JP3348299B2 - リード位置検査方法及び検査装置 - Google Patents

リード位置検査方法及び検査装置

Info

Publication number
JP3348299B2
JP3348299B2 JP30068192A JP30068192A JP3348299B2 JP 3348299 B2 JP3348299 B2 JP 3348299B2 JP 30068192 A JP30068192 A JP 30068192A JP 30068192 A JP30068192 A JP 30068192A JP 3348299 B2 JP3348299 B2 JP 3348299B2
Authority
JP
Japan
Prior art keywords
package
lead
coordinates
semiconductor
coordinate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP30068192A
Other languages
English (en)
Japanese (ja)
Other versions
JPH06129824A (ja
Inventor
隆 斎藤
博 冨谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP30068192A priority Critical patent/JP3348299B2/ja
Priority to TW082108342A priority patent/TW251382B/zh
Priority to KR1019930021151A priority patent/KR100229245B1/ko
Publication of JPH06129824A publication Critical patent/JPH06129824A/ja
Application granted granted Critical
Publication of JP3348299B2 publication Critical patent/JP3348299B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Image Processing (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Image Analysis (AREA)
JP30068192A 1992-10-14 1992-10-14 リード位置検査方法及び検査装置 Expired - Fee Related JP3348299B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP30068192A JP3348299B2 (ja) 1992-10-14 1992-10-14 リード位置検査方法及び検査装置
TW082108342A TW251382B (enExample) 1992-10-14 1993-10-08
KR1019930021151A KR100229245B1 (ko) 1992-10-14 1993-10-13 리드위치검사방법 및 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30068192A JP3348299B2 (ja) 1992-10-14 1992-10-14 リード位置検査方法及び検査装置

Publications (2)

Publication Number Publication Date
JPH06129824A JPH06129824A (ja) 1994-05-13
JP3348299B2 true JP3348299B2 (ja) 2002-11-20

Family

ID=17887799

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30068192A Expired - Fee Related JP3348299B2 (ja) 1992-10-14 1992-10-14 リード位置検査方法及び検査装置

Country Status (3)

Country Link
JP (1) JP3348299B2 (enExample)
KR (1) KR100229245B1 (enExample)
TW (1) TW251382B (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4495473B2 (ja) * 2004-01-21 2010-07-07 Ｈｏｙａ株式会社 検査システム
CN109737887A (zh) * 2018-12-17 2019-05-10 电子科技大学 基于机器视觉的智能检测选配平台

Also Published As

Publication number Publication date
TW251382B (enExample) 1995-07-11
KR940009664A (ko) 1994-05-20
KR100229245B1 (ko) 1999-12-01
JPH06129824A (ja) 1994-05-13

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