TW202433025A - 溫度感測器裝置 - Google Patents
溫度感測器裝置 Download PDFInfo
- Publication number
- TW202433025A TW202433025A TW112141892A TW112141892A TW202433025A TW 202433025 A TW202433025 A TW 202433025A TW 112141892 A TW112141892 A TW 112141892A TW 112141892 A TW112141892 A TW 112141892A TW 202433025 A TW202433025 A TW 202433025A
- Authority
- TW
- Taiwan
- Prior art keywords
- temperature sensor
- temperature
- voltage
- diode
- forward voltage
- Prior art date
Links
- 238000007689 inspection Methods 0.000 claims description 29
- 230000003321 amplification Effects 0.000 claims description 8
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 5
- 101000827703 Homo sapiens Polyphosphoinositide phosphatase Proteins 0.000 description 3
- 102100023591 Polyphosphoinositide phosphatase Human genes 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 2
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 2
- 101100012902 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) FIG2 gene Proteins 0.000 description 2
- 101100233916 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) KAR5 gene Proteins 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000007792 addition Methods 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023012491A JP2024108233A (ja) | 2023-01-31 | 2023-01-31 | 温度センサ装置 |
| JP2023-012491 | 2023-01-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW202433025A true TW202433025A (zh) | 2024-08-16 |
Family
ID=91964299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW112141892A TW202433025A (zh) | 2023-01-31 | 2023-11-01 | 溫度感測器裝置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US12625012B2 (enExample) |
| JP (1) | JP2024108233A (enExample) |
| KR (1) | KR20240120628A (enExample) |
| CN (1) | CN118424483A (enExample) |
| TW (1) | TW202433025A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12181512B2 (en) * | 2022-03-16 | 2024-12-31 | Samsung Electronics Co., Ltd. | Semiconductor devices comprising failure detectors for detecting failure of bipolar junction transistors and methods for detecting failure of the bipolar junction transistors |
| JP2024115235A (ja) * | 2023-02-14 | 2024-08-26 | ローム株式会社 | 温度センサ |
| KR20260034801A (ko) | 2024-09-05 | 2026-03-12 | 주식회사 엘지에너지솔루션 | 검사 장치 및 검사 방법 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3812717A (en) | 1972-04-03 | 1974-05-28 | Bell Telephone Labor Inc | Semiconductor diode thermometry |
| DE2933874C2 (de) * | 1978-08-24 | 1986-07-17 | Hochiki Corp., Tokio/Tokyo | Fühlvorrichtung zur Wahrnehmung von Temperaturunterschieden zwischen zwei Punkten |
-
2023
- 2023-01-31 JP JP2023012491A patent/JP2024108233A/ja active Pending
- 2023-10-25 CN CN202311392113.6A patent/CN118424483A/zh active Pending
- 2023-10-30 US US18/497,996 patent/US12625012B2/en active Active
- 2023-10-31 KR KR1020230147975A patent/KR20240120628A/ko active Pending
- 2023-11-01 TW TW112141892A patent/TW202433025A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| KR20240120628A (ko) | 2024-08-07 |
| JP2024108233A (ja) | 2024-08-13 |
| US12625012B2 (en) | 2026-05-12 |
| CN118424483A (zh) | 2024-08-02 |
| US20240255357A1 (en) | 2024-08-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9804036B2 (en) | Temperature sensor calibration | |
| CN118424483A (zh) | 温度传感器装置 | |
| US7281846B2 (en) | Integrated resistance cancellation in temperature measurement systems | |
| TWI727435B (zh) | 熱感測器與溫度量測方法 | |
| US20060193370A1 (en) | Integrated resistance cancellation in temperature measurement systems | |
| CN107367336A (zh) | 用于温度感测的系统和方法 | |
| CN103560760A (zh) | 放大电路以及测量装置 | |
| US20190113393A1 (en) | Temperature sensor | |
| CN103837253A (zh) | 一种cmos温度传感器 | |
| CN104458034B (zh) | 温度检测方法和温度检测装置 | |
| CN114659676A (zh) | 热传感器和温度测量的方法 | |
| KR20080090005A (ko) | 열전대를 이용하는 온도측정 장치 및 그 방법 | |
| JP6850338B2 (ja) | 温度センサー構成におけるフリッカーノイズ低減 | |
| CN113701911B (zh) | 电能表端子温度检测电路及方法 | |
| JPH09105681A (ja) | 温度測定回路 | |
| CN112461363A (zh) | 光功率计的偏移归零 | |
| TW202426874A (zh) | 溫度感測器 | |
| US11163020B2 (en) | Sensor circuit with offset compensation | |
| CN114019443B (zh) | 一种电能表的温度校准方法、装置及系统 | |
| US20240167891A1 (en) | Sensing chip, measuring chip, measurement system and methods and computer program products thereof | |
| RU2165600C2 (ru) | Измеритель температуры | |
| RU2451913C1 (ru) | Устройство для измерения температуры | |
| US20240272010A1 (en) | Temperature sensor | |
| JPH11304877A (ja) | 電圧印加電流測定回路 | |
| CN110987223B (zh) | 一种改进的高精度铂电阻测温电路 |