JP2024108233A - 温度センサ装置 - Google Patents

温度センサ装置 Download PDF

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Publication number
JP2024108233A
JP2024108233A JP2023012491A JP2023012491A JP2024108233A JP 2024108233 A JP2024108233 A JP 2024108233A JP 2023012491 A JP2023012491 A JP 2023012491A JP 2023012491 A JP2023012491 A JP 2023012491A JP 2024108233 A JP2024108233 A JP 2024108233A
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JP
Japan
Prior art keywords
temperature sensor
temperature
voltage
inspection
constant voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023012491A
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English (en)
Japanese (ja)
Other versions
JP2024108233A5 (enExample
Inventor
勉 冨岡
Tsutomu Tomioka
忠克 黒田
Tadakatsu Kuroda
真 見谷
Makoto Mitani
直洋 平岡
Naohiro Hiraoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ablic Inc
Original Assignee
Ablic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ablic Inc filed Critical Ablic Inc
Priority to JP2023012491A priority Critical patent/JP2024108233A/ja
Priority to CN202311392113.6A priority patent/CN118424483A/zh
Priority to US18/497,996 priority patent/US12625012B2/en
Priority to KR1020230147975A priority patent/KR20240120628A/ko
Priority to TW112141892A priority patent/TW202433025A/zh
Publication of JP2024108233A publication Critical patent/JP2024108233A/ja
Publication of JP2024108233A5 publication Critical patent/JP2024108233A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/007—Testing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00—Diodes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
JP2023012491A 2023-01-31 2023-01-31 温度センサ装置 Pending JP2024108233A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2023012491A JP2024108233A (ja) 2023-01-31 2023-01-31 温度センサ装置
CN202311392113.6A CN118424483A (zh) 2023-01-31 2023-10-25 温度传感器装置
US18/497,996 US12625012B2 (en) 2023-01-31 2023-10-30 Temperature sensor device
KR1020230147975A KR20240120628A (ko) 2023-01-31 2023-10-31 온도 센서 장치
TW112141892A TW202433025A (zh) 2023-01-31 2023-11-01 溫度感測器裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023012491A JP2024108233A (ja) 2023-01-31 2023-01-31 温度センサ装置

Publications (2)

Publication Number Publication Date
JP2024108233A true JP2024108233A (ja) 2024-08-13
JP2024108233A5 JP2024108233A5 (enExample) 2025-11-06

Family

ID=91964299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023012491A Pending JP2024108233A (ja) 2023-01-31 2023-01-31 温度センサ装置

Country Status (5)

Country Link
US (1) US12625012B2 (enExample)
JP (1) JP2024108233A (enExample)
KR (1) KR20240120628A (enExample)
CN (1) CN118424483A (enExample)
TW (1) TW202433025A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12181512B2 (en) * 2022-03-16 2024-12-31 Samsung Electronics Co., Ltd. Semiconductor devices comprising failure detectors for detecting failure of bipolar junction transistors and methods for detecting failure of the bipolar junction transistors
JP2024115235A (ja) * 2023-02-14 2024-08-26 ローム株式会社 温度センサ
KR20260034801A (ko) 2024-09-05 2026-03-12 주식회사 엘지에너지솔루션 검사 장치 및 검사 방법

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3812717A (en) 1972-04-03 1974-05-28 Bell Telephone Labor Inc Semiconductor diode thermometry
DE2933874C2 (de) * 1978-08-24 1986-07-17 Hochiki Corp., Tokio/Tokyo Fühlvorrichtung zur Wahrnehmung von Temperaturunterschieden zwischen zwei Punkten

Also Published As

Publication number Publication date
KR20240120628A (ko) 2024-08-07
TW202433025A (zh) 2024-08-16
US12625012B2 (en) 2026-05-12
CN118424483A (zh) 2024-08-02
US20240255357A1 (en) 2024-08-01

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