JPH0197500U - - Google Patents

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Publication number
JPH0197500U
JPH0197500U JP19227987U JP19227987U JPH0197500U JP H0197500 U JPH0197500 U JP H0197500U JP 19227987 U JP19227987 U JP 19227987U JP 19227987 U JP19227987 U JP 19227987U JP H0197500 U JPH0197500 U JP H0197500U
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JP
Japan
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generator
address data
converts
serial
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
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JP19227987U
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English (en)
Japanese (ja)
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JP2504522Y2 (ja
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Priority to JP1987192279U priority Critical patent/JP2504522Y2/ja
Publication of JPH0197500U publication Critical patent/JPH0197500U/ja
Application granted granted Critical
Publication of JP2504522Y2 publication Critical patent/JP2504522Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Dram (AREA)
JP1987192279U 1987-12-17 1987-12-17 アドレスパタ―ン発生器 Expired - Lifetime JP2504522Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987192279U JP2504522Y2 (ja) 1987-12-17 1987-12-17 アドレスパタ―ン発生器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987192279U JP2504522Y2 (ja) 1987-12-17 1987-12-17 アドレスパタ―ン発生器

Publications (2)

Publication Number Publication Date
JPH0197500U true JPH0197500U (enrdf_load_stackoverflow) 1989-06-28
JP2504522Y2 JP2504522Y2 (ja) 1996-07-10

Family

ID=31483146

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987192279U Expired - Lifetime JP2504522Y2 (ja) 1987-12-17 1987-12-17 アドレスパタ―ン発生器

Country Status (1)

Country Link
JP (1) JP2504522Y2 (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6164000A (ja) * 1985-08-23 1986-04-02 Nec Corp 半導体メモリの試験装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6164000A (ja) * 1985-08-23 1986-04-02 Nec Corp 半導体メモリの試験装置

Also Published As

Publication number Publication date
JP2504522Y2 (ja) 1996-07-10

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