JP2022553761A5 - - Google Patents

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Publication number
JP2022553761A5
JP2022553761A5 JP2022524594A JP2022524594A JP2022553761A5 JP 2022553761 A5 JP2022553761 A5 JP 2022553761A5 JP 2022524594 A JP2022524594 A JP 2022524594A JP 2022524594 A JP2022524594 A JP 2022524594A JP 2022553761 A5 JP2022553761 A5 JP 2022553761A5
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Japan
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marker substance
marker
nanoparticles
figures
show
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JP2022524594A
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English (en)
Japanese (ja)
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JP2022553761A (ja
JP7635224B2 (ja
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Priority claimed from DE102019128842.8A external-priority patent/DE102019128842A1/de
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JP2022524594A 2019-10-25 2020-10-23 マルチパラメトリックx線蛍光イメージングのための方法および装置 Active JP7635224B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102019128842.8A DE102019128842A1 (de) 2019-10-25 2019-10-25 Verfahren, Vorrichtung und Markersubstanz-Kit zur multiparametrischen Röntgenfluoreszenz-Bildgebung
DE102019128842.8 2019-10-25
PCT/EP2020/079909 WO2021078950A1 (de) 2019-10-25 2020-10-23 Verfahren, vorrichtung und markersubstanz-kit zur multiparametrischen röntgenfluoreszenz-bildgebung

Publications (3)

Publication Number Publication Date
JP2022553761A JP2022553761A (ja) 2022-12-26
JP2022553761A5 true JP2022553761A5 (https=) 2023-10-18
JP7635224B2 JP7635224B2 (ja) 2025-02-25

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ID=73020205

Family Applications (1)

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JP2022524594A Active JP7635224B2 (ja) 2019-10-25 2020-10-23 マルチパラメトリックx線蛍光イメージングのための方法および装置

Country Status (7)

Country Link
US (1) US20220370645A1 (https=)
EP (1) EP4049011A1 (https=)
JP (1) JP7635224B2 (https=)
KR (1) KR20220091515A (https=)
CN (1) CN114667447B (https=)
DE (1) DE102019128842A1 (https=)
WO (1) WO2021078950A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116577358B (zh) * 2023-05-18 2024-01-23 杭州宇称电子技术有限公司 基于x射线k-吸收边的书画文物颜料成像方法及其应用
CN118961777B (zh) * 2024-07-19 2025-11-28 中国科学院金属研究所 一种准原位追踪高温合金微量元素分布的方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1603459A1 (en) 2003-03-07 2005-12-14 Philips Intellectual Property & Standards GmbH Method and imaging system for imaging the spatial distribution of an x-ray fluorescence marker
JP5557266B2 (ja) 2008-07-17 2014-07-23 国立大学法人 筑波大学 蛍光エックス線検出装置
WO2011084625A1 (en) * 2009-12-16 2011-07-14 Georgia Tech Research Corporation Systems and methods for x-ray flourescence computed tomography imaging with nanoparticles
JP5761102B2 (ja) 2012-03-29 2015-08-12 コニカミノルタ株式会社 高輝度半導体ナノ粒子集積体
FR2989280B1 (fr) 2012-04-13 2017-02-24 Univ Claude Bernard Lyon Nanoparticules ultrafines comme agent de contraste multimodal
WO2015031675A1 (en) * 2013-08-28 2015-03-05 The Regents Of The University Of California Nanoparticle assisted scanning focusing x-ray fluorescence imaging and enhanced treatment
EP3091903B1 (en) * 2014-01-07 2018-10-03 Jettec AB X-ray micro imaging
DE102017003517A1 (de) 2017-04-11 2018-10-11 Universität Hamburg Verfahren und Messvorrichtung zur Röntgenfluoreszenz-Messung
CN108469445B (zh) * 2018-03-29 2020-09-01 福州大学 用于无背景检测血液中癌症抗原含量的基于x射线激发的镧系荧光纳米粒子的试剂盒及制备
JP2019183047A (ja) 2018-04-13 2019-10-24 Agc株式会社 蛍光ナノ粒子およびその製造方法

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