JP2023530346A5 - - Google Patents

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Publication number
JP2023530346A5
JP2023530346A5 JP2022577452A JP2022577452A JP2023530346A5 JP 2023530346 A5 JP2023530346 A5 JP 2023530346A5 JP 2022577452 A JP2022577452 A JP 2022577452A JP 2022577452 A JP2022577452 A JP 2022577452A JP 2023530346 A5 JP2023530346 A5 JP 2023530346A5
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Japan
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pupil
image
subject
depth map
center
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JP2022577452A
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English (en)
Japanese (ja)
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JP7664953B2 (ja
JP2023530346A (ja
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Priority claimed from PCT/US2021/037075 external-priority patent/WO2021257406A1/en
Publication of JP2023530346A publication Critical patent/JP2023530346A/ja
Publication of JP2023530346A5 publication Critical patent/JP2023530346A5/ja
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JP2022577452A 2020-06-17 2021-06-11 瞳孔間距離を測定するためのシステムおよび方法ならびにそれらの使用 Active JP7664953B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202063040184P 2020-06-17 2020-06-17
US63/040,184 2020-06-17
PCT/US2021/037075 WO2021257406A1 (en) 2020-06-17 2021-06-11 System and method for measuring pupillary distance and uses thereof

Publications (3)

Publication Number Publication Date
JP2023530346A JP2023530346A (ja) 2023-07-14
JP2023530346A5 true JP2023530346A5 (enExample) 2024-06-11
JP7664953B2 JP7664953B2 (ja) 2025-04-18

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JP2022577452A Active JP7664953B2 (ja) 2020-06-17 2021-06-11 瞳孔間距離を測定するためのシステムおよび方法ならびにそれらの使用

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Country Link
US (1) US12108988B2 (enExample)
EP (1) EP4167828A4 (enExample)
JP (1) JP7664953B2 (enExample)
KR (1) KR20230026421A (enExample)
CN (1) CN115697183B (enExample)
CA (1) CA3185605A1 (enExample)
IL (1) IL299030B1 (enExample)
WO (1) WO2021257406A1 (enExample)

Families Citing this family (3)

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EP4455771A1 (en) 2023-04-24 2024-10-30 Carl Zeiss Vision International GmbH Method and device for face pose estimation and determination of centration parameters

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