JP3916385B2 - コンピュータ断層撮影装置 - Google Patents

コンピュータ断層撮影装置 Download PDF

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Publication number
JP3916385B2
JP3916385B2 JP2000253979A JP2000253979A JP3916385B2 JP 3916385 B2 JP3916385 B2 JP 3916385B2 JP 2000253979 A JP2000253979 A JP 2000253979A JP 2000253979 A JP2000253979 A JP 2000253979A JP 3916385 B2 JP3916385 B2 JP 3916385B2
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Japan
Prior art keywords
calibration
radiation
subject
computed tomography
type
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Expired - Lifetime
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JP2000253979A
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English (en)
Japanese (ja)
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JP2002062268A5 (enExample
JP2002062268A (ja
Inventor
正司 藤井
喜一郎 宇山
輝夫 山本
健治 新井
正明 園田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba IT and Control Systems Corp
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Toshiba IT and Control Systems Corp
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Priority to JP2000253979A priority Critical patent/JP3916385B2/ja
Publication of JP2002062268A publication Critical patent/JP2002062268A/ja
Publication of JP2002062268A5 publication Critical patent/JP2002062268A5/ja
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Publication of JP3916385B2 publication Critical patent/JP3916385B2/ja
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  • Analysing Materials By The Use Of Radiation (AREA)
JP2000253979A 2000-08-24 2000-08-24 コンピュータ断層撮影装置 Expired - Lifetime JP3916385B2 (ja)

Priority Applications (1)

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JP2000253979A JP3916385B2 (ja) 2000-08-24 2000-08-24 コンピュータ断層撮影装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000253979A JP3916385B2 (ja) 2000-08-24 2000-08-24 コンピュータ断層撮影装置

Publications (3)

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JP2002062268A JP2002062268A (ja) 2002-02-28
JP2002062268A5 JP2002062268A5 (enExample) 2006-11-16
JP3916385B2 true JP3916385B2 (ja) 2007-05-16

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ID=18743001

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JP2000253979A Expired - Lifetime JP3916385B2 (ja) 2000-08-24 2000-08-24 コンピュータ断層撮影装置

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JP (1) JP3916385B2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3918932B2 (ja) * 2002-11-29 2007-05-23 株式会社島津製作所 Ｘ線ｃｔ装置における中心軸較正治具およびこの治具を用いた較正方法
JP3969337B2 (ja) * 2003-04-15 2007-09-05 株式会社島津製作所 バンプ検査装置
JP4494804B2 (ja) * 2004-01-08 2010-06-30 東芝Ｉｔコントロールシステム株式会社 コンピュータ断層撮影装置
JP4537090B2 (ja) * 2004-02-19 2010-09-01 東芝Ｉｔコントロールシステム株式会社 トモシンセシス装置
JP4504743B2 (ja) * 2004-06-17 2010-07-14 東芝Ｉｔコントロールシステム株式会社 コンピュータ断層撮影装置
JP4851076B2 (ja) * 2004-09-17 2012-01-11 株式会社島津製作所 コーンビームｃｔ装置
US7792242B2 (en) 2004-11-12 2010-09-07 Shimadzu Corporation X-ray CT system and X-ray CT method
CN101057135B (zh) * 2004-11-12 2011-01-12 株式会社岛津制作所 X射线ct系统及x射线ct方法
CN101071111B (zh) * 2006-05-08 2011-05-11 清华大学 一种多视角航空集装箱安全检查系统及方法
JP5522345B2 (ja) * 2009-02-10 2014-06-18 東芝Ｉｔコントロールシステム株式会社 Ｃｔ装置およびｃｔ装置の較正方法
JP2011095227A (ja) * 2009-11-02 2011-05-12 Saki Corp:Kk 被検査体の放射線検査装置
US8693631B2 (en) * 2011-08-29 2014-04-08 General Electric Company Craser device, imaging system and method
KR101263751B1 (ko) 2012-12-07 2013-05-13 주식회사 이이더불유코리아 X선 비파괴 검사용 필름지지장치
CN105167796A (zh) * 2015-09-30 2015-12-23 浙江大学 多功能锥束ct成像系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0692886B2 (ja) * 1990-01-10 1994-11-16 新日本製鐵株式会社 Ｘ線ｃｔ装置
JPH0666739A (ja) * 1992-08-17 1994-03-11 Hitachi Plant Eng & Constr Co Ltd 鮪の品質判定方法
US5600574A (en) * 1994-05-13 1997-02-04 Minnesota Mining And Manufacturing Company Automated image quality control
JP3763611B2 (ja) * 1996-07-12 2006-04-05 株式会社東芝 Ｘ線ｃｔスキャナ
DE19837442A1 (de) * 1998-08-18 2000-03-02 Siemens Ag CT-Gerät

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Publication number Publication date
JP2002062268A (ja) 2002-02-28

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