JP3795685B2 - トライステート感知回路とこれを備える信号発生回路 - Google Patents

トライステート感知回路とこれを備える信号発生回路 Download PDF

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Publication number
JP3795685B2
JP3795685B2 JP33634898A JP33634898A JP3795685B2 JP 3795685 B2 JP3795685 B2 JP 3795685B2 JP 33634898 A JP33634898 A JP 33634898A JP 33634898 A JP33634898 A JP 33634898A JP 3795685 B2 JP3795685 B2 JP 3795685B2
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Japan
Prior art keywords
signal
response
output signal
unit
activated
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Expired - Fee Related
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JP33634898A
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Japanese (ja)
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JP2000013202A (ja
Inventor
金昌▲ひゅん▼
宋基煥
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Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Publication of JP2000013202A publication Critical patent/JP2000013202A/ja
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Publication of JP3795685B2 publication Critical patent/JP3795685B2/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Logic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Manipulation Of Pulses (AREA)
JP33634898A 1998-05-29 1998-11-26 トライステート感知回路とこれを備える信号発生回路 Expired - Fee Related JP3795685B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019980019805A KR100304691B1 (ko) 1998-05-29 1998-05-29 트라이스테이트 보상회로를구비하는 출력신호 발생회로
KR98-19805 1998-05-29

Publications (2)

Publication Number Publication Date
JP2000013202A JP2000013202A (ja) 2000-01-14
JP3795685B2 true JP3795685B2 (ja) 2006-07-12

Family

ID=19537907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33634898A Expired - Fee Related JP3795685B2 (ja) 1998-05-29 1998-11-26 トライステート感知回路とこれを備える信号発生回路

Country Status (6)

Country Link
US (2) US6184701B1 (fr)
EP (1) EP0961410B1 (fr)
JP (1) JP3795685B2 (fr)
KR (1) KR100304691B1 (fr)
DE (1) DE69909375T2 (fr)
TW (1) TW461184B (fr)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100304691B1 (ko) 1998-05-29 2001-09-29 윤종용 트라이스테이트 보상회로를구비하는 출력신호 발생회로
US6515517B1 (en) * 2001-06-07 2003-02-04 Cypress Semiconductor Corp. Discriminator circuit
US6498513B1 (en) 2001-06-07 2002-12-24 Cypress Semiconductor Corp. Metastability recovery circuit
US6826642B1 (en) 2001-06-07 2004-11-30 Cypress Semiconductor Corp. Method and apparatus for the use of discriminators for priority arbitration
US6674306B1 (en) * 2001-06-07 2004-01-06 Cypress Semiconductor Corp. Multiport arbitration using phased locking arbiters
US6611154B2 (en) * 2001-07-02 2003-08-26 International Rectifier Corporation Circuit for improving noise immunity by DV/DT boosting
US6798185B2 (en) * 2002-06-28 2004-09-28 International Business Machines Corporation Method and apparatus for testing analog to digital converters
US6927604B2 (en) * 2003-08-21 2005-08-09 International Business Machines Corporation Clock signal selector circuit with reduced probability of erroneous output due to metastability
FR2863420B1 (fr) * 2003-12-05 2006-04-07 St Microelectronics Sa Dispositif de neutralisation a la mise sous tension
US6998896B1 (en) 2004-04-21 2006-02-14 Lattice Semiconductor Corporation Dynamic gain adjustment systems and methods for metastability resistance
US7403052B1 (en) * 2006-10-02 2008-07-22 National Semiconductor Corporation Power-on detect by measuring thermal voltage
US9128632B2 (en) 2009-07-16 2015-09-08 Netlist, Inc. Memory module with distributed data buffers and method of operation
US7928768B1 (en) * 2009-09-28 2011-04-19 Altera Corporation Apparatus for metastability-hardened storage circuits and associated methods
US8289050B2 (en) * 2010-09-21 2012-10-16 Micron Technology, Inc. Switching circuits, latches and methods
US8482449B1 (en) 2012-07-30 2013-07-09 Lsi Corporation Analog-to-digital converter with metastability detector
US10324841B2 (en) 2013-07-27 2019-06-18 Netlist, Inc. Memory module with local synchronization
US9252751B2 (en) 2014-05-04 2016-02-02 Freescale Semiconductor, Inc. Apparatus and method for preventing multiple resets
US9329210B1 (en) 2014-11-29 2016-05-03 Freescale Semiocnductor, Inc. Voltage monitoring circuit
TWI554042B (zh) 2014-12-08 2016-10-11 財團法人工業技術研究院 訊號比較裝置及其控制方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4282489A (en) * 1979-05-14 1981-08-04 Harris Data Communications Inc. Metastable detector
US5187385A (en) * 1986-08-29 1993-02-16 Kabushiki Kaisha Toshiba Latch circuit including filter for metastable prevention
JPH02100414A (ja) * 1988-10-06 1990-04-12 Nec Corp 中間レベル検出回路
US5036221A (en) * 1989-03-31 1991-07-30 Texas Instruments Incorporated Circuit for eliminating metastable events associated with a data signal asynchronous to a clock signal
US4982118A (en) * 1989-12-13 1991-01-01 Tektronix, Inc. Data acquisition system having a metastable sense feature
US5017814A (en) * 1989-12-13 1991-05-21 Tektronix, Inc. Metastable sense circuit
US5081377A (en) * 1990-09-21 1992-01-14 At&T Bell Laboratories Latch circuit with reduced metastability
US5122694A (en) * 1990-12-26 1992-06-16 Tektronix, Inc. Method and electrical circuit for eliminating time jitter caused by metastable conditions in asynchronous logic circuits
US5166561A (en) * 1991-07-25 1992-11-24 Northern Telecom Limited Active intelligent termination
US5256914A (en) * 1991-10-03 1993-10-26 National Semiconductor Corporation Short circuit protection circuit and method for output buffers
US5489865A (en) * 1992-02-28 1996-02-06 Media Vision, Inc. Circuit for filtering asynchronous metastability of cross-coupled logic gates
US5510732A (en) * 1994-08-03 1996-04-23 Sun Microsystems, Inc. Synchronizer circuit and method for reducing the occurrence of metastability conditions in digital systems
US5598113A (en) * 1995-01-19 1997-01-28 Intel Corporation Fully asynchronous interface with programmable metastability settling time synchronizer
US5789945A (en) * 1996-02-27 1998-08-04 Philips Electronics North America Corporation Method and circuit for improving metastable resolving time in low-power multi-state devices
US5754070A (en) * 1996-11-19 1998-05-19 Vlsi Technology, Inc. Metastableproof flip-flop
KR100304691B1 (ko) 1998-05-29 2001-09-29 윤종용 트라이스테이트 보상회로를구비하는 출력신호 발생회로

Also Published As

Publication number Publication date
KR100304691B1 (ko) 2001-09-29
KR19990086693A (ko) 1999-12-15
EP0961410B1 (fr) 2003-07-09
EP0961410A3 (fr) 2001-02-07
DE69909375D1 (de) 2003-08-14
DE69909375T2 (de) 2004-05-27
TW461184B (en) 2001-10-21
US6384619B1 (en) 2002-05-07
JP2000013202A (ja) 2000-01-14
EP0961410A2 (fr) 1999-12-01
US6184701B1 (en) 2001-02-06

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