 기억 장치
JP4159402B2 (ja) データストローブ入力バッファ、半導体メモリ装置、データ入力バッファ、および半導体メモリの伝播遅延時間制御方法
US7092299B2 (en) Memory devices, systems and methods using selective on-die termination
JP4823514B2 (ja) データ出力ドライバのインピーダンスを調整することができる半導体メモリ装置
US6324119B1 (en) Data input circuit of semiconductor memory device
KR100559737B1 (ko) 반도체 장치, 반도체 메모리 장치 및 반도체 장치의 데이터스트로브 제어 방법
US20050134304A1 (en) Circiut for performing on-die termination operation in semiconductor memory device and its method
US20050231230A1 (en) On-die termination control circuit and method of generating on-die termination control signal
US6198674B1 (en) Data strobe signal generator of semiconductor device using toggled pull-up and pull-down signals
US20050105363A1 (en) Semiconductor memory device having column address path therein for reducing power consumption
US7230864B2 (en) Circuit for generating data strobe signal of semiconductor memory device
KR0154586B1 (ko) 반도체 기억장치
KR100554845B1 (ko) 반도체 메모리 소자의 dqs 신호 생성 회로 및 그 생성 방법
US6172938B1 (en) Electronic instrument and semiconductor memory device
US6205062B1 (en) CAS latency control circuit
KR100510516B1 (ko) 이중 데이터율 동기식 반도체 장치의 데이터 스트로브신호 발생 회로
JPH09320261A (ja) 半導体記憶装置および制御信号発生回路
US20090115480A1 (en) Clock control circuit and data alignment circuit including the same
US20040057322A1 (en) Data output circuit in combined SDR/DDR semiconductor memory device
JP4001700B2 (ja) Casレイテンシー制御回路及びこれを採用したsdram
KR100650845B1 (ko) 소비 전력을 감소시키는 버퍼 제어 회로와, 이를 포함하는메모리 모듈용 반도체 메모리 장치 및 그 제어 동작 방법
JP4121690B2 (ja) 半導体記憶装置
US6407962B1 (en) Memory module having data switcher in high speed memory device
TWI298162B (en) Power supply control circuit and controlling method thereof
US7813197B2 (en) Write circuit of memory device

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20050715

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20050726

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20051026

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20051031

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20051201

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20060328

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060616

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20061128

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070326

A911 Transfer of reconsideration by examiner before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20070427

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070626

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070627

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070724

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070815

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100824

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100824

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110824

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120824

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130824

Year of fee payment: 6

LAPS Cancellation because of no payment of annual fees