JP3690801B2 - 接触ピン - Google Patents
接触ピン Download PDFInfo
- Publication number
- JP3690801B2 JP3690801B2 JP2004333576A JP2004333576A JP3690801B2 JP 3690801 B2 JP3690801 B2 JP 3690801B2 JP 2004333576 A JP2004333576 A JP 2004333576A JP 2004333576 A JP2004333576 A JP 2004333576A JP 3690801 B2 JP3690801 B2 JP 3690801B2
- Authority
- JP
- Japan
- Prior art keywords
- plate
- contact pin
- contact
- hole
- end portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Description
110 接触ピン
110a 先端部
110b 基端部
110c 絶縁被覆
110d ワイヤ本体
110e 段部
120 ヘッド部
121 Aプレート
122 Bプレート
123 Cプレート
124 Dプレート
125 Eプレート
126、127 固定手段
128 保持手段
129 位置決めピン
130 電極部
131 ベース基板
131a 第1孔部
131b 第2孔部
132 導電線
133 導電層
Claims (2)
- 検査対象に対する電気的な接触を得て、上記検査対象の電気的特性を検査する検査冶具のヘッド部に保持されて用いられる可撓性および弾性を有する接触ピンであって、
上記検査対象に接触すべき先端部と、検査回路に導電接続される接続電極に接触すべき基端部と、を備える1本のワイヤ本体と、
上記ワイヤ本体の上記先端部および上記基端部の各外周を除いた中央部外周に設けられた絶縁被覆と、
上記ワイヤ本体の上記先端部および上記基端部と上記絶縁被覆との境界位置に形成され、上記絶縁被覆の端部となると共に上記ヘッド部の両面側にそれぞれ設けられる小径の保持孔より内側に配置される段部と、
を有し、上記保持孔への挿入および上記保持孔からの抜き取りが可能となるように、上記絶縁被覆部分の外径が上記保持孔の内径より小さくされていることを特徴とする接触ピン。 - 前記ワイヤ本体は、タングステンで構成された金属ワイヤとされ、前記絶縁被覆は、ウレタン樹脂で構成されることを特徴とする請求項1記載の接触ピン。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004333576A JP3690801B2 (ja) | 2004-11-17 | 2004-11-17 | 接触ピン |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004333576A JP3690801B2 (ja) | 2004-11-17 | 2004-11-17 | 接触ピン |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002022873A Division JP3690796B2 (ja) | 2002-01-31 | 2002-01-31 | 検査冶具及びその製造方法並びに回路基板の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005099037A JP2005099037A (ja) | 2005-04-14 |
JP3690801B2 true JP3690801B2 (ja) | 2005-08-31 |
Family
ID=34464359
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004333576A Expired - Fee Related JP3690801B2 (ja) | 2004-11-17 | 2004-11-17 | 接触ピン |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3690801B2 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100975808B1 (ko) | 2007-04-17 | 2010-08-13 | 니혼덴산리드가부시키가이샤 | 기판검사용 치구 |
JP2015004518A (ja) * | 2013-06-19 | 2015-01-08 | 大西電子株式会社 | 検査治具 |
-
2004
- 2004-11-17 JP JP2004333576A patent/JP3690801B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2005099037A (ja) | 2005-04-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101012083B1 (ko) | 도전성 접촉자 및 도전성 접촉자의 제조방법 | |
JP2005338065A (ja) | 検査冶具および検査装置 | |
KR100824394B1 (ko) | 검사 지그 및 검사 장치 | |
JP5027522B2 (ja) | プローブユニット及びそのプローブユニットを用いたコンタクトプローブの使用方法 | |
JP3690796B2 (ja) | 検査冶具及びその製造方法並びに回路基板の製造方法 | |
WO2018193832A1 (ja) | 電気的接続装置 | |
JP3690801B2 (ja) | 接触ピン | |
JP3690800B2 (ja) | 検査冶具 | |
JP2005106482A (ja) | 接続ピン | |
US7316065B2 (en) | Method for fabricating a plurality of elastic probes in a row | |
JP2010078432A (ja) | 基板検査治具及び接触子 | |
KR100583794B1 (ko) | 도전성 접촉자 및 전기 프로브 유닛 | |
JPWO2008081704A1 (ja) | プローブユニットの配線固定方法およびプローブユニット | |
US5819410A (en) | Method for manufacturing a pin and pipe assembly for a bare chip testing socket | |
JPH1038922A (ja) | プローブピン装置 | |
JP6546765B2 (ja) | 電気部品用ソケット | |
JP2009047636A (ja) | プリント配線板の導通検査治具 | |
JPH06100635B2 (ja) | 配線板の検査装置のテストヘッド | |
JP2006010588A (ja) | コンタクトプローブおよびその製造方法 | |
KR100897494B1 (ko) | 프로브 유닛의 탐침 결합체 | |
JP4838658B2 (ja) | 基板検査用治具及び基板検査用治具の電極部構造 | |
JP2007012886A (ja) | プリント配線板の製造方法 | |
JP2003303657A (ja) | Icソケット、ソケットボード、接続電極、及び接続電極製造方法 | |
JP2010276359A (ja) | 基板検査装置用検査治具 | |
JPH09236619A (ja) | 縦型プローブカード |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20050111 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050310 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20050531 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20050613 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 3690801 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080624 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090624 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100624 Year of fee payment: 5 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110624 Year of fee payment: 6 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110624 Year of fee payment: 6 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120624 Year of fee payment: 7 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130624 Year of fee payment: 8 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |