JP3830836B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP3830836B2
JP3830836B2 JP2002062277A JP2002062277A JP3830836B2 JP 3830836 B2 JP3830836 B2 JP 3830836B2 JP 2002062277 A JP2002062277 A JP 2002062277A JP 2002062277 A JP2002062277 A JP 2002062277A JP 3830836 B2 JP3830836 B2 JP 3830836B2
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JP
Japan
Prior art keywords
reagent
sample
disk
rack
automatic analyzer
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP2002062277A
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English (en)
Japanese (ja)
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JP2003262642A5 (enExample
JP2003262642A (ja
Inventor
満 大沼
裕康 内田
武志 渋谷
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2002062277A priority Critical patent/JP3830836B2/ja
Publication of JP2003262642A publication Critical patent/JP2003262642A/ja
Publication of JP2003262642A5 publication Critical patent/JP2003262642A5/ja
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Publication of JP3830836B2 publication Critical patent/JP3830836B2/ja
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Expired - Lifetime legal-status Critical Current

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JP2002062277A 2002-03-07 2002-03-07 自動分析装置 Expired - Lifetime JP3830836B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002062277A JP3830836B2 (ja) 2002-03-07 2002-03-07 自動分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002062277A JP3830836B2 (ja) 2002-03-07 2002-03-07 自動分析装置

Publications (3)

Publication Number Publication Date
JP2003262642A JP2003262642A (ja) 2003-09-19
JP2003262642A5 JP2003262642A5 (enExample) 2005-09-02
JP3830836B2 true JP3830836B2 (ja) 2006-10-11

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JP2002062277A Expired - Lifetime JP3830836B2 (ja) 2002-03-07 2002-03-07 自動分析装置

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JP (1) JP3830836B2 (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3931150B2 (ja) * 2003-03-19 2007-06-13 株式会社日立ハイテクノロジーズ 自動分析装置
JP4130905B2 (ja) * 2003-06-23 2008-08-13 株式会社日立ハイテクノロジーズ 自動分析装置
JP3848938B2 (ja) * 2003-07-25 2006-11-22 株式会社日立ハイテクノロジーズ 自動分析装置
DE102005042214A1 (de) * 2005-09-05 2007-03-22 Leica Microsystems Nussloch Gmbh Aufnahme- und Übergabestation für eingedeckte Objektträger
JP2007303879A (ja) * 2006-05-09 2007-11-22 Olympus Corp 試薬補充装置
JP4851266B2 (ja) 2006-06-30 2012-01-11 シスメックス株式会社 試料分析装置
JP5009684B2 (ja) * 2006-06-30 2012-08-22 シスメックス株式会社 試料分析装置
JP4843416B2 (ja) * 2006-08-31 2011-12-21 Ｊｕｋｉ株式会社 試薬置場
JP4752712B2 (ja) * 2006-10-10 2011-08-17 株式会社島津製作所 自動分析装置
JP4500822B2 (ja) * 2007-02-19 2010-07-14 株式会社日立ハイテクノロジーズ 自動分析装置
JP5280882B2 (ja) * 2008-06-30 2013-09-04 シスメックス株式会社 分析装置
JP5544200B2 (ja) * 2009-03-30 2014-07-09 株式会社日立ハイテクノロジーズ 自動分析装置
JP2012021862A (ja) * 2010-07-14 2012-02-02 Hitachi High-Technologies Corp 自動分析装置
JP5894168B2 (ja) * 2011-09-09 2016-03-23 株式会社日立ハイテクノロジーズ 自動分析装置及びそのメンテナンス方法
JP5828728B2 (ja) * 2011-09-28 2015-12-09 株式会社日立ハイテクノロジーズ 自動分析装置
JP5808634B2 (ja) * 2011-09-30 2015-11-10 シスメックス株式会社 検体処理装置
JP5839987B2 (ja) * 2011-12-26 2016-01-06 株式会社日立ハイテクノロジーズ 自動分析装置
JP6034051B2 (ja) * 2012-04-25 2016-11-30 東芝メディカルシステムズ株式会社 自動分析装置
ES2747428T3 (es) * 2012-11-12 2020-03-10 Siemens Healthcare Diagnostics Products Gmbh Estación de reactivos para un aparato de análisis automático
JP5829643B2 (ja) * 2013-03-29 2015-12-09 シスメックス株式会社 分析装置
JP5851659B2 (ja) * 2013-06-17 2016-02-03 株式会社日立ハイテクノロジーズ 自動分析装置
JP6348816B2 (ja) * 2014-09-30 2018-06-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP6347852B2 (ja) * 2014-11-25 2018-06-27 株式会社日立ハイテクノロジーズ 自動分析装置
EP3594691A4 (en) * 2017-03-07 2020-12-30 Hitachi High-Tech Corporation AUTOMATIC ANALYZER
EP3690447B1 (en) * 2017-09-01 2022-04-20 Hitachi High-Tech Corporation Connection module and methods for avoiding interference
JP7010768B2 (ja) 2018-06-06 2022-02-10 株式会社日立ハイテク 自動分析装置および試料の搬送方法
JP7053898B2 (ja) * 2019-01-25 2022-04-13 株式会社日立ハイテク 自動分析システムおよび検体の搬送方法

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JP2003262642A (ja) 2003-09-19

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