JP2023541692A5 - - Google Patents

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Publication number
JP2023541692A5
JP2023541692A5 JP2023518122A JP2023518122A JP2023541692A5 JP 2023541692 A5 JP2023541692 A5 JP 2023541692A5 JP 2023518122 A JP2023518122 A JP 2023518122A JP 2023518122 A JP2023518122 A JP 2023518122A JP 2023541692 A5 JP2023541692 A5 JP 2023541692A5
Authority
JP
Japan
Prior art keywords
range
gas mixture
plasma
etching gas
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023518122A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023541692A (ja
Filing date
Publication date
Priority claimed from GBGB2014733.6A external-priority patent/GB202014733D0/en
Application filed filed Critical
Publication of JP2023541692A publication Critical patent/JP2023541692A/ja
Publication of JP2023541692A5 publication Critical patent/JP2023541692A5/ja
Pending legal-status Critical Current

Links

JP2023518122A 2020-09-18 2021-09-17 炭化ケイ素ウェーハの作製方法 Pending JP2023541692A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB2014733.6 2020-09-18
GBGB2014733.6A GB202014733D0 (en) 2020-09-18 2020-09-18 Method of preparing a silicon carbide wafer
PCT/GB2021/052423 WO2022058743A2 (en) 2020-09-18 2021-09-17 Method of preparing a silicon carbide wafer

Publications (2)

Publication Number Publication Date
JP2023541692A JP2023541692A (ja) 2023-10-03
JP2023541692A5 true JP2023541692A5 (https=) 2024-09-24

Family

ID=73196851

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023518122A Pending JP2023541692A (ja) 2020-09-18 2021-09-17 炭化ケイ素ウェーハの作製方法

Country Status (7)

Country Link
US (1) US20230326735A1 (https=)
EP (1) EP4214741A2 (https=)
JP (1) JP2023541692A (https=)
KR (1) KR20230066639A (https=)
CN (1) CN116547783A (https=)
GB (3) GB202014733D0 (https=)
WO (1) WO2022058743A2 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114318551B (zh) * 2022-03-14 2022-06-17 浙江大学杭州国际科创中心 一种碳化硅晶片位错腐蚀方法及装置
EP4553888A1 (en) 2023-11-07 2025-05-14 AlixLabs AB Surface preparation method for epitaxial material growth

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100373460B1 (ko) * 2001-02-08 2003-02-25 신무환 고효율 SiC 소자제작을 위한 건식식각 공정
JP5522907B2 (ja) * 2008-06-23 2014-06-18 ローム株式会社 SiC膜の加工方法、半導体装置およびその製造方法
JP2010111540A (ja) * 2008-11-06 2010-05-20 Showa Denko Kk 炭化珪素単結晶の結晶成長方法、種結晶及び炭化珪素単結晶
GB0823565D0 (en) 2008-12-24 2009-01-28 Oxford Instr Plasma Technology Signal generating system
GB0903836D0 (en) 2009-03-05 2009-04-22 Oxford Instr Plasma Technology Interface module and controller network
TWI570838B (zh) * 2015-11-12 2017-02-11 財團法人工業技術研究院 碳化矽基板上的溝槽結構以及其製作方法
CN106816372A (zh) * 2015-11-30 2017-06-09 北京北方微电子基地设备工艺研究中心有限责任公司 一种碳化硅衬底的刻蚀方法
CN107644812B (zh) * 2016-07-21 2020-08-21 北京北方华创微电子装备有限公司 基片刻蚀方法
CN110957214A (zh) * 2018-09-26 2020-04-03 株洲中车时代电气股份有限公司 一种沟槽及其蚀刻方法

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