JP2517456Y2 - アナログｉｃテスタの校正用治具 - Google Patents

アナログｉｃテスタの校正用治具

Info

Publication number
JP2517456Y2
JP2517456Y2 JP4229690U JP4229690U JP2517456Y2 JP 2517456 Y2 JP2517456 Y2 JP 2517456Y2 JP 4229690 U JP4229690 U JP 4229690U JP 4229690 U JP4229690 U JP 4229690U JP 2517456 Y2 JP2517456 Y2 JP 2517456Y2
Authority
JP
Japan
Prior art keywords
analog
under test
tester
signal
dut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP4229690U
Other languages
English (en)
Japanese (ja)
Other versions
JPH043370U (enrdf_load_stackoverflow
Inventor
博幸 青木
信介 関
靖夫 杉岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP4229690U priority Critical patent/JP2517456Y2/ja
Publication of JPH043370U publication Critical patent/JPH043370U/ja
Application granted granted Critical
Publication of JP2517456Y2 publication Critical patent/JP2517456Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP4229690U 1990-04-20 1990-04-20 アナログｉｃテスタの校正用治具 Expired - Fee Related JP2517456Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4229690U JP2517456Y2 (ja) 1990-04-20 1990-04-20 アナログｉｃテスタの校正用治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4229690U JP2517456Y2 (ja) 1990-04-20 1990-04-20 アナログｉｃテスタの校正用治具

Publications (2)

Publication Number Publication Date
JPH043370U JPH043370U (enrdf_load_stackoverflow) 1992-01-13
JP2517456Y2 true JP2517456Y2 (ja) 1996-11-20

Family

ID=31553718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4229690U Expired - Fee Related JP2517456Y2 (ja) 1990-04-20 1990-04-20 アナログｉｃテスタの校正用治具

Country Status (1)

Country Link
JP (1) JP2517456Y2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005026759A1 (ja) * 2003-09-09 2005-03-24 Advantest Corporation キャリブレーション用比較回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005026759A1 (ja) * 2003-09-09 2005-03-24 Advantest Corporation キャリブレーション用比較回路

Also Published As

Publication number Publication date
JPH043370U (enrdf_load_stackoverflow) 1992-01-13

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