JP2022530807A - 1つ以上の電気的に制御可能なプライバシーガラス構造の漏れ電流の検出および制御 - Google Patents
1つ以上の電気的に制御可能なプライバシーガラス構造の漏れ電流の検出および制御 Download PDFInfo
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- JP2022530807A JP2022530807A JP2021564483A JP2021564483A JP2022530807A JP 2022530807 A JP2022530807 A JP 2022530807A JP 2021564483 A JP2021564483 A JP 2021564483A JP 2021564483 A JP2021564483 A JP 2021564483A JP 2022530807 A JP2022530807 A JP 2022530807A
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- privacy glass
- glass structure
- time
- drive signal
- electrically driven
- Prior art date
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Images
Classifications
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- B32B17/06—Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
- B32B17/10—Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
- B32B17/10005—Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing
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- G—PHYSICS
- G02—OPTICS
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Abstract
Description
本出願は、2019年4月29日に出願された米国仮特許出願第62/840,038号の利益を主張し、その全容が参照により本明細書に組み込まれる。
Claims (61)
- 電気的に制御可能な光学プライバシーガラス構造の変化する特性を評価し、それに適応するための方法であって、
電気駆動信号を、電気的に制御可能な光学活性材料を含むプライバシーガラス構造に印加して、前記電気的に制御可能な光学活性材料の光学状態を制御することと、
第1の時間において、前記プライバシーガラス構造の健全性を示す前記プライバシーガラス構造の電気的特性を測定することと、
前記第1の時間よりも後の第2の時間において、前記プライバシーガラス構造の前記健全性を示す前記プライバシーガラス構造の前記電気的特性を測定することと、
前記第2の時間に測定された前記電気的特性および前記第1の時間に測定された前記電気的特性に基づいて前記電気的特性の変化を検出することであって、前記電気的特性の前記変化が、前記プライバシーガラス構造の前記健全性の変化を示す、検出することと、
前記変化を検出することに応答して、前記プライバシーガラス構造に提供される前記電気駆動信号の少なくとも1つのパラメータを調整して、前記プライバシーガラス構造の前記健全性の前記変化を補償することと、を含む、方法。 - 前記プライバシーガラス構造の前記電気的特性の前記検出された変化に基づいて、前記第2の時間において、前記プライバシーガラス構造と関連する漏れ電流値を決定することをさらに含み、
前記電気駆動信号の前記少なくとも1つのパラメータを調整することは、前記決定された漏れ電流が所定の条件を満たす場合に実行される、請求項1に記載の方法。 - 前記第1の時間および前記第2の時間よりも後の複数の追加の時間において、前記プライバシーガラス構造の前記健全性を示す前記プライバシーガラス構造の前記電気的特性を測定することと、
前記複数の追加の時間の各々において、前記プライバシーガラス構造と関連する前記漏れ電流値を決定することと、
前記経時的な漏れ電流の傾向を決定することと、をさらに含む、請求項2に記載の方法。 - 前記経時的な漏れ電流の傾向を決定することが、前記漏れ電流の時間微分を決定することを含む、請求項3に記載の方法。
- 所定の閾値条件を満たす前記漏れ電流の前記時間微分に応答して、前記電気駆動信号の少なくとも1つのパラメータを調整することをさらに含む、請求項4に記載の方法。
- 前記複数の時間のうちの1つ以上における前記漏れ電流、または前記漏れ電流の前記確定された傾向のうちの少なくとも1つをクラウドコンピューティングネットワークに記憶することをさらに含む、請求項3~5のいずれか一項に記載の方法。
- 前記複数の時間のうちの1つ以上における前記漏れ電流、または前記漏れ電流の前記確定された傾向のうちの少なくとも1つをローカルメモリに記憶することをさらに含む、請求項3~6のいずれか一項に記載の方法。
- 前記第1の時間および前記第2の時間よりも後の複数の追加の時間において、前記プライバシーガラス構造の前記健全性を示す前記プライバシーガラス構造の前記電気的特性を測定することと、
前記複数の時間の各々における前記電気的特性を前記第1の時間における前記電気的特性と比較することと、
前記複数の時間のいずれかにおいて、前記電気的特性が、前記第1の時間における前記電気的特性と、閾値量を超えて異なる場合、前記電気駆動信号の少なくとも1つのパラメータを調整することと、をさらに含む、先行請求項のいずれか一項に記載の方法。 - 前記電気的特性を測定することが、印加された電気駆動信号に対する電流応答を測定することを含む、先行請求項のいずれか一項に記載の方法。
- 前記印加された電気駆動信号に対する前記電流応答を測定することが、前記印加された電気駆動信号の所定の部分に対する前記電流応答を測定することを含む、請求項9に記載の方法。
- 前記印加された電気駆動信号の所定の部分に対する前記電流応答を測定することが、平衡電流応答を測定することを含む、請求項10に記載の方法。
- 前記印加された電気駆動信号が、方形波電気駆動信号を含み、前記印加された駆動信号の前記所定の部分が、前記方形波駆動信号の遷移間の期間を含む、請求項10または11に記載の方法。
- 前記印加された電気駆動信号に対する前記電流応答を測定することが、前記経時的な電流の積分および微分のうちの少なくとも1つを計算することを含む、請求項9~12のいずれか一項に記載の方法。
- 前記経時的な電流の積分および微分のうちの少なくとも1つを計算することが、前記印加された電気駆動信号に対する前記電流応答の前記積分および前記微分のうちの前記少なくとも1つを、前記印加された電気駆動信号の1周期以下にわたって計算することを含む、請求項13に記載の方法。
- 前記経時的な電流の積分および微分のうちの少なくとも1つを計算することが、前記印加された電気駆動信号に対する前記電流応答の前記積分および前記微分のうちの前記少なくとも1つを、前記印加された電気駆動信号の1周期の半分以下にわたって計算することを含む、請求項14に記載の方法。
- 前記印加された電気駆動信号に対する前記電流応答を測定することが、前記印加された電気駆動信号の異なる部分中の平衡電流値の差を測定することを含む、請求項9~12のいずれか一項に記載の方法。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、電圧を増加させることを含む、先行請求項のいずれか一項に記載の方法。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、周波数を減少させることを含む、先行請求項のいずれか一項に記載の方法。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、前記電気駆動信号に1つ以上の電圧パルス化ステップを追加することを含む、先行請求項のいずれか一項に記載の方法。
- 前記印加される電気駆動信号が、方形波電気駆動信号を含み、前記電気駆動信号の前記1つ以上のパラメータを調整することが、前記方形波電気駆動信号の周期を増加させることを含む、先行請求項のいずれか一項に記載の方法。
- 前記プライバシーガラス構造の前記健全性を示す前記プライバシーガラス構造の電気的特性を測定することは、前記プライバシーガラス構造に印加された電圧が一定に保持されている間に前記プライバシーガラス構造を流れる前記電流を監視することを含む、先行請求項のいずれか一項に記載の方法。
- イオン密度測定を実行することを含む、先行請求項のいずれか一項に記載の方法。
- 前記イオン密度測定が、1つ以上のイオンのサイズを測定することを含む、請求項22に記載の方法。
- 前記イオン密度測定に基づいて故障の原因を予測することおよび決定することの少なくとも1つをさらに含む、請求項23に記載の方法。
- 前記プライバシーガラス構造が、液晶材料を含み、前記電気的特性の前記検出された変化が、前記液晶材料の化学変化によるものである、請求項22~24のいずれか一項に記載の方法。
- 前記化学変化が、イオン生成を含む、請求項25に記載の方法。
- 前記電気的に制御可能な光学活性材料が、液晶材料を含む、先行請求項のいずれか一項に記載の方法。
- 前記第1の時間において、前記プライバシーガラス構造の健全性を示す前記プライバシーガラス構造の前記電気的特性を前記測定することが、製造業者の施設においてまたは前記プライバシーガラス構造の設置時に前記電気的特性を測定することを含む、先行請求項のいずれか一項に記載の方法。
- 前記プライバシーガラス構造に提供される前記電気駆動信号の少なくとも1つのパラメータを前記調整して、前記プライバシーガラス構造の前記健全性の前記変化を補償することが、前記電気的特性の前記変化が閾値量を満たすときに実行される、先行請求項のいずれか一項に記載の方法。
- 前記プライバシーガラス構造の前記健全性が、前記プライバシーガラス構造の前記電気的に制御可能な光学活性材料の劣化状態を示す、先行請求項のいずれか一項に記載の方法。
- 電気的に動的な窓システムであって、
透明材料の第1の窓ガラスと、
透明材料の第2の窓ガラスと、
前記透明材料の第1の窓ガラスと前記透明材料の第2の窓ガラスとの間に配置された電気的に制御可能な光学活性材料であって、第1の電極層と第2の電極層との間に配置された、電気的に制御可能な光学活性材料と、
前記第1の電極層および前記第2の電極層に電気的に接続されたドライバであって、前記ドライバが、電源に電気的に接続され、前記電気的に制御可能な光学活性材料を制御するために前記第1の電極層および前記第2の電極層に電気駆動信号を提供するように構成されている、ドライバと、を備え、前記ドライバが、
前記電気的に制御可能な光学活性材料に電気駆動信号を印加することと、
第1の時間において、前記電気的に制御可能な光学活性材料の電気的特性を測定することと、
前記第1の時間よりも後の複数の時間において、前記電気的に制御可能な光学活性材料の前記電気的特性を測定することと、
前記第1の時間よりも後の前記複数の時間の各々について、
前記測定された電気的特性を、前記第1の時間において決定された前記電気的特性と比較することと、
前記比較に基づいて、前記電気的に制御可能な光学活性材料と関連する漏れ電流値を決定することと、
前記漏れ電流が所定の条件を満たす場合、前記電気駆動信号の1つ以上のパラメータを調整することと、を行うように構成されている、システム。 - 前記ドライバが、前記漏れ電流の傾向を経時的に確定するように構成されている、請求項31に記載のシステム。
- メモリをさらに備え、前記複数の時間における前記決定された漏れ電流、前記経時的な漏れ電流の前記傾向、またはそれらの両方が、前記メモリに記憶される、請求項32に記載のシステム。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、電圧を増加させることを含む、請求項31~33のいずれか一項に記載のシステム。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、周波数を減少させることを含む、請求項31~34に記載のいずれか一項に記載のシステム。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、前記電気的に制御可能な光学活性材料に1つ以上の電圧パルスを印加することを含む、請求項31~35のいずれか一項に記載のシステム。
- 前記電気的に制御可能な光学活性材料に1つ以上の電圧パルスを印加することが、前記第1の電極層にレール電圧を一時的に印加することを含む、請求項36に記載のシステム。
- 前記漏れ電流値を決定することが、期待値からの電圧測定値の低下を決定することを含む、請求項31~37のいずれか一項に記載のシステム。
- 前記1つ以上の所定の条件が、閾値を超える漏れ電流を含む、請求項31~38のいずれか一項に記載のシステム。
- 前記ドライバが、前記プライバシーガラス構造のイオン密度に関する情報を決定するように構成されている、請求項31~39のいずれか一項に記載のシステム。
- 電気的に制御可能な光学プライバシーガラス構造を備える電気的に動的な窓システムの動作を調整するための方法であって、
前記プライバシーガラス構造に電気駆動信号を印加して、その光学状態を制御することと、
前記プライバシーガラス構造に前記電気駆動信号を印加しながら、複数の時間において、前記電気的に制御可能な光学プライバシーガラス構造と関連する漏れ電流値を決定することと、
前記漏れ電流が所定の条件を満たす場合、前記電気駆動信号の1つ以上のパラメータを調整することと、を含む、方法。 - 前記1つ以上の所定の条件が、閾値電流値を超える前記漏れ電流を含む、請求項41に記載の方法。
- 前記複数の時間における前記決定された漏れ電流に基づいて、前記経時的な漏れ電流の積分または微分を決定することをさらに含み、前記1つ以上の所定の条件が、閾値を超える前記経時的な漏れ電流の前記積分または前記微分を含む、請求項41または42に記載の方法。
- 前記電気駆動信号の1つ以上のパラメータを調整することが、前記電気的に制御可能な光学活性材料に対して電圧を増加させること、周波数を減少させること、および電圧をパルス化することからなる群からの1つ以上を含む、請求項41~43のいずれか一項に記載の方法。
- 漏れ電流値を経時的にメモリに記憶することをさらに含む、請求項41~43のいずれか一項に記載の方法。
- 電気的に制御可能な光学プライバシーガラス構造の変化する特性を評価し、それに適応するための方法であって、
電気駆動信号を、電気的に制御可能な光学活性材料を含むプライバシーガラス構造に印加して、前記電気的に制御可能な光学活性材料の光学状態を制御することと、
第1の時間において、前記プライバシーガラス構造の健全性を示す前記プライバシーガラス構造の電気的特性を測定することと、
前記第1の時間よりも後の第2の時間において、前記プライバシーガラス構造の前記健全性を示す前記プライバシーガラス構造の前記電気的特性を測定することと、
前記第2の時間に測定された前記電気的特性および前記第1の時間に測定された前記電気的特性に基づいて前記電気的特性の変化を検出することであって、前記電気的特性の前記変化が、前記プライバシーガラス構造の前記健全性の変化を示す、検出することと、
前記プライバシーガラス構造の前記電気的特性の前記検出された変化に基づいて、前記第2の時間において、前記プライバシーガラス構造と関連する漏れ電流値を決定することと、
前記決定された漏れ電流が所定の条件を満たす場合、前記プライバシーガラス構造に提供される前記電気駆動信号の少なくとも1つのパラメータを調整して、前記プライバシーガラス構造の前記健全性の前記変化を補償することと、を含む、方法。 - 前記電気的特性を測定することが、印加された電気駆動信号に対する電流応答を測定することを含む、請求項46に記載の方法。
- 前記印加された電気駆動信号に対する前記電流応答を測定することが、前記経時的な電流の積分および微分のうちの少なくとも1つを計算することを含む、請求項47に記載の方法。
- 前記経時的な電流の積分および微分のうちの少なくとも1つを計算することが、前記印加された電気駆動信号に対する前記電流応答の前記積分および前記微分のうちの前記少なくとも1つを、前記印加された電気駆動信号の1周期以下にわたって計算することを含む、請求項48に記載の方法。
- 前記経時的な電流の積分および微分のうちの少なくとも1つを計算することが、前記印加された電気駆動信号に対する前記電流応答の前記積分および前記微分のうちの前記少なくとも1つを、前記印加された電気駆動信号の1周期の半分以下にわたって計算することを含む、請求項49に記載の方法。
- 前記印加された電気駆動信号に対する前記電流応答を測定することが、前記印加された電気駆動信号の異なる部分中の平衡電流値の差を測定することを含む、請求項46~50のいずれか一項に記載の方法。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、電圧を増加させることを含む、請求項46~51のいずれか一項に記載の方法。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、周波数を低下させることを含む、請求項46~52のいずれか一項に記載の方法。
- 前記電気駆動信号の前記1つ以上のパラメータを前記調整することが、前記電気駆動信号に1つ以上の電圧パルス化ステップを追加することを含む、請求項46~53のいずれか一項に記載の方法。
- 前記プライバシーガラス構造の前記健全性を示す前記プライバシーガラス構造の電気的特性を測定することは、前記プライバシーガラス構造に印加された電圧が一定に保持されている間に前記プライバシーガラス構造を流れる前記電流を監視することを含む、請求項46~54のいずれか一項に記載の方法。
- イオン密度測定を実施することを含む、請求項46~55のいずれか一項に記載の方法。
- 前記イオン密度測定が、1つ以上のイオンのサイズを測定することを含む、請求項56に記載の方法。
- 前記イオン密度測定に基づいて故障の原因を予測することおよび決定することの少なくとも1つをさらに含む、請求項56または57に記載の方法。
- 前記プライバシーガラス構造が、液晶材料を含み、前記電気的特性の前記検出された変化が、前記液晶材料の化学変化によるものである、請求項56~58のいずれか一項に記載の方法。
- 前記化学変化が、イオン生成を含む、請求項59に記載の方法。
- 前記プライバシーガラス構造の前記健全性が、前記プライバシーガラス構造の前記電気的に制御可能な光学活性材料の劣化状態を示す、請求項46~60のいずれか一項に記載の方法。
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JP7530386B2 (ja) | 2024-08-07 |
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