JP2024108233A5 - - Google Patents
Info
- Publication number
- JP2024108233A5 JP2024108233A5 JP2023012491A JP2023012491A JP2024108233A5 JP 2024108233 A5 JP2024108233 A5 JP 2024108233A5 JP 2023012491 A JP2023012491 A JP 2023012491A JP 2023012491 A JP2023012491 A JP 2023012491A JP 2024108233 A5 JP2024108233 A5 JP 2024108233A5
- Authority
- JP
- Japan
- Prior art keywords
- temperature sensor
- junction element
- constant voltage
- inspection
- outputs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023012491A JP2024108233A (ja) | 2023-01-31 | 2023-01-31 | 温度センサ装置 |
| CN202311392113.6A CN118424483A (zh) | 2023-01-31 | 2023-10-25 | 温度传感器装置 |
| US18/497,996 US12625012B2 (en) | 2023-01-31 | 2023-10-30 | Temperature sensor device |
| KR1020230147975A KR20240120628A (ko) | 2023-01-31 | 2023-10-31 | 온도 센서 장치 |
| TW112141892A TW202433025A (zh) | 2023-01-31 | 2023-11-01 | 溫度感測器裝置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023012491A JP2024108233A (ja) | 2023-01-31 | 2023-01-31 | 温度センサ装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2024108233A JP2024108233A (ja) | 2024-08-13 |
| JP2024108233A5 true JP2024108233A5 (enExample) | 2025-11-06 |
Family
ID=91964299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023012491A Pending JP2024108233A (ja) | 2023-01-31 | 2023-01-31 | 温度センサ装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US12625012B2 (enExample) |
| JP (1) | JP2024108233A (enExample) |
| KR (1) | KR20240120628A (enExample) |
| CN (1) | CN118424483A (enExample) |
| TW (1) | TW202433025A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12181512B2 (en) * | 2022-03-16 | 2024-12-31 | Samsung Electronics Co., Ltd. | Semiconductor devices comprising failure detectors for detecting failure of bipolar junction transistors and methods for detecting failure of the bipolar junction transistors |
| JP2024115235A (ja) * | 2023-02-14 | 2024-08-26 | ローム株式会社 | 温度センサ |
| KR20260034801A (ko) | 2024-09-05 | 2026-03-12 | 주식회사 엘지에너지솔루션 | 검사 장치 및 검사 방법 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3812717A (en) | 1972-04-03 | 1974-05-28 | Bell Telephone Labor Inc | Semiconductor diode thermometry |
| DE2933874C2 (de) * | 1978-08-24 | 1986-07-17 | Hochiki Corp., Tokio/Tokyo | Fühlvorrichtung zur Wahrnehmung von Temperaturunterschieden zwischen zwei Punkten |
-
2023
- 2023-01-31 JP JP2023012491A patent/JP2024108233A/ja active Pending
- 2023-10-25 CN CN202311392113.6A patent/CN118424483A/zh active Pending
- 2023-10-30 US US18/497,996 patent/US12625012B2/en active Active
- 2023-10-31 KR KR1020230147975A patent/KR20240120628A/ko active Pending
- 2023-11-01 TW TW112141892A patent/TW202433025A/zh unknown
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