JP2505822Y2 - 回路検査装置 - Google Patents
回路検査装置Info
- Publication number
- JP2505822Y2 JP2505822Y2 JP8693790U JP8693790U JP2505822Y2 JP 2505822 Y2 JP2505822 Y2 JP 2505822Y2 JP 8693790 U JP8693790 U JP 8693790U JP 8693790 U JP8693790 U JP 8693790U JP 2505822 Y2 JP2505822 Y2 JP 2505822Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- probe
- chip
- circuit inspection
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Combinations Of Printed Boards (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8693790U JP2505822Y2 (ja) | 1990-08-20 | 1990-08-20 | 回路検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8693790U JP2505822Y2 (ja) | 1990-08-20 | 1990-08-20 | 回路検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0444200U JPH0444200U (nl) | 1992-04-15 |
JP2505822Y2 true JP2505822Y2 (ja) | 1996-08-07 |
Family
ID=31818882
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8693790U Expired - Lifetime JP2505822Y2 (ja) | 1990-08-20 | 1990-08-20 | 回路検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2505822Y2 (nl) |
-
1990
- 1990-08-20 JP JP8693790U patent/JP2505822Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0444200U (nl) | 1992-04-15 |
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