JP2504522Y2 - アドレスパタ―ン発生器 - Google Patents
アドレスパタ―ン発生器Info
- Publication number
- JP2504522Y2 JP2504522Y2 JP1987192279U JP19227987U JP2504522Y2 JP 2504522 Y2 JP2504522 Y2 JP 2504522Y2 JP 1987192279 U JP1987192279 U JP 1987192279U JP 19227987 U JP19227987 U JP 19227987U JP 2504522 Y2 JP2504522 Y2 JP 2504522Y2
- Authority
- JP
- Japan
- Prior art keywords
- address
- data
- memory
- serial
- address data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000015654 memory Effects 0.000 claims description 23
- 238000010586 diagram Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Dram (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987192279U JP2504522Y2 (ja) | 1987-12-17 | 1987-12-17 | アドレスパタ―ン発生器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987192279U JP2504522Y2 (ja) | 1987-12-17 | 1987-12-17 | アドレスパタ―ン発生器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0197500U JPH0197500U (enrdf_load_stackoverflow) | 1989-06-28 |
| JP2504522Y2 true JP2504522Y2 (ja) | 1996-07-10 |
Family
ID=31483146
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987192279U Expired - Lifetime JP2504522Y2 (ja) | 1987-12-17 | 1987-12-17 | アドレスパタ―ン発生器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2504522Y2 (enrdf_load_stackoverflow) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6164000A (ja) * | 1985-08-23 | 1986-04-02 | Nec Corp | 半導体メモリの試験装置 |
-
1987
- 1987-12-17 JP JP1987192279U patent/JP2504522Y2/ja not_active Expired - Lifetime
Non-Patent Citations (1)
| Title |
|---|
| インターフェース、9[12](昭58−12)CQ出版P.330−332 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0197500U (enrdf_load_stackoverflow) | 1989-06-28 |
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