KR20240120628A - 온도 센서 장치 - Google Patents

온도 센서 장치 Download PDF

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Publication number
KR20240120628A
KR20240120628A KR1020230147975A KR20230147975A KR20240120628A KR 20240120628 A KR20240120628 A KR 20240120628A KR 1020230147975 A KR1020230147975 A KR 1020230147975A KR 20230147975 A KR20230147975 A KR 20230147975A KR 20240120628 A KR20240120628 A KR 20240120628A
Authority
KR
South Korea
Prior art keywords
temperature sensor
temperature
voltage
diode
constant voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020230147975A
Other languages
English (en)
Korean (ko)
Inventor
츠토무 토미오카
타다카츠 쿠로다
마코토 미타니
나오히로 히라오카
Original Assignee
에이블릭 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에이블릭 가부시키가이샤 filed Critical 에이블릭 가부시키가이샤
Publication of KR20240120628A publication Critical patent/KR20240120628A/ko
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/007—Testing
    • H01L29/861—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00—Diodes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
KR1020230147975A 2023-01-31 2023-10-31 온도 센서 장치 Pending KR20240120628A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023012491A JP2024108233A (ja) 2023-01-31 2023-01-31 温度センサ装置
JPJP-P-2023-012491 2023-01-31

Publications (1)

Publication Number Publication Date
KR20240120628A true KR20240120628A (ko) 2024-08-07

Family

ID=91964299

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020230147975A Pending KR20240120628A (ko) 2023-01-31 2023-10-31 온도 센서 장치

Country Status (5)

Country Link
US (1) US12625012B2 (enExample)
JP (1) JP2024108233A (enExample)
KR (1) KR20240120628A (enExample)
CN (1) CN118424483A (enExample)
TW (1) TW202433025A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026054342A1 (ko) 2024-09-05 2026-03-12 주식회사 엘지에너지솔루션 검사 장치 및 검사 방법

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12181512B2 (en) * 2022-03-16 2024-12-31 Samsung Electronics Co., Ltd. Semiconductor devices comprising failure detectors for detecting failure of bipolar junction transistors and methods for detecting failure of the bipolar junction transistors
JP2024115235A (ja) * 2023-02-14 2024-08-26 ローム株式会社 温度センサ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3812717A (en) 1972-04-03 1974-05-28 Bell Telephone Labor Inc Semiconductor diode thermometry

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2933874C2 (de) * 1978-08-24 1986-07-17 Hochiki Corp., Tokio/Tokyo Fühlvorrichtung zur Wahrnehmung von Temperaturunterschieden zwischen zwei Punkten

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3812717A (en) 1972-04-03 1974-05-28 Bell Telephone Labor Inc Semiconductor diode thermometry

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
[특허문헌]

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026054342A1 (ko) 2024-09-05 2026-03-12 주식회사 엘지에너지솔루션 검사 장치 및 검사 방법

Also Published As

Publication number Publication date
TW202433025A (zh) 2024-08-16
JP2024108233A (ja) 2024-08-13
US12625012B2 (en) 2026-05-12
CN118424483A (zh) 2024-08-02
US20240255357A1 (en) 2024-08-01

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20231031

PG1501 Laying open of application