JP3925445B2 - 分析機器の制御装置 - Google Patents

分析機器の制御装置 Download PDF

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Publication number
JP3925445B2
JP3925445B2 JP2003087102A JP2003087102A JP3925445B2 JP 3925445 B2 JP3925445 B2 JP 3925445B2 JP 2003087102 A JP2003087102 A JP 2003087102A JP 2003087102 A JP2003087102 A JP 2003087102A JP 3925445 B2 JP3925445 B2 JP 3925445B2
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Prior art keywords
analysis
image data
analytical instrument
log
input
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JP2003087102A
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Japanese (ja)
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JP2004294267A5 (enrdf_load_stackoverflow
JP2004294267A (ja
Inventor
隆幸 木原
年伸 柳沢
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Shimadzu Corp
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Shimadzu Corp
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  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Recording Measured Values (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2003087102A 2003-03-27 2003-03-27 分析機器の制御装置 Expired - Lifetime JP3925445B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003087102A JP3925445B2 (ja) 2003-03-27 2003-03-27 分析機器の制御装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003087102A JP3925445B2 (ja) 2003-03-27 2003-03-27 分析機器の制御装置

Publications (3)

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JP2004294267A JP2004294267A (ja) 2004-10-21
JP2004294267A5 JP2004294267A5 (enrdf_load_stackoverflow) 2005-10-27
JP3925445B2 true JP3925445B2 (ja) 2007-06-06

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JP2003087102A Expired - Lifetime JP3925445B2 (ja) 2003-03-27 2003-03-27 分析機器の制御装置

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JP (1) JP3925445B2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103869008A (zh) * 2012-12-11 2014-06-18 株式会社岛津制作所 分析系统及其控制方法

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4661136B2 (ja) * 2004-08-31 2011-03-30 株式会社島津製作所 測定装置用制御・データ処理装置及びプログラム
JP2008145281A (ja) * 2006-12-11 2008-06-26 Hitachi High-Technologies Corp 自動分析装置
JP5080211B2 (ja) * 2007-11-09 2012-11-21 ベックマン コールター， インコーポレイテッド 分析装置
JP2009121838A (ja) * 2007-11-12 2009-06-04 Hitachi High-Technologies Corp 検体分注装置、および自動分析装置装置
JP5171368B2 (ja) * 2008-04-17 2013-03-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP5066072B2 (ja) * 2008-12-25 2012-11-07 株式会社日立ハイテクノロジーズ 液体クロマトグラフ装置
JP5659456B2 (ja) * 2009-02-05 2015-01-28 東ソー株式会社 液体クロマトグラフ装置
JP5481520B2 (ja) * 2012-05-07 2014-04-23 味の素株式会社 液体クロマトグラフ装置
JP6385062B2 (ja) * 2014-01-17 2018-09-05 株式会社 堀場アドバンスドテクノ 水質計測システム
JP7131288B2 (ja) * 2018-10-16 2022-09-06 株式会社島津製作所 分析装置および分析システム
CN113753977A (zh) * 2021-09-06 2021-12-07 北京思源广泰科技有限公司 一种数据处理方法及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3357158B2 (ja) * 1993-12-22 2002-12-16 日本分光株式会社 システムコントローラを用いた分析装置ユニット
JPH095300A (ja) * 1995-06-22 1997-01-10 Shimadzu Corp 液体クロマトグラフ質量分析装置
JPH10170339A (ja) * 1996-12-12 1998-06-26 Shimadzu Corp 分光光度計
JPH11326304A (ja) * 1998-05-12 1999-11-26 Shimadzu Corp クロマトグラフ用データ処理装置
JP4281220B2 (ja) * 2000-06-22 2009-06-17 株式会社島津製作所 分析機器用データ管理装置
JP2002329004A (ja) * 2002-02-08 2002-11-15 Fujitsu Ltd データ管理装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103869008A (zh) * 2012-12-11 2014-06-18 株式会社岛津制作所 分析系统及其控制方法
CN103869008B (zh) * 2012-12-11 2015-10-28 株式会社岛津制作所 分析系统及其控制方法

Also Published As

Publication number Publication date
JP2004294267A (ja) 2004-10-21

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