JP3962465B2 - 半導体部材の製造方法 - Google Patents

半導体部材の製造方法 Download PDF

Info

Publication number
JP3962465B2
JP3962465B2 JP34640897A JP34640897A JP3962465B2 JP 3962465 B2 JP3962465 B2 JP 3962465B2 JP 34640897 A JP34640897 A JP 34640897A JP 34640897 A JP34640897 A JP 34640897A JP 3962465 B2 JP3962465 B2 JP 3962465B2
Authority
JP
Japan
Prior art keywords
layer
substrate
porous
film
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP34640897A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10233352A (ja
JPH10233352A5 (enExample
Inventor
清文 坂口
憲二 山方
彰志 西田
隆夫 米原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP34640897A priority Critical patent/JP3962465B2/ja
Publication of JPH10233352A publication Critical patent/JPH10233352A/ja
Publication of JPH10233352A5 publication Critical patent/JPH10233352A5/ja
Application granted granted Critical
Publication of JP3962465B2 publication Critical patent/JP3962465B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Landscapes

  • Photovoltaic Devices (AREA)
  • Recrystallisation Techniques (AREA)
  • Electroluminescent Light Sources (AREA)
JP34640897A 1996-12-18 1997-12-16 半導体部材の製造方法 Expired - Fee Related JP3962465B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34640897A JP3962465B2 (ja) 1996-12-18 1997-12-16 半導体部材の製造方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP8-354342 1996-12-18
JP35434296 1996-12-18
JP34640897A JP3962465B2 (ja) 1996-12-18 1997-12-16 半導体部材の製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2004314042A Division JP3927977B2 (ja) 1996-12-18 2004-10-28 半導体部材の製造方法

Publications (3)

Publication Number Publication Date
JPH10233352A JPH10233352A (ja) 1998-09-02
JPH10233352A5 JPH10233352A5 (enExample) 2005-07-07
JP3962465B2 true JP3962465B2 (ja) 2007-08-22

Family

ID=26578269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34640897A Expired - Fee Related JP3962465B2 (ja) 1996-12-18 1997-12-16 半導体部材の製造方法

Country Status (1)

Country Link
JP (1) JP3962465B2 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000349264A (ja) 1998-12-04 2000-12-15 Canon Inc 半導体ウエハの製造方法、使用方法および利用方法
US6468923B1 (en) 1999-03-26 2002-10-22 Canon Kabushiki Kaisha Method of producing semiconductor member
US6326279B1 (en) 1999-03-26 2001-12-04 Canon Kabushiki Kaisha Process for producing semiconductor article
FR2795866B1 (fr) * 1999-06-30 2001-08-17 Commissariat Energie Atomique Procede de realisation d'une membrane mince et structure a membrane ainsi obtenue
TW508690B (en) 1999-12-08 2002-11-01 Canon Kk Composite member separating method, thin film manufacturing method, and composite member separating apparatus
FR2816445B1 (fr) * 2000-11-06 2003-07-25 Commissariat Energie Atomique Procede de fabrication d'une structure empilee comprenant une couche mince adherant a un substrat cible
FR2817395B1 (fr) * 2000-11-27 2003-10-31 Soitec Silicon On Insulator Procede de fabrication d'un substrat notamment pour l'optique, l'electronique ou l'optoelectronique et substrat obtenu par ce procede
JP4061846B2 (ja) * 2001-01-23 2008-03-19 セイコーエプソン株式会社 積層体の製造方法及び半導体装置の製造方法
FR2823596B1 (fr) 2001-04-13 2004-08-20 Commissariat Energie Atomique Substrat ou structure demontable et procede de realisation
EP1363319B1 (en) 2002-05-17 2009-01-07 Semiconductor Energy Laboratory Co., Ltd. Method of transferring an object and method of manufacturing a semiconductor device
JP4151421B2 (ja) * 2003-01-23 2008-09-17 セイコーエプソン株式会社 デバイスの製造方法
US6759277B1 (en) * 2003-02-27 2004-07-06 Sharp Laboratories Of America, Inc. Crystalline silicon die array and method for assembling crystalline silicon sheets onto substrates
EP1571705A3 (fr) * 2004-03-01 2006-01-04 S.O.I.Tec Silicon on Insulator Technologies Réalisation d'une entité en matériau semiconducteur sur substrat
JP5128781B2 (ja) * 2006-03-13 2013-01-23 信越化学工業株式会社 光電変換素子用基板の製造方法
JP5166745B2 (ja) * 2007-03-07 2013-03-21 信越化学工業株式会社 単結晶シリコン太陽電池の製造方法
JP5065748B2 (ja) * 2007-04-27 2012-11-07 信越化学工業株式会社 貼り合わせウエーハの製造方法
JP5498670B2 (ja) * 2007-07-13 2014-05-21 株式会社半導体エネルギー研究所 半導体基板の作製方法
SG170089A1 (en) 2007-10-29 2011-04-29 Semiconductor Energy Lab Formation method of single crystal semiconductor layer, formation method of crystalline semiconductor layer, formation method of polycrystalline layer, and method for manufacturing semiconductor device
EP2105972A3 (en) 2008-03-28 2015-06-10 Semiconductor Energy Laboratory Co, Ltd. Photoelectric conversion device and method for manufacturing the same
US7947523B2 (en) * 2008-04-25 2011-05-24 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing photoelectric conversion device
WO2009131115A1 (ja) * 2008-04-25 2009-10-29 株式会社アルバック 太陽電池の製造方法,太陽電池の製造装置,及び太陽電池
JP2010050356A (ja) * 2008-08-22 2010-03-04 Shin-Etsu Chemical Co Ltd ヘテロ接合太陽電池の製造方法及びヘテロ接合太陽電池
KR101156437B1 (ko) 2010-01-27 2012-07-03 삼성모바일디스플레이주식회사 레이저 열전사 장치 및 이를 이용한 유기 발광 표시 장치의 제조방법
JP5755931B2 (ja) * 2010-04-28 2015-07-29 株式会社半導体エネルギー研究所 半導体膜の作製方法、電極の作製方法、2次電池の作製方法、および太陽電池の作製方法
EP2702616B1 (en) * 2011-04-29 2022-06-29 Amberwave, Inc. Thin film intermetallic bond
JP5472419B2 (ja) * 2012-10-10 2014-04-16 ソニー株式会社 集積型薄膜素子の製造方法
JP5472420B2 (ja) * 2012-10-10 2014-04-16 ソニー株式会社 集積型薄膜素子の製造方法
WO2017136672A1 (en) * 2016-02-05 2017-08-10 Applied Materials, Inc. Porous silicon structures and laser machining methods for semiconductor wafer processing
CN107742606B (zh) * 2017-10-30 2024-04-02 桂林电子科技大学 一种键合晶圆的结构及其制备方法
JP7230340B2 (ja) * 2018-05-14 2023-03-01 大日本印刷株式会社 配線基板および配線基板の製造方法
KR102327672B1 (ko) * 2020-02-05 2021-11-17 재단법인 멀티스케일 에너지시스템 연구단 접지력이 우수한 구조물 및 이의 제조 방법
KR102358063B1 (ko) * 2020-05-18 2022-02-04 (주)미래컴퍼니 박막 제거 장치 및 박막 제거 방법

Also Published As

Publication number Publication date
JPH10233352A (ja) 1998-09-02

Similar Documents

Publication Publication Date Title
JP3962465B2 (ja) 半導体部材の製造方法
US6100166A (en) Process for producing semiconductor article
JPH10233352A5 (enExample)
US6221738B1 (en) Substrate and production method thereof
US6350702B2 (en) Fabrication process of semiconductor substrate
AU728331B2 (en) Semiconductor substrate and method of manufacturing the same
JP3352340B2 (ja) 半導体基体とその製造方法
JP3257624B2 (ja) 半導体部材の製造方法
US6054363A (en) Method of manufacturing semiconductor article
US20030087503A1 (en) Process for production of semiconductor substrate
KR19980042471A (ko) 반도체물품의 제조방법
JP2000349264A (ja) 半導体ウエハの製造方法、使用方法および利用方法
US20030190794A1 (en) Semiconductor substrate and process for producing the same using a composite member having porous layers and varying thickness and porosity
EP0843346A2 (en) Method of manufacturing a semiconductor article
JP3697052B2 (ja) 基板の製造方法及び半導体膜の製造方法
JP3927977B2 (ja) 半導体部材の製造方法
JPH10326884A (ja) 半導体基板及びその作製方法とその複合部材
JP3542521B2 (ja) 半導体基体及び太陽電池の製造方法と陽極化成装置
JP3293767B2 (ja) 半導体部材の製造方法
JP2002118242A (ja) 半導体部材の製造方法
JPH10326882A (ja) 半導体基板及びその作製方法
JP2001291851A (ja) 半導体部材の製造方法
HK1002571A (en) Fabrication process of a semiconductor substrate

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20041028

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20041028

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20060710

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20061110

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070109

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070129

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070328

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070509

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070521

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100525

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110525

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120525

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120525

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130525

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140525

Year of fee payment: 7

LAPS Cancellation because of no payment of annual fees