JP2505822Y2 - 回路検査装置 - Google Patents

回路検査装置

Info

Publication number
JP2505822Y2
JP2505822Y2 JP8693790U JP8693790U JP2505822Y2 JP 2505822 Y2 JP2505822 Y2 JP 2505822Y2 JP 8693790 U JP8693790 U JP 8693790U JP 8693790 U JP8693790 U JP 8693790U JP 2505822 Y2 JP2505822 Y2 JP 2505822Y2
Authority
JP
Japan
Prior art keywords
contact
probe
chip
circuit inspection
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP8693790U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0444200U (nl
Inventor
鋼 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd filed Critical Yokowo Co Ltd
Priority to JP8693790U priority Critical patent/JP2505822Y2/ja
Publication of JPH0444200U publication Critical patent/JPH0444200U/ja
Application granted granted Critical
Publication of JP2505822Y2 publication Critical patent/JP2505822Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Combinations Of Printed Boards (AREA)
JP8693790U 1990-08-20 1990-08-20 回路検査装置 Expired - Lifetime JP2505822Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8693790U JP2505822Y2 (ja) 1990-08-20 1990-08-20 回路検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8693790U JP2505822Y2 (ja) 1990-08-20 1990-08-20 回路検査装置

Publications (2)

Publication Number Publication Date
JPH0444200U JPH0444200U (nl) 1992-04-15
JP2505822Y2 true JP2505822Y2 (ja) 1996-08-07

Family

ID=31818882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8693790U Expired - Lifetime JP2505822Y2 (ja) 1990-08-20 1990-08-20 回路検査装置

Country Status (1)

Country Link
JP (1) JP2505822Y2 (nl)

Also Published As

Publication number Publication date
JPH0444200U (nl) 1992-04-15

Similar Documents

Publication Publication Date Title
CN100442068C (zh) 测试被测体的电气特性的测试方法及测试装置
WO1996035129A1 (en) Method and apparatus for testing semiconductor dice
JP2002062315A (ja) コンタクトストラクチャ
US4928061A (en) Multi-layer printed circuit board
US5977784A (en) Method of performing an operation on an integrated circuit
US6249114B1 (en) Electronic component continuity inspection method and apparatus
KR101469222B1 (ko) 반도체 패키지 테스트 소켓용 필름형 컨택부재, 필름형 컨택복합체 및 이를 포함하는 소켓
WO1998018015A1 (en) Apparatus for testing of printed circuit boards
JP2505822Y2 (ja) 回路検査装置
KR20180092027A (ko) 프로브 카드 어셈블리
US6025733A (en) Semiconductor memory device
JP2001326257A (ja) Icウエハの検査装置
JPH11344521A (ja) 積層型コネクター装置および回路基板の検査装置
JPS612338A (ja) 検査装置
JP2001110858A (ja) 半導体装置およびその製造方法、ならびにバーンイン装置
JPH10260222A (ja) 電極接触部材
KR102259225B1 (ko) 프로브 카드
JP2570033B2 (ja) プリント配線板用導通検査機
KR200372268Y1 (ko) 매개판을 포함하는 집적화 실리콘 콘택터
JP2900572B2 (ja) フィルムキャリア型半導体装置及びその選別法
KR101650134B1 (ko) 컨택부재 및 이를 포함하는 반도체 패키지 테스트용 소켓
JP2001052824A (ja) インターコネクタ
JP2000156253A (ja) 積層型コネクター装置および回路基板の検査装置
JPH08316274A (ja) 異方導電フィルム及び異方導電フィルムを用いた半導体ウェハ測定治具
JPH0618559A (ja) プローブカード